Measurement of the Refraction Correction for Asymmetric Grazing Incidence Xrd From Rough Surfaces and Powders

1995 ◽  
Vol 39 ◽  
pp. 381-389
Author(s):  
T. Ely ◽  
P. K. Predecki ◽  
X. Zhu ◽  
M. Eatough ◽  
R. Goehner ◽  
...  

The refraction effect at small incidence angles was investigated for solid Al2O3 disks of varying surface roughness, and Al2O3 and LaB6 powder layers of varying thickness and roughness using pseudo parallel beam optics. For the disks the peak shift Δ2θ correlated approximately inversely with ζmax, the maximum slope of a sinusoidal model of the surface roughness. For a disk polished with 3θm diamond, Δ2θ exceeded that predicted by the James equation. For the powder layers Δ2θ was very small for the thinnest layers. For thicker, rougher layers Δ2θ was larger and was probably due to displacement error from the 0.4° divergence of the Soller slit used and specular reflection of the diffracted beam from the Soller slit leaves.

1987 ◽  
Vol 2 (4) ◽  
pp. 471-477 ◽  
Author(s):  
G. Lim ◽  
W. Parrish ◽  
C. Ortiz ◽  
M. Bellotto ◽  
M. Hart

A method using synchrotron radiation parallel beam x-ray optics with a small incidence angle α on the specimen and 2Θ-detector scanning is described for depth profiling analysis of thin films. The instrumentation is the same as used for Θ:2Θ synchrotron parallel beam powder diffractometry, except that the specimen is uncoupled from the detector. There is no profile distortion. Below the critical angle for total reflection αc, the top tens of Angstroms are sampled. Depth profiling is controlled to a few Angstroms using a small α and 0.005° steps. The penetration depth increases to several hundred Angstroms as α approaches αc. Above αc there is a rapid increase in penetration depth to a thousand Angstroms or more and the profiling cannot be sensitively controlled. At grazing incidence the peaks are shifted several tenths of a degree by the x-ray refraction and an experimental procedure for calculating the shifts is described. The method is illustrated with an analysis of iron oxide films.


1992 ◽  
Vol 36 ◽  
pp. 373-377
Author(s):  
Mary F. Garbauskas ◽  
Donald G. LeGrand ◽  
Raymond P. Goehner

AbstractThe physical properties of polymer blends consisting of one or more crystallizable components are affected by the microstructure of these materials. In particular, the degree of crystallinity can be influenced by processing parameters, and the crystallinity, as well as the phase distribution, may vary as a function of depth through an injection molded part. Conventional x-ray diffraction techniques can provide information regarding both phase composition and degree of crystallinity, but, because of the relative transparency of these materials to wavelengths generally available in the laboratory, these techniques provide information representative of only the bulk. By employing parallel beam optics at varying grazing incidence angles, the x-ray sampling depth can be varied without loss of resolution, This technique can be used to vary the effective analysis depth from the top several hundred angstroms for low grazing incidence to centimeters for transmission diffraction patterns, Grazing incidence techniques have found initial application in the characterization of thin metallic and ceramic films. This paper demonstrates the feasibility of using parallel beam optics to depth profile low atomic number materials. The specific application of this technique to the characterization of injection molded polymers, including a blend of bisphenol-A polycarbonate (PC) and polybutylene terephthalate (PBT), will be presented.


1993 ◽  
Vol 37 ◽  
pp. 167-173
Author(s):  
Michael O. Eatough ◽  
Raymond P. Gochner

AbstractGrazing incidence x-ray diffraction (GIXRD) using long soller slit assemblies and a flat crystal monochromator, sometimes referred to as thin film optics, are used to study poly crystal line thin films, polymers, metals, etc. The unique ability of GIXRD to characterize crystalline materials as function of depth and provide accurate strain measurements has lead to the growing popularity of this technique. This non-focusing pseudo-parallel beam geometry can produce various effects on diffraction data which can make interpretation difficult Artifacts such as peak splitting, kα2 distortion, and peaks which shift dramatically as a function of grazing incidence angle are observed when using GIXRD. These artifacts can be related to grazing incidence angle, the divergence of the soller plates, the thickness of the soller plates, the substrate material, and the type of monochromator used. This paper briefly describes some of the topics discussed at the 1992 & 1993 Denver Conferences workshops on parallel beam optics.


1995 ◽  
Vol 39 ◽  
pp. 87-94 ◽  
Author(s):  
Rainer Stabenow ◽  
Alfried Haase

Grazing incidence diffraction (GID) is a powerful tool for the structural characterization of thin films. Unlike traditional Bragg-Brentano geometry (divergent X-ray beam, focusing geometry), GID experiments are enhanced by a parallel beam of high intensity. Classical conditioning of the X-ray beam is done by using small slits on the primary beam side and a long Soller slit in combination with a flat crystal (e.g. graphite, lithium fluoride or germanium) or an energy dispersive detector on the secondary beam side. However, new alternatives for beam conditioners are becoming available which promise increased performance. X-ray beam optics using either planar or graded parabolically curved multilayer mirrors of high reflectivity have been constructed for the primary beam side as well as for the secondary beam side.


