Project duration prediction using a Monte Carlo simulation of the periodic output of the project resources

2003 ◽  
Vol 9 (3) ◽  
Author(s):  
Scott D. Button
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Project Duration ◽  
Duration Prediction

scholarly journals Project duration-cost-quality prediction model based on Monte Carlo simulation

2021 ◽  
Vol 1978 (1) ◽  
pp. 012048
Author(s):  
Xingguang Chen ◽  
Luqiang Cheng ◽  
Guohua Deng ◽  
Shuqi Guan ◽  
Lewei Hu
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Prediction Model ◽  
Quality Prediction ◽  
Project Duration ◽  
Model Based

scholarly journals Examining the Value of Monte Carlo Simulation for Project Time Management

2018 ◽  
Vol 24 (1) ◽  
pp. 11
Author(s):  
Goran Avlijas
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Monte Carlo Method ◽  
Time Management ◽  
Research Question ◽  
Relevant Literature ◽  
Management Tool ◽  
Project Duration ◽  
Schedule Management ◽  
The Monte Carlo Method

Research Question: This paper investigates whether the Monte Carlo simulation can be widely used as a practicable method for the analysis of the risks that impact project duration. Motivation: The main goal was to explore the use of the Monte Carlo simulation for project time management, and shed some light on the key benefits and drawbacks of this method. The paper reviewed the existing literature considering traditional use of the Monte Carlo for quantitative project risk analysis (such as Kwak & Ingall, 2007; Hulett, 2017) and elaborated the issue by suggesting potential improvements in terms of method modification for schedule management, such as event chain methodology proposed by Agarwal & Virine (2017). Another goal was to examine the capability of user-friendly software to provide project managers with some of these benefits. Idea: The core idea of this paper was to evaluate the value of the Monte Carlo method for project time and schedule management, by matching traditional foundations with modern techniques. Data: The paper used the secondary data extracted from relevant literature and project examples. A literature review reveals how the application of the Monte Carlo simulation evolved as a project management tool, along with specific benefits and concerns for its application. Tools: A detailed application of the Monte Carlo in predicting project duration is provided, and the applicability and viability of the method are proven through a case demonstration. Following the presentation of a practical example and discussion of the main features, some limitations and potential improvements to the Monte Carlo method are suggested. Findings: Even with the existence of certain limitations, the Monte Carlo simulation remains the primary method for quantitative analysis of project risks. Despite the Monte Carlo having been found to be applicable, adaptable and predictive of total project duration, it is found to be insufficiently used by practitioners. Contribution: The paper urges the need for research on successful diffusion of the Monte Carlo simulation and helps practitioners to understand the adaptability of the Monte Carlo simulation as a tool for risk quantification and its use for effective duration planning of their projects.  

Electron Scattering in Solids

1990 ◽  
Vol 48 (2) ◽  
pp. 4-5
Author(s):  
Ryuichi Shimizu ◽  
Ze-Jun Ding
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Angular Distribution ◽  
Elastic Scattering ◽  
Electron Scattering ◽  
Cross Sections ◽  
Expansion Method ◽  
Electron Excitation ◽  
Partial Wave Expansion ◽  
Backscattered Electrons

Monte Carlo simulation has been becoming most powerful tool to describe the electron scattering in solids, leading to more comprehensive understanding of the complicated mechanism of generation of various types of signals for microbeam analysis.The present paper proposes a practical model for the Monte Carlo simulation of scattering processes of a penetrating electron and the generation of the slow secondaries in solids. The model is based on the combined use of Gryzinski’s inner-shell electron excitation function and the dielectric function for taking into account the valence electron contribution in inelastic scattering processes, while the cross-sections derived by partial wave expansion method are used for describing elastic scattering processes. An improvement of the use of this elastic scattering cross-section can be seen in the success to describe the anisotropy of angular distribution of elastically backscattered electrons from Au in low energy region, shown in Fig.l. Fig.l(a) shows the elastic cross-sections of 600 eV electron for single Au-atom, clearly indicating that the angular distribution is no more smooth as expected from Rutherford scattering formula, but has the socalled lobes appearing at the large scattering angle.

Determination of Stoichiometry of GaAs Component in (Gaas)Ge Epitaxially Grown Thin Films by Electron Microprobe X-Ray Analysis

1990 ◽  
Vol 48 (2) ◽  
pp. 264-265
Author(s):  
D. R. Liu ◽  
S. S. Shinozaki ◽  
R. J. Baird
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Compound Semiconductors ◽  
Energy Dispersive Analysis ◽  
X Ray ◽  
Metastable Alloys ◽  
Lower Voltage

The epitaxially grown (GaAs)Ge thin film has been arousing much interest because it is one of metastable alloys of III-V compound semiconductors with germanium and a possible candidate in optoelectronic applications. It is important to be able to accurately determine the composition of the film, particularly whether or not the GaAs component is in stoichiometry, but x-ray energy dispersive analysis (EDS) cannot meet this need. The thickness of the film is usually about 0.5-1.5 μm. If Kα peaks are used for quantification, the accelerating voltage must be more than 10 kV in order for these peaks to be excited. Under this voltage, the generation depth of x-ray photons approaches 1 μm, as evidenced by a Monte Carlo simulation and actual x-ray intensity measurement as discussed below. If a lower voltage is used to reduce the generation depth, their L peaks have to be used. But these L peaks actually are merged as one big hump simply because the atomic numbers of these three elements are relatively small and close together, and the EDS energy resolution is limited.

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