scholarly journals Contrast Mechanism Maps for Piezoresponse Force Microscopy

2002 ◽  
Vol 17 (5) ◽  
pp. 936-939 ◽  
Author(s):  
Sergei V. Kalinin ◽  
Dawn A. Bonnell
Keyword(s):  
Piezoresponse Force Microscopy ◽  
Radius Of Curvature ◽  
Experimental Conditions ◽  
Force Microscopy ◽  
Indentation Force ◽  
Domain Structures ◽  
Contrast Mechanism ◽  
Local Modification ◽  
Tip Radius ◽  
Imaging Conditions

Piezoresponse force microscopy (PFM) is one of the most established techniques for the observation and local modification of ferroelectric domain structures on the submicron level. Both electrostatic and electromechanical interactions contribute at the tip-surface junction in a complex manner, which has resulted in multiple controversies in the interpretation of PFM. Here we analyze the influence of experimental conditions such as tip radius of curvature, indentation force, and cantilever stiffness on PFM image contrast. These results are used to construct contrast mechanism maps, which correlate the imaging conditions with the dominant contrast mechanisms. Conditions under which materials properties can be determined quantitatively are elucidated.

Molecular Dynamics Simulation of AFM-Based Nanomachining Processes

2011 ◽  
Author(s):  
Rapeepan Promyoo ◽  
Hazim El-Mounayri ◽  
Kody Varahramyan ◽  
Ashlie Martini
Keyword(s):  
Molecular Dynamics ◽  
Friction Coefficient ◽  
Md Simulation ◽  
Computational Models ◽  
Dynamics Simulation ◽  
Radius Of Curvature ◽  
Force Microscopy ◽  
Indentation Force ◽  
Atomic Force ◽  
Development And Validation

Recently, atomic force microscopy (AFM) has been widely used for nanomachining and fabrication of micro/ nanodevices. This paper describes the development and validation of computational models for AFM-based nanomachining (nanoindentation and nanoscratching). The Molecular Dynamics (MD) technique is used to model and simulate mechanical indentation and scratching at the nanoscale in the case of gold and silicon. The simulation allows for the prediction of indentation forces and the friction force at the interface between an indenter and a substrate. The effects of tip curvature and speed on indentation force and friction coefficient are investigated. The material deformation and indentation geometry are extracted based on the final locations of atoms, which are displaced by the rigid tool. In addition to modeling, an AFM was used to conduct actual indentation at the nanoscale, and provide measurements to validate the predictions from the MD simulation. The AFM provides resolution on nanometer (lateral) and angstrom (vertical) scales. A three-sided pyramid indenter (with a radius of curvature ∼ 50 nm) is raster scanned on top of the surface and in contact with it. It can be observed from the MD simulation results that the indentation force increases as the depth of indentation increases, but decreases as the scratching speed increases. On the other hand, the friction coefficient is found to be independent of scratching speed.

scholarly journals Investigations of ferroelectric polycrystalline bulks and thick films using piezoresponse force microscopy

2019 ◽  
Vol 475 (2223) ◽  
pp. 20180782 ◽  
Author(s):  
Hana Uršič ◽  
Uroš Prah
Keyword(s):  
Domain Walls ◽  
Thick Films ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Domain Structures ◽  
Atomic Force ◽  
Ferroelectric Domain Structure ◽  
Converse Piezoelectric Effect ◽  
Non Destructive

In recent years, ferroelectric/piezoelectric polycrystalline bulks and thick films have been extensively studied for different applications, such as sensors, actuators, transducers and caloric devices. In the majority of these applications, the electric field is applied to the working element in order to induce an electromechanical response, which is a complex phenomenon with several origins. Among them is the field-induced movement of domain walls, which is nowadays extensively studied using piezoresponse force microscopy (PFM), a technique derived from atomic force microscopy. PFM is based on the detection of the local converse piezoelectric effect in the sample; it is one of the most frequently applied methods for the characterization of the ferroelectric domain structure due to the simplicity of the sample preparation, its non-destructive nature and its relatively high imaging resolution. In this review, we focus on the PFM analysis of ferroelectric bulk ceramics and thick films. The core of the paper is divided into four sections: (i) introduction; (ii) the preparation of the samples prior to the PFM investigation; (iii) this is followed by reviews of the domain structures in polycrystalline bulks; and (iv) thick films.

