Piezoresponse force microscopy studies of nanoscale domain structures in ferroelectric thin film

2005 ◽  
Vol 120 (1-3) ◽  
pp. 104-108 ◽  
Author(s):  
H.R. Zeng ◽  
H.F. Yu ◽  
X.G. Tang ◽  
R.Q. Chu ◽  
G.R. Li ◽  
...  
Keyword(s):  
Thin Film ◽  
Ferroelectric Thin Film ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Domain Structures

scholarly journals Contrast Mechanism Maps for Piezoresponse Force Microscopy

2002 ◽  
Vol 17 (5) ◽  
pp. 936-939 ◽  
Author(s):  
Sergei V. Kalinin ◽  
Dawn A. Bonnell
Keyword(s):  
Piezoresponse Force Microscopy ◽  
Radius Of Curvature ◽  
Experimental Conditions ◽  
Force Microscopy ◽  
Indentation Force ◽  
Domain Structures ◽  
Contrast Mechanism ◽  
Local Modification ◽  
Tip Radius ◽  
Imaging Conditions

Piezoresponse force microscopy (PFM) is one of the most established techniques for the observation and local modification of ferroelectric domain structures on the submicron level. Both electrostatic and electromechanical interactions contribute at the tip-surface junction in a complex manner, which has resulted in multiple controversies in the interpretation of PFM. Here we analyze the influence of experimental conditions such as tip radius of curvature, indentation force, and cantilever stiffness on PFM image contrast. These results are used to construct contrast mechanism maps, which correlate the imaging conditions with the dominant contrast mechanisms. Conditions under which materials properties can be determined quantitatively are elucidated.

scholarly journals Investigations of ferroelectric polycrystalline bulks and thick films using piezoresponse force microscopy

2019 ◽  
Vol 475 (2223) ◽  
pp. 20180782 ◽  
Author(s):  
Hana Uršič ◽  
Uroš Prah
Keyword(s):  
Domain Walls ◽  
Thick Films ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Domain Structures ◽  
Atomic Force ◽  
Ferroelectric Domain Structure ◽  
Converse Piezoelectric Effect ◽  
Non Destructive

In recent years, ferroelectric/piezoelectric polycrystalline bulks and thick films have been extensively studied for different applications, such as sensors, actuators, transducers and caloric devices. In the majority of these applications, the electric field is applied to the working element in order to induce an electromechanical response, which is a complex phenomenon with several origins. Among them is the field-induced movement of domain walls, which is nowadays extensively studied using piezoresponse force microscopy (PFM), a technique derived from atomic force microscopy. PFM is based on the detection of the local converse piezoelectric effect in the sample; it is one of the most frequently applied methods for the characterization of the ferroelectric domain structure due to the simplicity of the sample preparation, its non-destructive nature and its relatively high imaging resolution. In this review, we focus on the PFM analysis of ferroelectric bulk ceramics and thick films. The core of the paper is divided into four sections: (i) introduction; (ii) the preparation of the samples prior to the PFM investigation; (iii) this is followed by reviews of the domain structures in polycrystalline bulks; and (iv) thick films.

Domain structures in tetragonal Pb(Mg1/3Nb2/3)O3–PbTiO3 single crystals studied by piezoresponse force microscopy

2005 ◽  
Vol 133 (5) ◽  
pp. 311-314 ◽  
Author(s):  
H.F. Yu ◽  
H.R. Zeng ◽  
H.X. Wang ◽  
G.R. Li ◽  
H.S. Luo ◽  
...  
Keyword(s):  
Single Crystals ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Domain Structures
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