scholarly journals Formulation of Macroscopic Transport Models for Numerical Simulation of Semiconductor Devices

VLSI Design ◽  
1995 ◽  
Vol 3 (2) ◽  
pp. 211-224 ◽  
Author(s):  
Edwin C. Kan ◽  
Zhiping Yu ◽  
Robert W. Dutton ◽  
Datong Chen ◽  
Umberto Ravaioli

According to different assumptions in deriving carrier and energy flux equations, macroscopic semiconductor transport models from the moments of the Boltzmann transport equation (BTE) can be divided into two main categories: the hydrodynamic (HD) model which basically follows Bløtekjer's approach [1, 2], and the Energy Transport (ET) model which originates from Strattton's approximation [3, 4]. The formulation, discretization, parametrization and numerical properties of the HD and ET models are carefully examined and compared. The well-known spurious velocity spike of the HD model in simple nin structures can then be understood from its formulation and parametrization of the thermoelectric current components. Recent progress in treating negative differential resistances with the ET model and extending the model to thermoelectric simulation is summarized. Finally, we propose a new model denoted by DUET (Dual ET)which accounts for all thermoelectric effects in most modern devices and demonstrates very good numerical properties. The new advances in applicability and computational efficiency of the ET model, as well as its easy implementation by modifying the conventional drift-diffusion (DD) model, indicate its attractiveness for numerical simulation of advanced semiconductor devices

VLSI Design ◽  
2001 ◽  
Vol 13 (1-4) ◽  
pp. 5-13 ◽  
Author(s):  
Kausar Banoo ◽  
Jung-Hoon Rhew ◽  
Mark Lundstrom ◽  
Chi-Wang Shu ◽  
Joseph W. Jerome

Electron transport in model Si nanotransistors is examined by numerical simulation using a hierarchy of simulation methods, from full Boltzmann, to hydrodynamic, energy transport, and drift-diffusion. The on-current of a MOSFET is shown to be limited by transport across a low-field region about one mean-free-path long and located at the beginning of the channel. Commonly used transport models based on simplified solutions of the Boltzmann equation are shown to fail under such conditions. The cause for this failure is related to the neglect of the carriers' drift energy and to the collision-dominated assumptions typically used in the development of simplified transport models.


2007 ◽  
Vol 07 (03) ◽  
pp. L299-L312
Author(s):  
ALI ABOU-ELNOUR

Based on Boltzmann transport equation, the drift-diffusion, hydrodynamic, and Monte-Carlo physical simulators are accurately developed. For each simulator, the model equations are self-consistently solved with Poisson equation, and with Schrödinger equation when quantization effects take place, in one and two-dimensions to characterize the operation and optimize the structure of mm-wave devices. The effects of the device dimensions, biasing conditions, and operating frequencies on the accuracy of results obtained from the simulators are thoroughly investigated. Based on physical understanding of the models, the simulation results are analyzed to fully determine the limits at which a certain device simulator can be accurately and efficiently used to characterize the noise behavior of mm-wave devices.


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