Application of in situ Transmission Electron Microscopyfor Tribological Investigations of Magnetron Sputter Assisted Pulsed Laser Deposition of Yttria-stabilized Zirconia-gold Composite Coatings

2005 ◽  
Vol 20 (7) ◽  
pp. 1860-1868 ◽  
Author(s):  
J.J. Hu ◽  
A.A. Voevodin ◽  
J.S. Zabinski
Keyword(s):  
Electron Microscopy ◽  
High Temperature ◽  
Composite Coatings ◽  
Pulsed Laser ◽  
Yttria Stabilized Zirconia ◽  
Stabilized Zirconia ◽  
X Ray ◽  
Transmission Electron ◽  
Wide Range

Yttria-stabilized zirconia (YSZ)-Au composite coatings have great potential as solid film lubricants for aerospace applications over a wide range of environmental conditions. They were grown on steel disks or silicon wafers by pulsed laser ablation of YSZ and simultaneous magnetron sputtering of a Au target. Such a combination of ceramics with soft metals improved the toughness of the composite coating and increased its ability to lubricate at high temperature. Information on the time-dependent response of these microstructures to changes in temperature is essential to tribological investigations of high temperature performance. In situ transmission electron microscopy was used to directly measure the dynamic change of YSZ-Au coating structure at elevated temperatures. High-resolution electron microscopy and electron diffraction showed that amorphous YSZ-5 at.% Au coatings proceeded to crystallize under the irradiation of electron beams. Time varying x-ray energy dispersive spectra measured a loss of oxygen in the sample during about 10 min of irradiation with subsequent slight oxygen recovery. This behavior was related to the activation of oxygen diffusion under electron irradiation. X-ray diffraction patterns from vacuum annealed samples verified crystallization of the coatings at 500 °C. Real-time growth of Au nanograins in the sample was observed as the temperature was increased to 500 °C in a TEM specimen holder that could be heated. The grain growth process was recorded using a charge-coupled device camera installed on the transmission electron microscope. The crystallization and growth of zirconia and Au nanograins resulted in low friction during tribological tests. The nucleation of Au islands on heated ball-on-flat specimens was responsible for lowering friction.

Effect of Coupled Conditions of Thermal Cycle and Dump Environment on Conductivity of 5mol% Yttria Stabilized Zirconia

2013 ◽  
Vol 591 ◽  
pp. 245-248 ◽  
Author(s):  
Jin Feng Xia ◽  
Hong Qiang Nian ◽  
Tao Feng ◽  
Hai Fang Xu ◽  
Dan Yu Jiang
Keyword(s):  
Electron Microscopy ◽  
Mechanical Properties ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Thermal Cycle ◽  
Oxygen Sensor ◽  
Yttria Stabilized Zirconia ◽  
Cyclic Change ◽  
Stabilized Zirconia ◽  
Transmission Electron

In some applications such as automotive oxygen sensor, 5mol% Y2O3stabilized zirconia (5YSZ) is generally used because it has both excellent ionic conductivity and mechanical properties. The automotive oxygen sensor would experience a cyclic change from high temperature (engine running) environment to the low temperature damp environment (in the tail pipe when vehicle stops). The conductivity change with coupled conditions of thermal cycle and dump environment in the 5mol%Y2O3ZrO2(5YSZ) system was examined by XRD,Impedance spectroscopy and transmission electron microscopy (SEM) in this paper.

High-temperature in situ Cross-sectional Transmission Electron Microscopy Investigation of Crystallization Process of Yttrium-stabilized Zirconia/Si and Yttrium-stabilized Zirconia/SiOx/Si Thin Films

2005 ◽  
Vol 20 (7) ◽  
pp. 1878-1887 ◽  
Author(s):  
Takanori Kiguchi ◽  
Naoki Wakiya ◽  
Kazuo Shinozaki ◽  
Nobuyasu Mizutani
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
Crystallization Process ◽  
Stabilized Zirconia ◽  
Cross Sectional ◽  
Plan View ◽  
Transmission Electron ◽  
Tem Method

The crystallization process of yttria-stabilized zirconia (YSZ) gate dielectrics deposited on p-Si (001) and SiOx/p-Si(001) substrates and the growth process of SiOx has been investigated directly using high-temperature in situ cross-sectional view transmission electron microscopy (TEM) method and high-temperature plan-view in-situ TEM method. The YSZ layer is crystallized by the nucleation and growth mechanism at temperatures greater than 573 K. Nucleation originates from the film surface. Nucleation occurs randomly in the YSZ layer. Subsequently, the crystallized YSZ area strains the Si surface. Finally, it grows in the in-plane direction with the strain, whereas, if a SiOx layer of 1.4 nm exists, it absorbs the crystallization strain. Thereby, an ultrathin SiOx layer can relax the strain generated in the Si substrate in thin film crystallization process.

