scholarly journals Dielectric Properties of 0.95 ( )-0.05 Composites

2011 ◽  
Vol 2011 ◽  
pp. 1-5 ◽  
Author(s):  
Rekha Rani ◽  
Parveen Kumar ◽  
J. K. Juneja ◽  
K. K. Raina ◽  
Chandra Prakash
Keyword(s):  
Dielectric Properties ◽  
Lead Zirconate Titanate ◽  
Nickel Ferrite ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
Reaction Route ◽  
Conventional Solid State Reaction ◽  
X Ray ◽  
Magnetoelectric Composites ◽  
Solid State Reaction Route

We report studies on dielectric properties of magnetoelectric composites of La-substituted lead zirconate titanate (PLZT) and zinc-doped nickel ferrite (NZF) with compositional formula 0.95 Pb1-3x/2LaxZr0.65Ti0.35O3-0.05 Ni0.8Zn0.2Fe2O4(, 0.01, 0.02, and 0.03). The materials were synthesized by conventional solid state reaction route. The presence of individual phases (PLZT and NZF) was confirmed by using X-ray diffraction technique. Dielectric properties were studied as a function of temperature and frequency. Significant improvement was observed in dielectric properties with addition of La.

scholarly journals Ferroelectric and Dielectric Properties of ZnFe2O4-Pb(ZrTi)O3Multiferroic Nanocomposites

2015 ◽  
Vol 2015 ◽  
pp. 1-5 ◽  
Author(s):  
Shrabanee Sen ◽  
Sk. Md. Mursalin ◽  
M. Maharajan
Keyword(s):  
Lead Zirconate Titanate ◽  
Ferroelectric Properties ◽  
Sol Gel ◽  
Hysteresis Loops ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
Nanosized Powders ◽  
X Ray ◽  
Magnetoelectric Composites ◽  
Gel Technique

Magnetoelectric composites of zinc ferrite and soft lead zirconate titanate (PZT) having formula 0.5 ZnFe2O4-0.5 PZT were synthesized by sol-gel technique. X-ray diffraction analysis was carried out to confirm the coexistence of individual phase. TEM micrographs were taken to confirm the formation of nanosized powders and SEM micrographs were taken to study the morphology of the sintered pellets. Dielectric and P-E hysteresis loops were recorded, respectively, to confirm the ferroelectric properties of the composites.

Effect of Sintering Temperature on Phase Formation and Dielectric Properties of PLZT-BT Ceramics

2015 ◽  
Vol 1120-1121 ◽  
pp. 7-10
Author(s):  
Ladapak Chumprasert ◽  
Narit Funsueb ◽  
Apichart Limpichaipanit ◽  
Athipong Ngamjarurojana
Keyword(s):  
Dielectric Properties ◽  
Lead Zirconate Titanate ◽  
Sintering Temperature ◽  
Lead Zirconate ◽  
Rhombohedral Structure ◽  
Relaxor Behavior ◽  
Dielectric Measurements ◽  
X Ray Diffraction ◽  
X Ray ◽  
Oxide Powders

In this research, Barium titanate (BT) additive in lanthanum modified lead zirconate titanate (PLZT) was used to stabilize the PLZT ceramics. Oxide powders were synthesized by mixed oxide synthetic route via a rapid vibro-milling technique. It was prepared with the chemical formula of 0.95 Pb0.91La0.09 (Zr0.65Ti0.35)0.9775O3 -0.05 BaTiO3 to investigate the dielectric properties of PLZT ceramics. The modified PLZT ceramics were fabricated at variation of sintering temperatures of 1200-1275°C for 4 hours. By employing X-ray diffraction (XRD), it was found a pure perovskite with rhombohedral structure. The relaxor behavior was observed from the dielectric measurements. The suitable sintering temperature of 0.95 PLZT - 0.05 BT was 1275°C (εr=10463, tanδ=0.0125 and Tm=70°C).

scholarly journals Preparation and dielectric properties of BaBi1.8Ln0.2Nb2O9 (Ln = Ce, Gd) ceramics

2018 ◽  
Vol 36 (1) ◽  
pp. 46-50
Author(s):  
Mohamed Afqir ◽  
Amina Tachafine ◽  
Didier Fasquelle
Keyword(s):  
Dielectric Constant ◽  
Dielectric Properties ◽  
Dielectric Loss ◽  
Orthorhombic Structure ◽  
X Ray Diffraction ◽  
Main Subject ◽  
Reaction Route ◽  
Conventional Solid State Reaction ◽  
X Ray ◽  
Ft Ir

AbstractThe main subject of the presented research is to investigate the dielectric properties of BaBi1.8Ln0.2Nb2O9 (Ln = Ce, Gd) ceramics prepared by conventional solid state reaction route. The materials were examined using XRD and FT-IR methods. Moreover, the AC conductivity, dielectric constant and dielectric loss of the ceramics were determined. X-ray diffraction confirmed that all these compounds crystallize in an orthorhombic structure. Fourier transform infrared spectroscopy study confirmed the presence of two characteristic vibration bands located at around 617 cm-1 and 818 cm-1 for BaBi2Nb2O9. The experimental results show that the substitution of Bi by Ce or Gd causes a decrease in Curie temperature, dielectric constant and dielectric loss.

