Atomic Resolution Transmission Electron Microscopy of Surfaces

2005 ◽  
Vol 20 (7) ◽  
pp. 1619-1627 ◽  
Author(s):  
Ann N. Chiaramonti ◽  
Laurence D. Marks
Keyword(s):  
Electron Microscopy ◽  
Image Processing ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Data Extraction ◽  
Atomic Resolution ◽  
Preparation Methods ◽  
Transmission Electron ◽  
Surface Crystal ◽  
Sample Preparation Methods

A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques.

Productive Polishing TEM Sample Preparation Methodology Development

2014 ◽  
Author(s):  
Huisheng Yu ◽  
Shuqing Duan ◽  
Ming Li ◽  
Qihua Zhang ◽  
Wei-Ting Kary Chien
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Sample Preparation ◽  
Batch Process ◽  
Preparation Methods ◽  
Methodology Development ◽  
Transmission Electron ◽  
Application Fields ◽  
Single Batch ◽  
Sample Preparation Methods

Abstract In this paper, three productive polishing transmission electron microscopy (TEM) sample preparation methods are reported. The methods are studied to improve the efficiency and expand the application fields. Method 1 and 2 address expanding conventional polishing method application on same or similar pattern samples. Method 1 used a laser mark to identify one of the sample; and method 2 used a Pt coated glass inserted between samples or a direct deposition of Pt on one of the samples. Method 3 was developed facilitate stacking three or more samples into a single, batch process block and improved the efficiency greatly.

Phenomena Associated with Oxygen in Titanium

1967 ◽  
Vol 25 ◽  
pp. 310-311
Author(s):  
E. U. Lee ◽  
P. A. Garner ◽  
J. S. Owens
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Microstructural Changes ◽  
Electrolytic Polishing ◽  
Interstitial Impurities ◽  
Thin Foils ◽  
Transmission Electron ◽  
Iodide Titanium ◽  
Alpha Titanium

Evidence for ordering (1-6) of interstitial impurities (O and C) has been obtained in b.c.c. metals, such as niobium and tantalum. In this paper we report the atomic and microstructural changes in an oxygenated c.p.h. metal (alpha titanium) as observed by transmission electron microscopy and diffraction.Oxygen was introduced into zone-refined iodide titanium sheets of 0.005 in. thickness in an atmosphere of oxygen and argon at 650°C, homogenized at 800°C and furnace-cooled in argon. Subsequently, thin foils were prepared by electrolytic polishing and examined in a JEM-7 electron microscope, operated at 100 KV.

The 1-MeV Electron Microscope Installation at the University of Colorado

1973 ◽  
Vol 31 ◽  
pp. 8-9 ◽  
Author(s):  
Mircea Fotino
Keyword(s):  
Electron Microscopy ◽  
Developmental Biology ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
National Institutes Of Health ◽  
Experimental Program ◽  
University Of Colorado ◽  
Transmission Electron ◽  
The University ◽  
Research Resources

A new 1-MeV transmission electron microscope (Model JEM-1000) was installed at the Department of Molecular, Cellular and Developmental Biology of the University of Colorado in Boulder during the summer and fall of 1972 under the sponsorship of the Division of Research Resources of the National Institutes of Health. The installation was completed in October, 1972. It is installed primarily for the study of biological materials without many of the limitations hitherto unavoidable in standard transmission electron microscopy. Only the technical characteristics of the installation are briefly reviewed here. A more detailed discussion of the experimental program under way is being published elsewhere.

Characterization of submicrometer fluid Inclusions in minerals by Analytical/Transmission Electron Microscopy and electron diffraction

1990 ◽  
Vol 48 (4) ◽  
pp. 424-424
Author(s):  
George Guthrie ◽  
David Veblen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Light Microscopy ◽  
Fluid Inclusions ◽  
Energy Dispersive Spectrometer ◽  
Analytical Transmission Electron Microscopy ◽  
Transmission Electron

The nature of a geologic fluid can often be inferred from fluid-filled cavities (generally <100 μm in size) that are trapped during the growth of a mineral. A variety of techniques enables the fluids and daughter crystals (any solid precipitated from the trapped fluid) to be identified from cavities greater than a few micrometers. Many minerals, however, contain fluid inclusions smaller than a micrometer. Though inclusions this small are difficult or impossible to study by conventional techniques, they are ideally suited for study by analytical/ transmission electron microscopy (A/TEM) and electron diffraction. We have used this technique to study fluid inclusions and daughter crystals in diamond and feldspar.Inclusion-rich samples of diamond and feldspar were ion-thinned to electron transparency and examined with a Philips 420T electron microscope (120 keV) equipped with an EDAX beryllium-windowed energy dispersive spectrometer. Thin edges of the sample were perforated in areas that appeared in light microscopy to be populated densely with inclusions. In a few cases, the perforations were bound polygonal sides to which crystals (structurally and compositionally different from the host mineral) were attached (Figure 1).

Structural Investigation of Iron Particles Used for Magnetic Recording Media

1980 ◽  
Vol 38 ◽  
pp. 406-407
Author(s):  
Alfred Baltz
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Structural Investigation ◽  
Magnetic Interaction ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Recording Medium ◽  
Iron Particles ◽  
Transmission Electron

As part of a program to develop iron particles for next generation recording disk medium, their structural properties were investigated using transmission electron microscopy and electron diffraction. Iron particles are a more desirable recording medium than iron oxide, the most widely used material in disk manufacturing, because they offer a higher magnetic output and a higher coercive force. The particles were prepared by a method described elsewhere. Because of their strong magnetic interaction, a method had to be developed to separate the particles on the electron microscope grids.

Microtexture of shock reaction products of niobium and silica mixtures

1999 ◽  
Vol 14 (7) ◽  
pp. 3169-3174 ◽  
Author(s):  
Reiko Murao ◽  
Masae Kikuchi ◽  
Kiyoto Fukuoka ◽  
Eiji Aoyagi ◽  
Toshiyuki Atou ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Shock Compression ◽  
Pressure Range ◽  
Reaction Products ◽  
Small Particles ◽  
Powder Mixtures ◽  
X Ray ◽  
Transmission Electron

Shock compression experiments on powder mixtures of niobium metal and quartz were conducted for the pressure range of 30–40 GPa by a 25-mm single-stage propellant gun. Chemical reaction occurred above 35 GPa, and products were found to be mainly so-called “Cu3Au-type” Nb3Si, which contained a small amount of oxygen. Microtextures of the specimen were examined by scanning and transmission electron microscopy. A field-emission transmission electron microscope was used for energy-dispersive x-ray analysis of microtextures in small particles found in the SiO2 matrix, and various species with different Nb/Si ratio and oxygen content were shown to be produced through the nonequilibrium process of shock compression.

Atomic-resolution Studies of Ca3Co4O9 using in-situ Scanning Transmission Electron Microscopy

2008 ◽  
Vol 14 (S2) ◽  
pp. 436-437 ◽  
Author(s):  
G Yang ◽  
Y Zhao ◽  
K Sader ◽  
A Bleloch ◽  
RF Klie
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
New Mexico ◽  
Scanning Transmission Electron Microscopy ◽  
Atomic Resolution ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

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