MNM-P6-6 Improvement of dual-axis micromechanical probe for friction force microscope

Conventional friction force microscopes (FFMs) had the disadvantage of low force sensitivity due to mechanical interference between torsion caused by friction force and deflection by normal force. In order to overcome disadvantage, we developed a dual-axis micro-mechanical probe, which measures the lateral force by the double cantilever and the vertical force by the torsion beam. However, the calibration method of the lateral force has not been established. In this study, we present a new calibration method using a step-structure.

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Principles of atomic friction: from sticking atoms to superlubric sliding

Philosophical Transactions of The Royal Society A Mathematical Physical and Engineering Sciences ◽

10.1098/rsta.2007.2164 ◽

2007 ◽

Vol 366 (1869) ◽

pp. 1383-1404 ◽

Cited By ~ 78

Author(s):

Hendrik Hölscher ◽

André Schirmeisen ◽

Udo D Schwarz

Keyword(s):

Present Article ◽

Friction Force ◽

Research Field ◽

Atomic Scale ◽

Friction Force Microscopy ◽

Force Microscopy ◽

Frictional Forces ◽

Moving Bodies ◽

Friction Force Microscope ◽

Made In

Tribology—the science of friction, wear and lubrication—is of great importance for all technical applications where moving bodies are in contact. Nonetheless, little progress has been made in finding an exact atomistic description of friction since Amontons proposed his empirical macroscopic laws over three centuries ago. The advent of new experimental tools such as the friction force microscope, however, enabled the investigation of frictional forces occurring at well-defined contacts down to the atomic scale. This research field has been established as nanotribology. In the present article, we review our current understanding of the principles of atomic-scale friction based on recent experiments using friction force microscopy.

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NEWLY DEVELOPED MICRO-PROCESSING AND MEASURING SYSTEM UNIFYING FRICTION FORCE MICROSCOPE

Advances in Abrasive Technology ◽

10.1142/9789814317405_0034 ◽

1997 ◽

Author(s):

KIWAMU ASHIDA ◽

SEIJI HIRAI ◽

NOBORU MORITA ◽

YOSHITARO YOSHIDA

Keyword(s):

Friction Force ◽

Measuring System ◽

Friction Force Microscope

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TEM Observation of Microstructural Change of Silicon Single Crystal Caused by Scratching Tests Using SPM

MRS Proceedings ◽

10.1557/proc-841-r9.12 ◽

2004 ◽

Vol 841 ◽

Cited By ~ 2

Author(s):

M. Takagi ◽

K. Onodera ◽

H. Iwata ◽

T. Imura ◽

K. Sasaki ◽

...

Keyword(s):

Single Crystal ◽

Friction Force ◽

Amorphous Region ◽

Silicon Single Crystal ◽

Microstructural Change ◽

First Line ◽

Cross Sectional ◽

Atomic Force ◽

Friction Force Microscope

ABSTRACTIn this study, the microstructural change of the surface of Si single crystal (Si(100)) after the scratching tests under very small loading forces was investigated. At first, line-scratching tests and scanning-scratching tests were carried out using an atomic force/friction force microscope (AFM/FFM). Next, cross-sectional TEM observations of the wear marks which were generated by the scratching tests were carried out. As a result of the TEM observations after the line-scratching tests, it was found that dislocations were observed in the area of less than 100nm thickness from the surface of the wear marks which were formed under the loading forces of more than 5μN. In the case of the loading forces of more than 20μN, an amorphous region was also observed just under the wear marks. As a result of the TEM observations after the scanning-scratching tests, it was found that the introduction of dislocations took place and no amorphous region appeared. It was also found that the several atomic layers at the top surface of the wear marks shifted in parallel to (100).

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