scholarly journals High-resolution ab initio three-dimensional x-ray diffraction microscopy

2006 ◽  
Vol 23 (5) ◽  
pp. 1179 ◽  
Author(s):  
Henry N. Chapman ◽  
Anton Barty ◽  
Stefano Marchesini ◽  
Aleksandr Noy ◽  
Stefan P. Hau-Riege ◽  
...  
Keyword(s):  
High Resolution ◽  
Ab Initio ◽  
Three Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Microscopy

Three-Dimensional Electron Density Mapping of Shape-Controlled Nanoparticle by Focused Hard X-ray Diffraction Microscopy

Nano Letters ◽  
2010 ◽  
Vol 10 (5) ◽  
pp. 1922-1926 ◽  
Author(s):  
Yukio Takahashi ◽  
Nobuyuki Zettsu ◽  
Yoshinori Nishino ◽  
Ryosuke Tsutsumi ◽  
Eiichiro Matsubara ◽  
...  
Keyword(s):  
Electron Density ◽  
Three Dimensional ◽  
Dimensional Electron ◽  
X Ray Diffraction ◽  
X Ray ◽  
Density Mapping ◽  
Shape Controlled ◽  
Diffraction Microscopy

D068 Three-Dimensional X-ray Diffraction Microscopy of Grain Boundaries

2003 ◽  
Vol 18 (2) ◽  
pp. 172-172
Author(s):  
W. Liu ◽  
G. E. Ice ◽  
W. Yang ◽  
J. Z. Tischler ◽  
B. C. Larson
Keyword(s):  
Grain Boundaries ◽  
Three Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Microscopy

High Resolution Synchrotron X-Ray Diffraction Tomography Of Large-Grained Samples

1996 ◽  
Vol 437 ◽  
Author(s):  
D.P. Piotrowski ◽  
S.R. Stock ◽  
A. Guvenilir ◽  
J.D. Haase ◽  
Z.U. Rek
Keyword(s):  
Spatial Distribution ◽  
High Resolution ◽  
Three Dimensional ◽  
Polycrystalline Materials ◽  
Diffraction Tomography ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Image Storage ◽  
X Ray ◽  
Dimensional Distribution

AbstractIn order to understand the macroscopic response of polycrystalline structural materials to loading, it is frequently essential to know the spatial distribution of strain as well as the variation of micro-texture on the scale of 100 μm. The methods must be nondestructive, however, if the three-dimensional evolution of strain is to be studied. This paper describes an approach to high resolution synchrotron x-ray diffraction tomography of polycrystalline materials. Results from model samples of randomly-packed, millimeter-sized pieces of Si wafers and of similarly sized single-crystal Al blocks have been obtained which indicate that polychromatic beams collimated to 30 μm diameter can be used to determine the depth of diffracting volume elements within ± 70 μm. The variation in the two-dimensional distribution of diffracted intensity with changing sample to detector separation is recorded on image storage plates and used to infer the depth of diffracting volume elements.

High Resolution Synchrotron X-Ray Diffraction Tomography of Polycrystalline Samples

1994 ◽  
Vol 375 ◽  
Author(s):  
S. R. Stock ◽  
A. Guvenilir ◽  
D. P. Piotrowski ◽  
Z. U. Rek
Keyword(s):  
Spatial Distribution ◽  
High Resolution ◽  
Three Dimensional ◽  
Compact Tension ◽  
Polycrystalline Materials ◽  
Diffraction Tomography ◽  
X Ray Diffraction ◽  
Image Storage ◽  
X Ray ◽  
Nondestructive Measurements

AbstractThe macroscopic response of polycrystalline materials to loading depends on both the spatial distribution of strain and the variation of microtexture on the scale of 100 μm. Nondestructive measurements are needed if the three-dimensional evolution of strain is to be studied. This paper describes approaches for high resolution synchrotron polychromatic x-ray diffraction tomography of polycrystalline materials. Preliminary experiments are reported on partially cracked compact tension samples of Al-Li 2090 and on model samples of randomly-packed, millimeter-sized pieces of Si wafers. Polychromatic beams collimated to 100 μm diameter have been used, and the distribution of diffracted intensity has been collected on high resolution x-ray film as well as on image storage plates. The depths of diffracting volume elements are determined from the changes in the spatial distribution of diffracted intensity with varying sample to detector separation.

scholarly journals Three-dimensional α colony characterization and prior-β grain reconstruction of a lamellar Ti–6Al–4V specimen using near-field high-energy X-ray diffraction microscopy

2015 ◽  
Vol 48 (4) ◽  
pp. 1165-1171 ◽  
Author(s):  
E. Wielewski ◽  
D. B. Menasche ◽  
P. G. Callahan ◽  
R. M. Suter
Keyword(s):  
Near Field ◽  
Three Dimensional ◽  
High Energy ◽  
Grain Structure ◽  
X Ray Diffraction ◽  
Orientation Field ◽  
X Ray ◽  
Hexagonal Close Packed ◽  
Flood Fill ◽  
Diffraction Microscopy

Near-field high-energy X-ray diffraction microscopy has been used to characterize the three-dimensional (3-D) crystallographic orientation field of the hexagonal close-packed α phase in a bulk Ti–6Al–4V specimen with a lamellar (β-annealed) microstructure. These data have been segmented using a 3-D misorientation-based grain finding algorithm, providing unprecedented information about the complex 3-D morphologies and spatial misorientation distributions of the transformed α lamella colonies. A 3-D Burgers orientation relationship-based flood-fill algorithm has been implemented to reconstruct the morphologies and crystallographic orientations of the high-temperature body-centered cubic prior-β grains. The combination of these data has been used to gain an understanding of the role of the prior-β grain structure in the formation of specific morphologies and spatial misorientation distributions observed in the transformed α colony structures. It is hoped that this understanding can be used to develop transformation structures optimized for specific applications and to produce more physically realistic synthetic microstructures for use in simulations.

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