Quantifying frequency converters’ residual phase noise is essential in various applications, including radar systems, high-speed digital communication, or particle accelerators. Multi-input signal source analyzers can perform such measurements out of the box, but the high cost limits their accessibility. Based on an analysis of phase noise transmission theory and the capabilities of popular instrumentation, we propose a technique extending the functionality of single-input devices. The method supplements absolute noise measurements with estimates of the phase noise transfer function (also called the jitter transfer function), allowing the calculation of residual noise. The details of the hardware setup used for the method verification are presented. The injection of single-tone and pseudo-random modulations to the test signal is examined. Optional employment of a spectrum analyzer can reduce the time and number of data needed for characterization. A wideband synthesizer with an integrated voltage-controlled oscillator was investigated using the method. The estimated transfer function matches a white-box model based on synthesizer’s structure and values of loop components. The first results confirm the validity of the proposed technique.
Amplitude and phase noise sensitivity of modelocked Ti:sapphire lasers in terms of a complex noise transfer function
