Dielectric and Piezoelectric Properties of Gd-modified (1-x) BiFeO3-xPbTiO3 Ceramics with a Morphotropic Phase Boundary

2013 ◽  
Vol 1507 ◽  
Author(s):  
Dalei Wang ◽  
Shundong Bu ◽  
Guoxi Jin ◽  
RuiDai ◽  
Dengren Jin ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Phase Boundary ◽  
Morphotropic Phase Boundary ◽  
Composition Range ◽  
Piezoelectric Properties ◽  
X Ray Diffraction ◽  
Wide Composition Range ◽  
X Ray ◽  
Dielectric Constant And Loss ◽  
Dielectric And Piezoelectric Properties

ABSTRACT(1-x)(Bi0.8Gd0.2)FeO3-xPbTiO3 (BGF-PT) solid solutions ceramics of x=0.55,0.50,0.4975, 0.49 and 0.45 were prepared by the mixed oxide method. Gd3+ of 20 at% was introduced into the Bi3+ site to improve the dielectric and piezoelectric properties of BFPT without causing the significant reduction of Curie temperature (Tc). X-ray diffraction analysis shows a transformation from the tetragonal (T) to rhombohedral (R) phase with the increase of BGF content. The morphotropic phase boundary was determined by measuring the dielectric and piezoelectric properties of BGF-PT within a wide composition range. BGF-PT for x=0.4975 shows the coexistence of T and R phases with the dielectric constant and loss of about 895 and 0.031 respectively at the frequency of 102 Hz.

Dielectric properties anomaly of (1−x)Pb(Ni1/3Nb2/3)O3−xPbTiO3 ceramics near the morphotropic phase boundary

2001 ◽  
Vol 16 (3) ◽  
pp. 834-836 ◽  
Author(s):  
Zhenrong Li ◽  
Liangying Zhang ◽  
Xi Yao
Keyword(s):  
Dielectric Properties ◽  
Phase Boundary ◽  
Morphotropic Phase Boundary ◽  
Composition Range ◽  
The Other ◽  
Dielectric Measurements ◽  
X Ray Diffraction ◽  
Structure Defects ◽  
X Ray ◽  
Dielectric Peak

Dielectric properties and the phase compositions of (1−x)Pb(Ni1/3Nb2/3)O3−xPbTiO3 ceramics were investigated. A morphotropic phase boundary (MPB) in the system between pseudocubic and tetragonal phase regions has been identified to lie in the composition range x = 0.34–0.38 by means of x-ray diffraction and dielectric measurements. The samples of composition lying near the MPB have good dielectric properties, but at the same time, exhibit two dielectric peaks. The possible reasons for the occurrence of dielectric bipeaks are discussed. One dielectric peak is phase transition peak, and the other peak lying in 130–150 °C temperature range is suggested to result from structure defects in the ceramics.

scholarly journals Structure, dielectric and piezoelectric properties of Pb[(Zr0.45,Ti0.5)(Mn0.5,Sb0.5)0.05]O3 ceramics

2020 ◽  
Vol 14 (1) ◽  
pp. 19-24
Author(s):  
Louanes Hamzioui ◽  
Fares Kahoul ◽  
Ahmed Boutarfaia ◽  
Abderezak Guemache ◽  
Michel Aillerie
Keyword(s):  
Dielectric Constant ◽  
Piezoelectric Properties ◽  
Coupling Factor ◽  
X Ray Diffraction ◽  
X Ray ◽  
Practical Applications ◽  
Average Grain Size ◽  
Dielectric And Piezoelectric Properties ◽  
Scanning Electron ◽  
Piezoelectric Constants

This study describes structure, dielectric and piezoelectric properties of Pb[(Zr0.45,Ti0.5)(Mn0.5,Sb0.5)0.05]O3 (PZT-PMS) ceramics prepared by conventional mixed-oxide route and sintered at up to 1180?C. The prepared ceramics was characterized by X-ray diffraction and scanning electron microscopy. The piezoelectric constants, dielectric constant, Young?s modulus and electromechanical factors were measured in broad temperature range. The results showed that the PZT-PMS ceramics is composed of tetragonal and rhombohedral phases and has the average grain size of about 1 ?m. The Pb[(Zr0.45,Ti0.5)(Mn0.5,Sb0.5)0.05]O3 ceramics has excellent dielectric and piezoelectric properties for wide practical applications. Thus, planar coupling factor of 0.70, poled dielectric constant of 8215, the Curie temperature of 345?C and dielectric loss of 6% were attained in the PZT-PMS ceramics sintered at 1180?C.

