Influence of Electron Beam Irradiation on Mechanical Reliability of Silicon Oxide Thin Film

2020 ◽  
Vol 2020.11 (0) ◽  
pp. 27P2-MN1-2
Author(s):  
Shingo Kammachi ◽  
Takahiro Namazu
Keyword(s):  
Thin Film ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Silicon Oxide ◽  
Oxide Thin Film ◽  
Mechanical Reliability ◽  
Beam Irradiation

Synthesis of graphene oxide thin film and effect of electron beam irradiation

2017 ◽  
Author(s):  
Priyanka Gulia ◽  
Ranjeet Brajpuriya ◽  
Sunil Kumar ◽  
Ambuj Tripathi
Keyword(s):  
Thin Film ◽  
Graphene Oxide ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Oxide Thin Film ◽  
Beam Irradiation

Effects of Electron Beam Irradiation on PZT/PLZT Thin Film Capacitors

1994 ◽  
Vol 361 ◽  
Author(s):  
Bo Jiang ◽  
Jiyoung Kim ◽  
Rajesh Khamankar ◽  
Insup Lee ◽  
Jack C. Lee
Keyword(s):  
Thin Film ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Hysteresis Loops ◽  
Damage Mechanism ◽  
Charge Carriers ◽  
Beam Irradiation ◽  
Thin Film Capacitors ◽  
Domain Boundaries ◽  
Original Domain

ABSTRACTThe effects of electron beam irradiation on the electrical characteristics of Pt-PZT-Pt and Pt-PLZT-Pt (with La concentration of 5% and 10%) thin film capacitors were studied. The top electrode of each capacitor was bombarded by localized energetic electrons with incident energies varying from 5 keV to 25 ke.V. Large distortions in the hysteresis loops were observed when the incident electrons had enough energy to penetrate the 1000Å Pt top electrode. The damage effects are strongly dependent on the original domain orientation when the film is irradiated, and an applied a.c. field after the irradiation seems to induce some recovery effects. The damage mechanism is explained by a simple model which considers the effect of space charge fields generated by the charge carriers trapped at the domain boundaries.

scholarly journals High Density of Si Nanodots in Silicon Oxide Nanowires by Electron Beam Irradiation

2010 ◽  
Vol 16 (S2) ◽  
pp. 1736-1737
Author(s):  
G-S Park ◽  
JH Lee ◽  
S Heo ◽  
H Kwon ◽  
J Park ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Silicon Oxide ◽  
High Density ◽  
Beam Irradiation ◽  
Oxide Nanowires

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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