Contribution from Ferroelastic Domain Switching Detected Using X-ray Diffraction toR-Curves in Lead Zirconate Titanate Ceramics

2001 ◽  
Vol 84 (12) ◽  
pp. 2921-2929 ◽  
Author(s):  
Alexandre E. Glazounov ◽  
Hans Kungl ◽  
Jan-Thorsten Reszat ◽  
Michael J. Hoffmann ◽  
Arnd Kolleck ◽  
...  
Keyword(s):  
Lead Zirconate Titanate ◽  
Domain Switching ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Zirconate Titanate ◽  
Titanate Ceramics

scholarly journals Hydrothermal synthesis and characteristics of lanthanumdoped pb(Zr₀.₆₅Ti ₀.₃₅)O₃ ceramics

2021 ◽  
Vol 8 (3) ◽  
pp. 14-19
Author(s):  
Thuy Nguyen Thanh ◽  
Tung Nguyen Van ◽  
Hung Nguyen Trong ◽  
Minh Cao Duy
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Dielectric Constant ◽  
Reaction Temperature ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Influence Of Ph ◽  
Scanning Electron

Lanthanum-doped lead zirconate titanate (PLZT) powders were synthesized using thehydrothermal method. The influence of pH, reaction temperature and time, lanthanum concentration on the formation and characteristics of PLZT were investigated. Obtained powders were investigated using X-ray diffraction analysis (XRD), scanning electron microscopy (SEM) techniques and a dielectric analyzer. The results showed that           Pb1-xLax(Zr0.65Ti0.35)O3 with x= 0.0 – 0.1 were well formed under conditions: pH≥13, reaction time of 12hrs, reaction temperature of 180oC. Dielectric constant of PLZT is higher than PZT. The grain size of the PLZT is found to be 1–3.5 µm.

Preparation and Properties of CCTO-BCTO Ceramics with Ultrahigh Dielectric Constant

2013 ◽  
Vol 760-762 ◽  
pp. 705-708
Author(s):  
La Chen ◽  
Wei Li ◽  
Zhao Xian Xiong ◽  
Chun Xiao Song ◽  
Hong Qiu
Keyword(s):  
Electron Microscopy ◽  
Dielectric Constant ◽  
Dielectric Properties ◽  
X Ray Diffraction ◽  
Optimum Amount ◽  
Conventional Solid State Reaction ◽  
X Ray ◽  
Impedance Characteristics ◽  
Lcr Meter ◽  
Scanning Electron

Ceramics of (1-x)CaCu3Ti4O12-xBi2/3Cu3Ti4O12, i.e., CCTO-BCTO, with x=0, 0.01, 0.1 and 0.25, respectively, were prepared via the conventional solid-state reaction. The phase structure of the ceramics was identified by X-ray diffraction. The microstructure of the sample was observed with scanning electron microscopy. Dielectric properties and impedance spectroscopy were measured using a LCR Meter, in which 0.9CCTO-0.1BCTO displayed highest dielectric constant (584108) and lowest dielectric loss (0.42) at 1kHz among the four kinds of specimens. Based on series of experimental results, an optimum amount of x was able to improve the dielectric properties of CCTO-BCTO, through adjusting the impedance characteristics of the grain and grain boundary.

Temperature Dependence on Dielectric Response of La0.7Ba0.3Mn0.4Ti0.6O3 Ceramic

2015 ◽  
Vol 1107 ◽  
pp. 45-52
Author(s):  
Aaliyawani Ezzerin Sinin ◽  
Walter Charles Primus ◽  
Abdul Halim Shaari ◽  
Zainal Abidin Talib ◽  
Sinin Hamdan
Keyword(s):  
Dielectric Properties ◽  
Temperature Dependence ◽  
Low Frequency ◽  
Sintered Sample ◽  
Solid State Reaction Method ◽  
X Ray Diffraction ◽  
Conventional Solid State Reaction ◽  
Low Frequencies ◽  
X Ray ◽  
Lcr Meter

Ceramic sample of La0.70Ba0.30Mn0.40Ti0.60O3 oxide has been prepared by the conventional solid-state reaction method. The sintered sample was characterized by using x-ray diffraction (XRD) and low frequency LCR meter. XRD result shows that the sample has a cubic structure with the existence of impurity phase. The dielectric properties of La0.70Ba0.30Mn0.40Ti0.60O3 measured from room temperature to 200°C shows that the dielectric permittivity is temperature dependence with strong dispersion at low frequencies. A circuit model based on the universal capacitor response function is also being used to represent the dielectric properties of the sample.

Direct observation of 90° domain switching in lead zirconate titanate thick films using x-ray diffraction

2007 ◽  
Vol 90 (26) ◽  
pp. 262905 ◽  
Author(s):  
Satoko Osone ◽  
Yoshiro Shimojo ◽  
Kyle Brinkman ◽  
Takashi Iijima ◽  
Keisuke Saito
Keyword(s):  
Direct Observation ◽  
Lead Zirconate Titanate ◽  
Domain Switching ◽  
Thick Films ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Zirconate Titanate
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