Anatomical reference frame versus planar analysis: implications for the kinematics of the rat hindlimb during locomotion

2011 ◽  
Vol 22 (2) ◽  
pp. 241
Author(s):  
Filipa João ◽  
Sandra Amado ◽  
António Veloso ◽  
Paulo Armada-da-Silva ◽  
Ana C. Maurício

2010 ◽  
Vol 21 (6) ◽  
Author(s):  
Filipa Joãoa ◽  
Sandra Amadoa ◽  
Antoniò Velosoa ◽  
Paulo Armada-da-Silvaa ◽  
Ana C. Maurício


1975 ◽  
Vol 26 ◽  
pp. 341-380 ◽  
Author(s):  
R. J. Anderle ◽  
M. C. Tanenbaum

AbstractObservations of artificial earth satellites provide a means of establishing an.origin, orientation, scale and control points for a coordinate system. Neither existing data nor future data are likely to provide significant information on the .001 angle between the axis of angular momentum and axis of rotation. Existing data have provided data to about .01 accuracy on the pole position and to possibly a meter on the origin of the system and for control points. The longitude origin is essentially arbitrary. While these accuracies permit acquisition of useful data on tides and polar motion through dynamio analyses, they are inadequate for determination of crustal motion or significant improvement in polar motion. The limitations arise from gravity, drag and radiation forces on the satellites as well as from instrument errors. Improvements in laser equipment and the launch of the dense LAGEOS satellite in an orbit high enough to suppress significant gravity and drag errors will permit determination of crustal motion and more accurate, higher frequency, polar motion. However, the reference frame for the results is likely to be an average reference frame defined by the observing stations, resulting in significant corrections to be determined for effects of changes in station configuration and data losses.



2011 ◽  
Author(s):  
Mark Mills ◽  
Stefan Van Der Stigchel ◽  
Andrew Hollingworth ◽  
Michael D. Dodd






Author(s):  
M.Yu. Khovritchev ◽  
V. Robert ◽  
N.V. Narizhnaya ◽  
T.A. Vasilyeva ◽  
A.A. Apetyan ◽  
...  
Keyword(s):  


2002 ◽  
Vol 2 ◽  
pp. 327-339 ◽  
Author(s):  
F. Mignard
Keyword(s):  


2018 ◽  
Author(s):  
Sang Hoon Lee ◽  
Jeff Blackwood ◽  
Stacey Stone ◽  
Michael Schmidt ◽  
Mark Williamson ◽  
...  

Abstract The cross-sectional and planar analysis of current generation 3D device structures can be analyzed using a single Focused Ion Beam (FIB) mill. This is achieved using a diagonal milling technique that exposes a multilayer planar surface as well as the cross-section. this provides image data allowing for an efficient method to monitor the fabrication process and find device design errors. This process saves tremendous sample-to-data time, decreasing it from days to hours while still providing precise defect and structure data.







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