scholarly journals In Situ and In Operando Techniques to Study Li-Ion and Solid-State Batteries: Micro to Atomic Level

Inorganics ◽  
2021 ◽  
Vol 9 (11) ◽  
pp. 85
Author(s):  
Maryam Golozar ◽  
Raynald Gauvin ◽  
Karim Zaghib
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Atomic Level ◽  
X Ray ◽  
In Situ Techniques ◽  
Transmission Electron ◽  
Wide Range ◽  
Li Ion

This work summarizes the most commonly used in situ techniques for the study of Li-ion batteries from the micro to the atomic level. In situ analysis has attracted a great deal of interest owing to its ability to provide a wide range of information about the cycling behavior of batteries from the beginning until the end of cycling. The in situ techniques that are covered are: X-ray diffraction (XRD), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), and Scanning Transmission Electron Microscopy (STEM). An optimized setup is required to be able to use any of these in situ techniques in battery applications. Depending on the type of data required, the available setup, and the type of battery, more than one of these techniques might be needed. This study organizes these techniques from the micro to the atomic level, and shows the types of data that can be obtained using these techniques, their advantages and their challenges, and possible strategies for overcoming these challenges.

scholarly journals Characterization of Nanocrystalline Yttria-Stabilized Zirconia: An In Situ HTXRD Study

2011 ◽  
Vol 2011 ◽  
pp. 1-4 ◽  
Author(s):  
Mridula Biswas ◽  
Chandrashekhar S. Kumbhar ◽  
D. S. Gowtam
Keyword(s):  
High Temperature ◽  
Surface Area ◽  
Coefficient Of Thermal Expansion ◽  
High Specific Surface Area ◽  
Yttria Stabilized Zirconia ◽  
X Ray Diffraction ◽  
Stabilized Zirconia ◽  
X Ray ◽  
Gel Combustion

Nanocrystalline yttria-stabilized zirconia powders, synthesized by the citrate nitrate gel combustion route, with yttria concentration varying from 8 to 12 mol% were studied by in situ high temperature X-ray diffraction in the temperature range of 25–1000°C. The sample obtained has a high specific surface area of 35 m2/g while calculated surface area was around 123 m2/g. The in situ high temperature X-ray diffraction study revealed that crystallite size remains in the range of 7–9 nm up to 800°C and then rapidly grows up to 21–23 nm upto 1000°C; only holding the material at 1000°C for 30 minutes can promote grain growth in the range of 42–49 nm. Coefficient of thermal expansion ranges from 9.65 to 9.03 ppm/°C for 8–12 mol% nanocrystalline yttria-stabilized zirconia.

Transmission Electron Microscopy Investigations of an As-Processed Yttria-Stablilized zirconia on Platinum Aluminide Bond Coat

2000 ◽  
Vol 645 ◽  
Author(s):  
Judith C. Yang ◽  
Noel T. Nuhfer
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Bond Coat ◽  
Physical Vapor Deposition ◽  
Yttria Stabilized Zirconia ◽  
Stabilized Zirconia ◽  
Hollow Cone ◽  
X Ray ◽  
Platinum Aluminide ◽  
Transmission Electron

ABSTRACTWe examined an as-processed yttria-stabilized zirconia (YSZ) on platinum aluminide bond coat (BC), produced by electron beam physical vapor deposition, with transmission electron microscopy, including energy dispersive X-ray spectroscopy and hollow-cone diffraction. Columnar α-Al2O3 grains (∼100nm) formed at the interface between the BC and YSZ. A thin intermix (∼50nm) region was observed between the α-Al2O3 and YSZ. Hollow cone diffraction showed that the α-Al2O3 grains and the small-grained (∼10nm) YSZ near the α-Al2O3 are randomly oriented, without preferential texturing. No evidence of spinel formation was noted.

In situ high temperature X-ray diffraction, transmission electron microscopy and theoretical modeling for the formation of WO3 crystallites

CrystEngComm ◽  
2015 ◽  
Vol 17 (36) ◽  
pp. 6985-6998 ◽  
Author(s):  
Suman Pokhrel ◽  
Johannes Birkenstock ◽  
Arezoo Dianat ◽  
Janina Zimmermann ◽  
Marco Schowalter ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Temperature ◽  
High Temperatures ◽  
Structural Transformation ◽  
Theoretical Modeling ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron

The structural transformation of WO3 at high temperatures.

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