Structural characterization of amorphous ceramics in the system Si–B–N–(C) by means of transmission electron microscopy methods

1999 ◽  
Vol 14 (9) ◽  
pp. 3746-3753 ◽  
Author(s):  
D. Heinemann ◽  
W. Assenmacher ◽  
W. Mader ◽  
M. Kroschel ◽  
M. Jansen

Amorphous ceramics with the chemical composition Si3B3N7 and SiBN3C were produced from single-source molecular precursors by polymerization and pyrolysis. The powder and fiber materials were investigated by means of energy filtering transmission electron microscopy. The intensity of elastically scattered electrons is recorded to calculate the pair distribution function of these ceramics. In the pair distribution function of Si3B3N7 three significant maxima at 0.144, 0.172, and 0.291 nm are clearly resolved and are assigned to the pair distances B–N, Si–N, and Si–Si (N–N), respectively, by comparison to crystalline materials. The predominant structural units of the ceramic are trigonal planar BN3 and tetrahedral SiN4 groups, which are close to their regular symmetry. The overall pair distribution function of SiBN3C is very similar to that of Si3B3N7; however, the maxima are broadened due to the incorporation of carbon into the network. High-resolution mapping of the elements Si, B, N, and C with electron spectroscopic imaging reveals a homogeneous distribution on a subnanometer scale without precipitation or separation of, for example, carbon-rich clusters. Similarly, elemental mapping of Si3B3N7 reveals a random distribution of the elements Si, B, and N at the same scale. Both new ceramics consist of an amorphous network with bonds and coordinations as preformed in the precursor.

1999 ◽  
Vol 557 ◽  
Author(s):  
J. Yamasaki ◽  
S. Takeda

AbstractThe structural properties of the amorphous Si (a-Si), which was created from crystalline silicon by 2 MeV electron irradiation at low temperatures about 25 K, are examined in detail by means of transmission electron microscopy and transmission electron diffraction. The peak positions in the radial distribution function (RDF) of the a-Si correspond well to those of a-Si fabricated by other techniques. The electron-irradiation-induced a-Si returns to crystalline Si after annealing at 550°C.


2017 ◽  
Vol 5 (36) ◽  
pp. 9331-9338 ◽  
Author(s):  
Anna-Lena Hansen ◽  
Torben Dankwort ◽  
Hendrik Groß ◽  
Martin Etter ◽  
Jan König ◽  
...  

Structural properties of the thermoelectric materials CuCrS2 and CuxCrS2 on different length scales.


2014 ◽  
Vol 21 (2) ◽  
pp. 459-471 ◽  
Author(s):  
Tatiana E. Gorelik ◽  
Martin U. Schmidt ◽  
Ute Kolb ◽  
Simon J. L. Billinge

AbstractThis paper shows that pair-distribution function (PDF) analyses can be carried out on organic and organometallic compounds from powder electron diffraction data. Different experimental setups are demonstrated, including selected area electron diffraction and nanodiffraction in transmission electron microscopy or nanodiffraction in scanning transmission electron microscopy modes. The methods were demonstrated on organometallic complexes (chlorinated and unchlorinated copper phthalocyanine) and on purely organic compounds (quinacridone). The PDF curves from powder electron diffraction data, called ePDF, are in good agreement with PDF curves determined from X-ray powder data demonstrating that the problems of obtaining kinematical scattering data and avoiding beam damage of the sample are possible to resolve.


2020 ◽  
Vol 7 (12) ◽  
pp. 3735-3745
Author(s):  
Graham King ◽  
Mert Celikin ◽  
Mario Alberto Gomez ◽  
Levente Becze ◽  
Valeri Petkov ◽  
...  

The poor crystallinity of As(v) minerals such as arseniosiderite and yukonite has made a detailed understanding of their structures elusive. Therefore, these were probed by pair distribution function analysis and transmission electron microscopy.


Author(s):  
L. D. Peachey ◽  
J. P. Heath ◽  
G. Lamprecht

Biological specimens of cells and tissues generally are considerably thicker than ideal for high resolution transmission electron microscopy. Actual image resolution achieved is limited by chromatic aberration in the image forming electron lenses combined with significant energy loss in the electron beam due to inelastic scattering in the specimen. Increased accelerating voltages (HVEM, IVEM) have been used to reduce the adverse effects of chromatic aberration by decreasing the electron scattering cross-section of the elements in the specimen and by increasing the incident electron energy.


2011 ◽  
Vol 17 (S2) ◽  
pp. 790-791
Author(s):  
M Watanabe ◽  
F Allen

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.


2012 ◽  
Vol 48 (9) ◽  
pp. 322-330 ◽  
Author(s):  
Shin HORIUTI ◽  
Takeshi HANADA ◽  
Takayuki MIYAMAE ◽  
Tadae YAMANAKA ◽  
Kogoro OOSUMI ◽  
...  

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