scholarly journals Development of the Curved Surface Sample Holder for TOF-SIMS Imaging

2019 ◽  
Vol 25 (3) ◽  
pp. 181-191
Author(s):  
Shin-ichi Iida ◽  
Takuya Miyayama ◽  
Ibuki Tanaka
Keyword(s):  
Curved Surface ◽  
Sample Holder ◽  
Surface Sample ◽  
Tof Sims

Wider vision capability provided by a curved surface sample holder for TOF-SIMS imaging

2020 ◽  
Vol 38 (3) ◽  
pp. 034013
Author(s):  
Shin-ichi Iida ◽  
Hsun-Yun Chang ◽  
Gregory L. Fisher ◽  
Takuya Miyayama ◽  
Ibuki Tanaka
Keyword(s):  
Curved Surface ◽  
Sample Holder ◽  
Surface Sample ◽  
Tof Sims

scholarly journals Study on Magnetic Abrasive Finishing Process of AlSi10Mg Alloy Curved Surface Formed by Selective Laser Melting

2021 ◽  
Author(s):  
Yuntao Cui ◽  
Guixiang Zhang ◽  
Tonglei Cui ◽  
Peixin Zhu ◽  
Jiajing Du ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Permanent Magnet ◽  
Selective Laser Melting ◽  
Surface Hardness ◽  
Curved Surface ◽  
Surface Finishing ◽  
Laser Melting ◽  
Surface Sample ◽  
Surface Samples ◽  
Finishing Tool

Abstract In this paper, AlSi10Mg alloy powder is selected as the forming powder of Selective Laser Melting technology, and the AlSi10Mg alloy SLM curved surface sample is constructed by setting the internal and external layering parameters. In view of the relatively rough surface roughness of SLM technology molded parts, this paper selects the magnetic finishing technology with higher flexibility characteristics to perform surface finishing and finishing on the formed curved surface samples. Explore the feasibility of magnetic finishing technology on the finishing of SLM shaped curved parts, and test and analyze the surface roughness, surface hardness and hydrophobicity of the finishing permanent magnet tools and the curved surface samples before and after finishing. Finally, it was found that the use of a 75° trapezoidal slotted permanent magnet finishing tool to absorb spherical Al2O3 magnetic abrasives for flexible finishing of AlSi10Mg alloy SLM shaped curved surface samples can achieve better finishing results.In this paper, the orthogonal experiment method is used to optimize the finishing experiment. It is found that the finishing parameters of the spindle speed is 1800 r/min, the feed rate is 5 mm/min, the gap is 2 mm, and the abrasive consumption is 7g to form the AlSi10Mg alloy SLM. The surface roughness Ra=0.279μm can be obtained by magnetic finishing of the curved sample, and the surface morphology of the sample has been greatly improved. At the same time, it is found that the magnetic finishing technology improves the surface roughness of the AlSi10Mg alloy SLM forming surface sample, while it does not change the surface hardness of the sample, but it can significantly improve the hydrophobicity of the sample surface.

Gritty Surface Sample Holder Invented To Obtain Correct X-ray Absorption Fine Structure Spectra for Concentrated Materials by Fluorescence Yield

2016 ◽  
Vol 88 (7) ◽  
pp. 3455-3458
Author(s):  
Hitoshi Abe ◽  
Yasuhiro Niwa ◽  
Masao Kimura ◽  
Youichi Murakami ◽  
Toshiharu Yokoyama ◽  
...  
Keyword(s):  
Fine Structure ◽  
Fluorescence Yield ◽  
Sample Holder ◽  
X Ray ◽  
Surface Sample ◽  
Absorption Fine ◽  
X Ray Absorption

Preparation of cross-sectional samples for near-surface TEM studies

1987 ◽  
Vol 45 ◽  
pp. 380-381
Author(s):  
R.C. Dickenson ◽  
K.R. Lawless
Keyword(s):  
Standard Sample ◽  
Surface Region ◽  
Specimen Preparation ◽  
Thick Sheet ◽  
Drill Bit ◽  
Sample Holder ◽  
Metal Interface ◽  
Cross Sectional ◽  
Near Surface ◽  
Cold Worked

In thermal oxidation studies, the structure of the oxide-metal interface and the near-surface region is of great importance. A technique has been developed for constructing cross-sectional samples of oxidized aluminum alloys, which reveal these regions. The specimen preparation procedure is as follows: An ultra-sonic drill is used to cut a 3mm diameter disc from a 1.0mm thick sheet of the material. The disc is mounted on a brass block with low-melting wax, and a 1.0mm hole is drilled in the disc using a #60 drill bit. The drill is positioned so that the edge of the hole is tangent to the center of the disc (Fig. 1) . The disc is removed from the mount and cleaned with acetone to remove any traces of wax. To remove the cold-worked layer from the surface of the hole, the disc is placed in a standard sample holder for a Tenupol electropolisher so that the hole is in the center of the area to be polished.

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

Problems with oxygen analysis in the system MgO-Al2O3-SiO2 with the electron microprobe

1992 ◽  
Vol 50 (2) ◽  
pp. 1624-1625
Author(s):  
Michel Fialin ◽  
Guy Rémond
Keyword(s):  
Transition Metal ◽  
Metal Oxides ◽  
Transition Metal Oxides ◽  
Electrostatic Charge ◽  
Carbon Layer ◽  
Sample Holder ◽  
Rock Matrix ◽  
Electrical Discharges ◽  
Thin Carbon ◽  
Beam Instabilities

Oxygen-bearing minerals are generally strong insulators (e.g. silicates), or if not (e.g. transition metal oxides), they are included within a rock matrix which electrically isolates them from the sample holder contacts. In this respect, a thin carbon layer (150 Å in our laboratory) is evaporated on the sections in order to restore the conductivity. For silicates, overestimated oxygen concentrations are usually noted when transition metal oxides are used as standards. These trends corroborate the results of Bastin and Heijligers on MgO, Al2O3 and SiO2. According to our experiments, these errors are independent of the accelerating voltage used (fig.l).Owing to the low density of preexisting defects within the Al2O3 single-crystal, no significant charge buildup occurs under irradiation at low accelerating voltage (< 10keV). As a consequence, neither beam instabilities, due to electrical discharges within the excited volume, nor losses of energy for beam electrons before striking the sample, due to the presence of the electrostatic charge-induced potential, are noted : measurements from both coated and uncoated samples give comparable results which demonstrates that the carbon coating is not the cause of the observed errors.

Bending Fluctuations of an Elastic Line on a Curved Surface in R31

2007 ◽  
Vol 107 (1) ◽  
pp. 15-29
Author(s):  
N GÜRBÜZ
Keyword(s):  
Curved Surface ◽  
Elastic Line

Interface on User's Back of the Hand Using ToF Sensor Array on the Curved Surface

2019 ◽  
Vol 139 (11) ◽  
pp. 533-538
Author(s):  
Satoshi Tsuji ◽  
Teruhiko Kohama
Keyword(s):  
Sensor Array ◽  
Curved Surface

New approaches to coupling TLC with TOF-SIMS

2005 ◽  
Vol 18 (101) ◽  
pp. 44-50 ◽  
Author(s):  
Andrej Oriňák ◽  
Guido Vering ◽  
Heinrich Arlinghaus ◽  
Jan Andersson ◽  
Ladislav Halas ◽  
...  
Keyword(s):  
New Approaches ◽  
Tof Sims
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