Characterisation of the opening behavior of multilayer films with cohesive failure mechanism by in situ peel tests in the ESEM

2021 ◽  
pp. 875608792110255
Author(s):  
M Heuser ◽  
A Zankel ◽  
C Mayrhofer ◽  
K Reincke ◽  
B Langer ◽  
...  

In this work, peel tests inside the chamber of an ESEM ( in situ peel tests) are described with heat-sealed test specimens of packaging systems made of multilayer films that simulate different flexible packaging types, according to the packaging line used. The in situ peel tests provided evidence to describe the influence of three different main aspects of the packaging process in relation to the opening behavior of the sealing packages. The investigated aspects are the peel angle, the alignment angle between the orientation of the multilayer films and the seal, and the bulge formation as a consequence of inadequate sealing parameters. In situ peel tests enabled the differentiation between peel angle and local (micro) peel angle, which results from the overall stiffness of the multilayer structure film. Alignment angles of 90° and 45° were found to produce similar opening forces. Images showing the formation of various new local micro fissures on new planes during the in situ peel test explained how the opening force can be dramatically increased during the tearing of two sealed multilayer films.

2020 ◽  
Vol 35 (1) ◽  
pp. 58-69
Author(s):  
P. Pongmuksuwan ◽  
W. Harnnarongchai
Keyword(s):  

2008 ◽  
Vol 108 (12) ◽  
pp. 1529-1535 ◽  
Author(s):  
A.N. Chiaramonti ◽  
L.J. Thompson ◽  
W.F. Egelhoff ◽  
B.C. Kabius ◽  
A.K. Petford-Long

1995 ◽  
Vol 403 ◽  
Author(s):  
J. D. Jarratt ◽  
J. A. Barnard

AbstractGiant magnetoresistance (GMR), structure, and magnetic properties of sputtered (Co90Fe10 X Å/Ag Y Å) multilayer films have been investigated. Distinct GMR behaviors including granulartype (GGMR) and ‘discontinuous’ (DGMR) are observed which are strongly dependent on the individual CoFe and Ag layer thicknesses; however, standard multilayer GMR and the associated antiferromagnetic (AFM) coupling is absent. The multilayer structure, individual layer thicknesses, and growth texture were investigated using high and low angle x-ray diffraction (HXRD & LXRD).


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