2020 ◽  
Vol 1004 ◽  
pp. 393-400
Author(s):  
Tuerxun Ailihumaer ◽  
Hongyu Peng ◽  
Balaji Raghothamachar ◽  
Michael Dudley ◽  
Gilyong Chung ◽  
...  

Synchrotron monochromatic beam X-ray topography (SMBXT) in grazing incidence geometry shows black and white contrast for basal plane dislocations (BPDs) with Burgers vectors of opposite signs as demonstrated using ray tracing simulations. The inhomogeneous distribution of these dislocations is associated with the concave/convex shape of the basal plane. Therefore, the distribution of these two BPD types were examined for several 6-inch diameter 4H-SiC substrates and the net BPD density distribution was used for evaluating the nature and magnitude of basal plane bending in these wafers. Results show different bending behaviors along the two radial directions - [110] and [100] directions, indicating the existence of non-isotropic bending. Linear mapping of the peak shift of the 0008 reflection along the two directions was carried out using HRXRD to correlate with the results from the SMBXT measurements. Basal-plane-tilt angle calculated using the net BPD density derived from SMBXT shows a good correlation with those obtained from HRXRD measurements, which further confirmed that bending in basal plane is caused by the non-uniform distribution of BPDs. Regions of severe bending were found to be associated with both large tilt angles (95% black contrast BPDs to 5% white contrast BPDs) and abrupt changes in a and c lattice parameters i.e. local strain.


1998 ◽  
Author(s):  
Keisuke Tamura ◽  
Koujun Yamashita ◽  
Hideyo Kunieda ◽  
Yuzuru Tawara ◽  
Kazutoshi Haga ◽  
...  

2021 ◽  
Author(s):  
Thalia Nikolaidou ◽  
Marcelo Santos ◽  
Simon D. P. Williams ◽  
Felipe Geremia-Nievinski

<p>GNSS reflectometry (GNSS-R) ability to remote sense the Earth’s surface is affected by an atmospheric bias, as pointed out by several recent studies. In particular, sea level altimetry retrievals are biased in proportion to the reflector height, while by-products, such as tidal amplitudes, are underestimated. Previously, we developed an atmospheric ray-tracing procedure to solve rigorously the three-point boundary value problem of ground-based GNSS-R observations. We defined the reflection-minus-direct or interferometric delay in terms of vacuum distance and radio length. We clarified the roles of linear and angular refraction in splitting the total delay in two components, along-path and geometric. We introduced for the first time two subcomponents of the atmospheric geometric delay, the geometry shift and geometric excess. Finally, we defined atmospheric altimetry corrections necessary for unbiased altimetry retrievals based on half of the rate of change of the atmospheric delays with respect to sine of elevation angle. Later, for users without access to ray-tracing software, we developed closed-form expressions for the atmospheric delay and altimetry correction. The first expression accounts for the angular component of refraction (bending), leading to a displaced specular reflection point. The second one accounts for the linear component (speed retardation) in a homogeneous atmosphere. The expressions are parametrized in terms of refractivity and elevation bending, which can be obtained from empirical models, such as the GPT2 or Bennet’s, or fine-tuned based on in situ pressure and temperature. We also provide a correction for the satellite elevation angle such that the refraction effect is nullified. We validated these expressions against rigorous ray-tracing results and showed that the discrepancy is caused by assumptions in the derivation of the closed formulas. We found the corrections to be beneficial even for small reflector heights, as approximated half of the atmospheric effect originates above the receiving antenna at low satellite elevation angles.</p>


2020 ◽  
Vol 35 (S1) ◽  
pp. S29-S33
Author(s):  
Dieter Ingerle ◽  
Werner Artner ◽  
Klaudia Hradil ◽  
Christina Streli

A commercial Empyrean X-ray diffractometer was adapted for combined grazing incidence X-ray fluorescence analysis (GIXRF) measurements with X-ray reflectivity (XRR) measurements. An energy-dispersive silicon drift detector was mounted and integrated in the angle-dependent data acquisition of the Empyrean. Different monochromator/X-ray optics units have been compared with the values obtained by the Atominstitut GIXRF + XRR spectrometer. Data evaluation was performed by JGIXA, a special software for combined GIXRF + XRR data fitting, developed at Atominstitut. A sample consisting of a ~50 nm nickel layer on a silicon substrate was used to compare the performance criteria (i.e. divergence and intensity) of the incident beam optics. An Empyrean X-ray diffractometer was successfully refitted to measure both GIXRF and XRR data.


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