Backscattered Electron Contrast Imaging of Scanning Electron Microscopy for Identifying Double Layered Nano-Scale Elements

Journal of Surface Analysis ◽

10.1384/jsa.17.341 ◽

2011 ◽

Vol 17 (3) ◽

pp. 341-345

Author(s):

Hyonchol Kim ◽

Tsutomu Negishi ◽

Masato Kudo ◽

Hiroyuki Takei ◽

Kenji Yasuda

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Contrast Imaging ◽

Backscattered Electron ◽

Scanning Electron

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Quantitative backscattered electron imaging of field emission scanning electron microscopy for discrimination of nano-scale elements with nm-order spatial resolution

Journal of Electron Microscopy ◽

10.1093/jmicro/dfq012 ◽

2010 ◽

Vol 59 (5) ◽

pp. 379-385 ◽

Author(s):

H. Kim ◽

T. Negishi ◽

M. Kudo ◽

H. Takei ◽

K. Yasuda

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Field Emission ◽

Spatial Resolution ◽

Backscattered Electron Imaging ◽

Quantitative Backscattered Electron Imaging ◽

Backscattered Electron ◽

Electron Imaging ◽

Scanning Electron

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Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopy

Ultramicroscopy ◽

10.1016/j.ultramic.2021.113333 ◽

2021 ◽

pp. 113333

Author(s):

Iwona Jóźwik ◽

Jacek Jagielski ◽

Ewa Dumiszewska ◽

Maciej Kamiński ◽

Ulrich Kentsch

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Contrast Imaging ◽

Semiconductor Structures ◽

Scanning Electron

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Scanning Electron Microscopy with Backscattered Electron Imaging to IdentifyPneumocystis carinii

New England Journal of Medicine ◽

10.1056/nejm198712103172416 ◽

1987 ◽

Vol 317 (24) ◽

pp. 1541-1541 ◽

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Backscattered Electron Imaging ◽

Backscattered Electron ◽

Electron Imaging ◽

Scanning Electron

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Identification of Cells by Backscattered Electron Imaging of Silver Stained Bulk Tissues in Scanning Electron Microscopy

Stain Technology ◽

10.3109/10520298409113847 ◽

1984 ◽

Vol 59 (3) ◽

pp. 143-148 ◽

Author(s):

Tsuyoshi Horiguchi ◽

Fumie Sasaki ◽

Hideki Takahama ◽

Kyozo Watanabe

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Backscattered Electron Imaging ◽

Backscattered Electron ◽

Electron Imaging ◽

Scanning Electron

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Backscattered electron image of osmium-impregnated/macerated tissues as a novel technique for identifying the cis -face of the Golgi apparatus by high-resolution scanning electron microscopy

Journal of Microscopy ◽

10.1111/jmi.12379 ◽

2016 ◽

Vol 263 (1) ◽

pp. 87-96 ◽

Author(s):

D. KOGA ◽

H. BOCHIMOTO ◽

T. WATANABE ◽

T. USHIKI

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

High Resolution ◽

Golgi Apparatus ◽

Novel Technique ◽

Electron Image ◽

Backscattered Electron ◽

Scanning Electron

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Application of Monte Carlo Simulation Method to the Nano-Scale Characterization by Scanning Electron Microscopy

Materials Science Forum - PRICM-5 ◽

10.4028/0-87849-960-1.4161 ◽

2005 ◽

pp. 4161-4164

Author(s):

Z.J. Ding ◽

H.M. Li ◽

X. Sun

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Monte Carlo Simulation ◽

Monte Carlo ◽

Simulation Method ◽

Monte Carlo Simulation Method ◽

Scale Characterization ◽

Scanning Electron

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Backscattered electron detector for 3D microstructure visualization in scanning electron microscopy

Review of Scientific Instruments ◽

10.1063/1.5054746 ◽

2019 ◽

Vol 90 (2) ◽

pp. 023701 ◽

Author(s):

E. I. Rau ◽

V. Yu. Karaulov ◽

S. V. Zaitsev

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Electron Detector ◽

3D Microstructure ◽

Backscattered Electron ◽

Scanning Electron

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Charge contrast imaging of suspended nanotubes by scanning electron microscopy

Nanotechnology ◽

10.1088/0957-4484/19/33/335202 ◽

2008 ◽

Vol 19 (33) ◽

pp. 335202 ◽

Author(s):

Paul Finnie ◽

Kate Kaminska ◽

Yoshikazu Homma ◽

D Guy Austing ◽

Jacques Lefebvre

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Contrast Imaging ◽

Scanning Electron

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Surface roughness of preparations for backscattered electron-scanning electron microscopy: The image differences and their monte carlo simulation

Scanning ◽

10.1002/sca.4950210601 ◽

2006 ◽

Vol 21 (6) ◽

pp. 361-367 ◽

Author(s):

P. G. T. Howell ◽

A. Boyde

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Surface Roughness ◽

Monte Carlo Simulation ◽

Monte Carlo ◽

Backscattered Electron ◽

Scanning Electron

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Increasing compositional backscattered electron contrast in scanning electron microscopy

Ultramicroscopy ◽

10.1016/j.ultramic.2017.12.001 ◽

2018 ◽

Vol 186 ◽

pp. 82-93 ◽

Author(s):

F. Timischl ◽

N. Inoue

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Backscattered Electron ◽

Scanning Electron

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