Secondary extinction correction used in a novel method for improved XRD characterizations of textured materials: The case of thin films
2007 ◽
Vol 2007
(suppl_26)
◽
pp. 131-136
2007 ◽
Vol 2007
(suppl_26)
◽
pp. 131-136
2014 ◽
Vol 2
(7)
◽
pp. 1278-1283
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1995 ◽
Vol 25
(1-3)
◽
pp. 588-590
◽
2013 ◽
Vol 745-746
◽
pp. 255-260
Keyword(s):
1993 ◽
Vol 8
(11)
◽
pp. 2933-2941
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