TEM investigation of thin oxides in MOS structures

2020 ◽  
pp. 491-494
Author(s):  
P Pongratz ◽  
H Oppolzer ◽  
D Schmitt-Landsiedel ◽  
K Hofmann ◽  
G Dorda ◽  
...  
Keyword(s):  
Mos Structures

Formation of oxide-trapped charges in 6HSiC MOS structures

1997 ◽  
Vol 50 (5) ◽  
pp. 429-433
Author(s):  
Masahito Yoshikawa ◽  
Kazunari Saitoh ◽  
Takeshi Ohshima ◽  
Hisayoshi Itoh ◽  
Isamu Nashiyama ◽  
...  
Keyword(s):  
Mos Structures

Magnetoresistance of inversion and accumulation layers in MOS structures on pSi (100)

1984 ◽  
Vol 50 (3) ◽  
pp. 273-277 ◽  
Author(s):  
V.T. Dolgopolov ◽  
S.I. Dorozhkin ◽  
A.A. Shashkin
Keyword(s):  
Mos Structures

scholarly journals MOS structures containing silicon nanoparticles for memory device applications

2008 ◽  
Vol 113 ◽  
pp. 012034 ◽  
Author(s):  
N Nedev ◽  
D Nesheva ◽  
E Manolov ◽  
R Brüggemann ◽  
S Meier ◽  
...  
Keyword(s):  
Silicon Nanoparticles ◽  
Memory Device ◽  
Device Applications ◽  
Mos Structures

Measurement of Fowler-Nordheim tunneling currents in MOS structures under charge trapping conditions

1985 ◽  
Vol 28 (7) ◽  
pp. 717-720 ◽  
Author(s):  
Y. Nissan-Cohen ◽  
J. Shappir ◽  
D. Frohman-Bentchkowsky
Keyword(s):  
Charge Trapping ◽  
Tunneling Currents ◽  
Mos Structures ◽  
Nordheim Tunneling

Electroluminescence in MOS structures with Si/SiO2 nanometric multilayers

2000 ◽  
Vol 114 (1) ◽  
pp. 33-37 ◽  
Author(s):  
Z Gaburro ◽  
G Pucker ◽  
P Bellutti ◽  
L Pavesi
Keyword(s):  
Mos Structures
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