Domain structures in tetragonal Pb(Mg1/3Nb2/3)O3–PbTiO3 single crystals studied by piezoresponse force microscopy

2005 ◽  
Vol 133 (5) ◽  
pp. 311-314 ◽  
Author(s):  
H.F. Yu ◽  
H.R. Zeng ◽  
H.X. Wang ◽  
G.R. Li ◽  
H.S. Luo ◽  
...  
Keyword(s):  
Single Crystals ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Domain Structures

Piezoresponse force microscopy studies of nanoscale domain structures in ferroelectric thin film

2005 ◽  
Vol 120 (1-3) ◽  
pp. 104-108 ◽  
Author(s):  
H.R. Zeng ◽  
H.F. Yu ◽  
X.G. Tang ◽  
R.Q. Chu ◽  
G.R. Li ◽  
...  
Keyword(s):  
Thin Film ◽  
Ferroelectric Thin Film ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Domain Structures

scholarly journals Micro-Raman Imaging of Ferroelectric Domain Structures in the Bulk of PMN-PT Single Crystals

Crystals ◽  
2019 ◽  
Vol 9 (2) ◽  
pp. 65 ◽  
Author(s):  
Pavel Zelenovskiy ◽  
Evgeny Greshnyakov ◽  
Dmitry Chezganov ◽  
Lyubov Gimadeeva ◽  
Evgeny Vlasov ◽  
...  
Keyword(s):  
Single Crystals ◽  
Piezoresponse Force Microscopy ◽  
Lead Magnesium Niobate ◽  
Force Microscopy ◽  
Domain Structures ◽  
Ferroelectric Domains ◽  
Nondestructive Imaging ◽  
Lead Magnesium ◽  
Patterning Technique ◽  
Electron Beam Patterning

We demonstrate the application of confocal Raman microscopy (CRM) for nondestructive imaging of ferroelectric domains both at the surface and in the bulk of lead magnesium niobate-lead titanate (PMN-PT) ferroelectric single crystals. The studied model periodical domain structure was created at a [001] cut of tetragonal-phase PMN-PT crystal by the electron beam patterning technique. It was shown that the surface CRM domain image coincides in details with the image obtained by piezoresponse force microscopy.

scholarly journals Temperature-Induced Phase Transition Characteristics of [001]-Oriented 0.93Pb(Zn1/3Nb2/3)O3-0.07PbTiO3 (PZN-7%PT) Single Crystal by Using Piezoresponse Force Microscopy

Materials ◽  
2021 ◽  
Vol 14 (4) ◽  
pp. 855
Author(s):  
Hongli Wang ◽  
Kaiyang Zeng
Keyword(s):  
Phase Transition ◽  
Single Crystals ◽  
Domain Structure ◽  
Transition Process ◽  
Piezoresponse Force Microscopy ◽  
Local Domain ◽  
Force Microscopy ◽  
Domain Structures ◽  
Phase Transition Process ◽  
Collective Process

The evolution of the domain structures of [001]-oriented relaxor ferroelectric 0.93PbZn1/3Nb2/3O3-0.07PbTiO3 (PZN-7%PT) single crystals as a function of temperature was investigated in situ by using piezoresponse force microscopy (PFM). It was found that the local domain structure of PZN-7%PT single crystals at room temperature is rhombohedral with nanoscale twins. Temperature-dependent domain structures showed that the phase transition process is a collective process and that the sample underwent a sequence of rhombohedral (R) → monoclinic (Mc) → tetragonal (T) → cubic (C) phase transformations when the temperature increased from 25 °C to 170 °C. The results provide direct observation of the phase transition evolution of PZN-7%PT single crystals as a function of temperature, which is of great significance to fully understand the relationships between the domain structure and phase structure of PZN-7%PT single crystals.

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