scholarly journals Hard X-ray Photoemission Spectroscopy for Probing Bulk Electronic Structures of Solids

Hyomen Kagaku ◽  
2007 ◽  
Vol 28 (12) ◽  
pp. 698-703 ◽  
Author(s):  
Koji HORIBA
Author(s):  
Kaname Kanai ◽  
Takuya Inoue ◽  
Takaya Furuichi ◽  
Kaito Shinoda ◽  
Takashi Iwahashi ◽  
...  

A series of n-cycloparaphenylenes ([n]CPP) were studied by ultraviolet photoemission, inverse photoemission, ultraviolet-visible absorption, and X-ray photoemission spectroscopy to detect their unique electronic structures. [n]CPP has a cyclic structure in...


2004 ◽  
Vol 95 (7) ◽  
pp. 3527-3534 ◽  
Author(s):  
C. W. Ong ◽  
H. Huang ◽  
B. Zheng ◽  
R. W. M. Kwok ◽  
Y. Y. Hui ◽  
...  

1996 ◽  
Vol 10 (14) ◽  
pp. 653-660 ◽  
Author(s):  
XIAOKUI QIN ◽  
JUNYIN WEI ◽  
JING SHI ◽  
MINGLIANG TIAN ◽  
HONG CHEN ◽  
...  

X-ray photoemission spectroscopy study has been performed for the purple bronze KMo 6 O 17. The structures of conduction band and valence band are analogous to the results of ultraviolet photoemission spectra and are also consistent with the model of Travaglini et al., but the gap between conduction and valence band is insignificant. The shape of asymmetric and broadening line of O-1s is due to unresolved contributions from the many inequivalent oxygen sites in this crystal structure. Mo 3d core-level spectrum reveals that there are two kinds of valence states of Molybdenum (Mo+5 and Mo +6). The calculated average valence state is about +5.6, which is consistent with the expectation value from the composition of this material. The tail of Mo-3d spectrum toward higher binding energy is the consequence of the excitation of electron-hole pairs with singularity index of 0.21.


2018 ◽  
Vol 2 (1) ◽  
pp. 7
Author(s):  
S Chirino ◽  
Jaime Diaz ◽  
N Monteblanco ◽  
E Valderrama

The synthesis and characterization of Ti and TiN thin films of different thicknesses was carried out on a martensitic stainless steel AISI 410 substrate used for tool manufacturing. The mechanical parameters between the interacting surfaces such as thickness, adhesion and hardness were measured. By means of the scanning electron microscope (SEM) the superficial morphology of the Ti/TiN interface was observed, finding that the growth was of columnar grains and by means of EDAX the existence of titanium was verified.  Using X-ray diffraction (XRD) it was possible to observe the presence of residual stresses (~ -3.1 GPa) due to the different crystalline phases in the coating. Under X-ray photoemission spectroscopy (XPS) it was possible to observe the molecular chemical composition of the coating surface, being Ti-N, Ti-N-O and Ti-O the predominant ones.


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