A novel electrochemical synthesis of graphene oxide: Converting waste product to utility

2021 ◽  
Author(s):  
A Neog ◽  
Rajib Biswas ◽  
N. Bharali
Keyword(s):  
Raman Spectroscopy ◽  
Graphene Oxide ◽  
Diffraction Analysis ◽  
Electrochemical Synthesis ◽  
Waste Product ◽  
Basic Medium ◽  
X Ray Diffraction ◽  
X Ray ◽  
Green Route ◽  
Confirmatory Tests

Abstract We comprehensively report here a green route for synthesizing graphene oxide from waste batteries. The satisfactory yield, formulated wholly through basic medium, is validated through confirmatory tests via X-ray Diffraction analysis, FTIR, UV-Vis and Raman Spectroscopy. The overall scheme turns out to be engaging less reactants as well as facile; thus converting a waste material to a useful product.

Accelerated Thermal Decomposition of Graphene Oxide Films in Air via in Situ X-ray Diffraction Analysis

2016 ◽  
Vol 120 (27) ◽  
pp. 14984-14990 ◽  
Author(s):  
Qin Pan ◽  
Ching-Chang Chung ◽  
Nanfei He ◽  
Jacob L. Jones ◽  
Wei Gao
Keyword(s):  
Thermal Decomposition ◽  
Graphene Oxide ◽  
Diffraction Analysis ◽  
Oxide Films ◽  
X Ray Diffraction ◽  
X Ray

Study on integration of aluminum-doped zinc oxide (AZO) thin films with graphene oxide (GO)

2018 ◽  
Vol 32 (19) ◽  
pp. 1840044
Author(s):  
Aditya Dalal ◽  
Animesh Mandal ◽  
Shubhada Adhi ◽  
Kiran Adhi
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Graphene Oxide ◽  
X Ray Diffraction ◽  
Visible Spectroscopy ◽  
X Ray ◽  
Transmission Electron ◽  
Vis Spectroscopy ◽  
Aluminum Doped Zinc Oxide ◽  
Uv Visible

Aluminum (0.5 at.%)-doped ZnO (AZO) thin films were deposited by pulsed laser deposition technique (PLD) in oxygen ambient of 10[Formula: see text] Torr. The deposited thin films were characterized by x-ray diffraction (XRD), photoluminescence (PL), Raman spectroscopy and uv–visible spectroscopy (UV–vis). Next, graphene oxide (GO) was synthesized by Hummers method and was characterized by XRD, UV–vis spectroscopy, Raman spectroscopy and transmission electron microscopy (TEM). Thereafter, GO solution was drop-casted on AZO thin films. These films were then characterized by Raman Spectroscopy, UV–vis spectroscopy and PL. Attempt is being made to comprehend the modifications in properties brought about by integration.

scholarly journals Gamma-Irradiation Induced Functionalization of Graphene Oxide with Organosilanes

2019 ◽  
Vol 20 (8) ◽  
pp. 1910 ◽  
Author(s):  
Kabiru Musa Aujara ◽  
Buong Woei Chieng ◽  
Nor Azowa Ibrahim ◽  
Norhazlin Zainuddin ◽  
Chantara Thevy Ratnam
Keyword(s):  
Raman Spectroscopy ◽  
Graphene Oxide ◽  
Thermogravimetric Analysis ◽  
Gamma Ray ◽  
Chemical Interaction ◽  
Chemical Reduction ◽  
Contact Process ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ft Ir

Gamma-ray radiation was used as a clean and easy method for turning the physicochemical properties of graphene oxide (GO) in this study. Silane functionalized-GO were synthesized by chemically grafting 3-aminopropyltriethoxysilane (APTES) and 3-glycidyloxypropyltrimethoxysilane (GPTES) onto GO surface using gamma-ray irradiation. This established non-contact process is used to create a reductive medium which is deemed simpler, purer and less harmful compared conventional chemical reduction. The resulting functionalized-GO were characterized by Fourier transform infrared spectroscopy (FT-IR), X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), thermogravimetric analysis (TGA), and Raman spectroscopy. The chemical interaction of silane with the GO surface was confirmed by FT-IR. X-ray diffraction reveals the change in the crystalline phases was due to surface functionalization. Surface defects of the GO due to the introduction of silane mioties was revealed by Raman spectroscopy. Thermogravimetric analysis of the functionalized-GO exhibits a multiple peaks in the temperature range of 200–650 °C which corresponds to the degradation of chemically grafted silane on the GO surface.

scholarly journals Biogenic Orthorhombic α-Calcium Formate from Sediments of Alkali Lake, Oregon, USA

Minerals ◽  
2021 ◽  
Vol 11 (5) ◽  
pp. 448
Author(s):  
Nikita V. Chukanov ◽  
Cesar Menor-Salvan ◽  
Vladislav V. Gurzhiy ◽  
Alina R. Izatulina ◽  
Igor V. Pekov ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Diffraction Analysis ◽  
Anthropogenic Pollution ◽  
Agent Orange ◽  
Low Density ◽  
X Ray Diffraction ◽  
X Ray ◽  
Infrared And Raman Spectroscopy ◽  
Two Factors ◽  
Calcium Formate

Centimeter-sized crystals of orthorhombic calcium formate, α-Ca(HCO2)2 from Alkali Lake, Oregon, USA have been studied by means of powder and single-crystal X-ray diffraction analysis, infrared, and Raman spectroscopy. Based on the data on carbon isotope abundance in calcium formate and associated minerals, it was concluded that the formation of α-Ca(HCO2)2 may be a result of a combination of two factors: lake microbial metabolism and anthropogenic pollution with Agent Orange. Possible causes of stability of the low-density tetragonal β-Ca(HCO2)2 polymorph (formicaite) in boron ores are discussed.

scholarly journals Structural analysis of inclusions detected by x-ray inspection of preforms and parts from fine-grained graphite MPG-7

2019 ◽  
pp. 54-59
Author(s):  
A. V. Vershinin ◽  
E. G. Belyakova ◽  
M. V. Vershinina ◽  
E. V. Polyakov ◽  
V. G. Bamburov ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Structural Analysis ◽  
Diffraction Analysis ◽  
Structural Defects ◽  
X Ray Diffraction ◽  
X Ray ◽  
Fine Grained

By X-ray diffraction analysis and Raman spectroscopy, we studied samples of fine-grained graphite MPG-7 with detected chemical and structural defects. We determined the effect of structural and chemical defects on the micro- and macrostructure of graphite and estimated its crystallinity depending on the type of defects detected.

scholarly journals Residual stresses in additively manufactured AlSi10Mg: Raman spectroscopy and X-ray diffraction analysis

2021 ◽  
Vol 202 ◽  
pp. 109550
Author(s):  
Silvia Marola ◽  
Silvia Bosia ◽  
Alessandro Veltro ◽  
Gianluca Fiore ◽  
Diego Manfredi ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Residual Stresses ◽  
Diffraction Analysis ◽  
X Ray Diffraction ◽  
X Ray
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