A 12-Bit Ultra-Low Voltage Noise Shaping Successive-Approximation Register Analogto-Digital Converter Using Emerging TFETs

2017 ◽  
Vol 13 (3) ◽  
pp. 497-510 ◽  
Author(s):  
Jie Lin ◽  
Jiann-Shiun Yuan
Author(s):  
G. Prathiba ◽  
M. Santhi

This paper presents an analysis of the Reduced Switching Capacitor Digital-to-Analog Converter (RSC-DAC)-based low power Successive Approximation Register Analog to Digital Converter (SAR-ADC). The proposed structure involves the Low voltage Static D-Latch Comparator (LSD-LC) with pre-amplifier operators in two modes (Normal and Hold), the RSC-DAC switching energy, reduced by 93% contrast to the standard Charge Redistribution Switching Capacitor DAC (CRSC-DAC) method, and the Successive Approximation Register (SAR) control logic. The LSD-LC with pre-amplifier consists of a latch circuit and a pre-amplifier. The pre-amplifier is often used to eliminate the DC offset voltage and kickback noise without substantially weakening the Signal-to-Noise Ratio (SNR) to drive the main circuit while the latch is needed for comparison. The linearity parameters such as Integral Nonlinearity, Differential Nonlinearity and effect of parasitic capacitances of the RSC-DAC are analyzed and improved by the new approach named as Adaptive Random Code Generation (ARCG) Technique. The above overall design is implemented in 250-nm CMOS design of the TANNER-EDA tool, consuming 1.74-mW power at 60[Formula: see text]MS/s. The proposed structure has an INL and a DNL, respectively, of +0.18/[Formula: see text] LSB and +0.11/[Formula: see text]0.05 LSB.


Sign in / Sign up

Export Citation Format

Share Document