scholarly journals Quantitating morphological changes in biological samples during scanning electron microscopy sample preparation with correlative super-resolution microscopy

PLoS ONE ◽  
2017 ◽  
Vol 12 (5) ◽  
pp. e0176839 ◽  
Author(s):  
Ying Zhang ◽  
Tao Huang ◽  
Danielle M. Jorgens ◽  
Andrew Nickerson ◽  
Li-Jung Lin ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Sample Preparation ◽  
Biological Samples ◽  
Morphological Changes ◽  
Super Resolution ◽  
Super Resolution Microscopy ◽  
Scanning Electron

scholarly journals Oxygen plasma focused ion beam scanning electron microscopy for biological samples

2018 ◽  
Author(s):  
Gorelick Sergey ◽  
Korneev Denis ◽  
Handley Ava ◽  
Gervinskas Gediminas ◽  
Oorschot Viola ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Sample Preparation ◽  
Biological Samples ◽  
Oxygen Plasma ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Light And Electron Microscopy ◽  
Beam Scanning ◽  
Scanning Electron

AbstractOver the past decade, gallium Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM) has been established as a key technology for cellular tomography. The utility of this approach, however, is severely limited both by throughput and the limited selection of compatible sample preparation protocols. Here, we address these limitations and present oxygen plasma FIB (O-PFIB) as a new and versatile tool for cellular FIB-SEM tomography. Oxygen displays superior resin compatibility to other ion beams and produces curtain-free surfaces with minimal polishing. Our novel approach permits more flexible sample preparation and 30% faster data collection when compared to using gallium ion sources. We demonstrate this alternative FIB is applicable to a variety of embedding procedures and biological samples including brain tissue and whole organisms. Finally, we demonstrate the use of O-PFIB to produce targeted FIB-SEM tomograms through fiducial free en-block correlative light and electron microscopy.

scholarly journals Transformation of grains of technological raw materials in the process of obtaining fine powders

2021 ◽  
Vol 249 ◽  
pp. 401-407
Author(s):  
Irina Gembitskaya ◽  
Maria Gvozdetskaya
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Sample Preparation ◽  
Raw Materials ◽  
Morphological Changes ◽  
X Ray ◽  
Technological Processes ◽  
Fine Powders ◽  
Ultrafine Grinding ◽  
Scanning Electron

Crushing and grinding of materials are the most common processes of sample preparation for subsequent analysis and industrial application. Recently, grinding has become one of the most popular methods for producing nano-sized powders. This study investigates certain features of grain transformation in the process of grinding ores with finely dispersed valuable components in order to liberate them, as well as specifics of grinding metallurgical raw materials, metals and their mixtures for using them as initial components in metallurgical and other technological processes. We identified and examined structural and morphological changes of various powders after ultrafine grinding using the methods of scanning electron microscopy and X-ray microanalysis. It was proved that in order to take into account sample preparation artifacts during analytic studies of solid samples and development of technological processes, fine grinding of heterogeneous materials, especially if they contain metals, requires monitoring of the ground product by methods of scanning electron microscopy and X-ray microanalysis.

Field-Emission Scanning Electron Microscopy and Energy-Dispersive X-Ray Analysis to Understand the Role of Tannin-Based Dyes in the Degradation of Historical Wool Textiles

2014 ◽  
Vol 20 (5) ◽  
pp. 1534-1543 ◽  
Author(s):  
Annalaura Restivo ◽  
Ilaria Degano ◽  
Erika Ribechini ◽  
Josefina Pérez-Arantegui ◽  
Maria Perla Colombini
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Elemental Composition ◽  
Field Emission ◽  
Cross Sections ◽  
Morphological Changes ◽  
Energy Dispersive ◽  
X Ray ◽  
Edx Analysis ◽  
Scanning Electron

Abstract:An innovative approach, combining field-emission scanning electron microscopy (FESEM) with energy dispersive X-ray spectroscopy (EDX) analysis, is presented to investigate the degradation mechanisms affecting tannin-dyed wool. In fact, tannin-dyed textiles are more sensitive to degradation then those dyed with other dyestuffs, even in the same conservation conditions.FESEM-EDX was first used to study a set of 48 wool specimens (artificially aged) dyed with several raw materials and mordants, and prepared according to historical dyeing recipes. EDX analysis was performed on the surface of wool threads and on their cross-sections. In addition, in order to validate the model formulated by the analysis of reference materials, several samples collected from historical and archaeological textiles were subjected to FESEM-EDX analysis.FESEM-EDX investigations enabled us to reveal the correlation between elemental composition and morphological changes. In addition, aging processes were clarified by studying changes in the elemental composition of wool from the protective cuticle to the fiber core in cross-sections. Morphological and elemental analysis of wool specimens and of archaeological and historical textiles showed that the presence of tannins increases wool damage, primarily by causing a sulfur decrease and fiber oxidation.

scholarly journals U-10Mo Sample Preparation and Examination using Optical and Scanning Electron Microscopy

2016 ◽  
Author(s):  
Ramprashad Prabhakaran ◽  
Vineet V. Joshi ◽  
Mark A. Rhodes ◽  
Alan L. Schemer-Kohrn ◽  
Anthony D. Guzman ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Sample Preparation ◽  
Scanning Electron

scholarly journals An Easy Path for Correlative Electron and Super-Resolution Light Microscopy

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Dorothea Pinotsi ◽  
Simona Rodighiero ◽  
Silvia Campioni ◽  
Gabor Csucs
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Light Microscopy ◽  
Amyloid Fibrils ◽  
Light And Electron Microscopy ◽  
Super Resolution ◽  
Wide Field ◽  
Set Up ◽  
Bio Compatibility ◽  
Scanning Electron

Abstract A number of new Correlative Light and Electron Microscopy approaches have been developed over the past years, offering the opportunity to combine the specificity and bio-compatibility of light microscopy with the high resolution achieved in electron microscopy. More recently, these approaches have taken one step further and also super-resolution light microscopy was combined with transmission or scanning electron microscopy. This combination usually requires moving the specimen between different imaging systems, an expensive set-up and relatively complicated imaging workflows. Here we present a way to overcome these difficulties by exploiting a commercially available wide-field fluorescence microscope integrated in the specimen chamber of a Scanning Electron Microscope (SEM) to perform correlative LM/EM studies. Super-resolution light microscopy was achieved by using a recently developed algorithm - the Super-Resolution Radial Fluctuations (SRRF) - to improve the resolution of diffraction limited fluorescent images. With this combination of hardware/software it is possible to obtain correlative super-resolution light and scanning electron microscopy images in an easy and fast way. The imaging workflow is described and demonstrated on fluorescently labelled amyloid fibrils, fibrillar protein aggregates linked to the onset of multiple neurodegenerative diseases, revealing information about their polymorphism.

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