Phase Diagram of the W-doped Pb(Zn1/3Nb2/3)O3–BaTiO3– PbTiO3 System Around a Morphotropic Phase Boundary Composition

2002 ◽  
Vol 17 (5) ◽  
pp. 1085-1091 ◽  
Author(s):  
W. Z. Zhu ◽  
M. Yan ◽  
A. L. Kholkin ◽  
P. Q. Mantas ◽  
J. L. Baptista
Keyword(s):  
High Temperature ◽  
Phase Boundary ◽  
Morphotropic Phase Boundary ◽  
Room Temperature ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electrical Neutrality ◽  
Phase Boundary Composition ◽  
A Site ◽  
Successive Phase

The morphotropic phase boundary (MPB) composition that is characterized by the coexistence of rhombohedral and tetragonal phases in the Pb(Zn1/3Nb2/3)O3–BaTiO3– PbTiO3 system was modified by W-doping at the B site of a perovskite structural block. To maintain the electrical neutrality, creation of A-site vacancies was intentionally introduced in the formulation of the examined compositions. Incorporation of W ions was revealed to stabilize the tetragonal phase against the rhombohedral one, shifting the MPB toward the PZN-rich end at room temperature. High-temperature x-ray diffraction examination in combination with dielectric measurements discloses two successive phase transitions as a sample is cooled from high temperature, namely, paraelectric cubic to ferroelectric rhombohedral followed by ferroelectric rhombohedral to ferroelectric tetragonal. W addition appears to suppress the first transition while promoting the second one.

Heteroepitaxial Growth of Ba0.5Sr0.5TiO3/SrRuO3 on YSZ/Si by Off-Axis Sputtering

1994 ◽  
Vol 361 ◽  
Author(s):  
S.Y. Hou ◽  
J. Kwo ◽  
R.K. Watts ◽  
J.-Y. Cheng ◽  
R.J. Cava ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Degree Of Crystallinity ◽  
Heteroepitaxial Growth ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Dielectric Constant And Loss ◽  
Bst Films ◽  
High Degree ◽  
Room Temperature Dielectric Constant

ABSTRACTWe demonstrate an epitaxial heterostructure of Ba0.5Sr0.5 TiO3/SrRuO3/YSZ on Si for potential charge storage applications. The dielectric Ba0.5Sr0.5TiO3 (BST) and conductive oxide SrRuO3 are both grown (110) oriented on YSZ (100) buffered Si by 90° off-axis sputtering. These films showed a high degree of crystallinity with minimal interdiffusion at the interfaces as examined by X-ray diffraction, Rutherford backscattering spectroscopy, and cross-section transmission electron microscopy. The in-plane epitaxial alignment of the films is BST/SRO 〈111〉 // YSZ 〈110〉 with a four-fold degeneracy. The dielectric constant and loss tangent of the epi-BST films are 360 and 0.01 at 10 kHz. The leakage current density is < 4×10∼−7 A/cm2 at 1 V. The room temperature dielectric constant (ε) of the BST films shows a roll-off in the 1–10 MHz range. This is attributed to the existence of a series resistance in the measurement circuit, which likely arises from the SrRuO3 electrode.

Microstructure and electrical properties of 0.5PZN-0.5PZT relaxor ferroelectrics close to the morphotropic phase boundary

2009 ◽  
Vol 24 (6) ◽  
pp. 2029-2034 ◽  
Author(s):  
Lu-Yang Zhao ◽  
Yu-Dong Hou ◽  
Li-Min Chang ◽  
Man-Kang Zhu ◽  
Hui Yan
Keyword(s):  
Phase Boundary ◽  
Morphotropic Phase Boundary ◽  
Oxygen Vacancies ◽  
Rhombohedral Phase ◽  
Relaxor Ferroelectrics ◽  
Arrhenius Law ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Mixing Method

Relaxor ferroelectrics of Pb(Zn1/3Nb2/3)0.5(Zr0.47Ti0.53)0.5O3 (0.5PZN-0.5PZT) were prepared using the conventional oxide mixing method. Both x-ray diffraction analysis and Raman spectroscopy indicate that the amounts of rhombohedral phase are close to tetragonal phase, implying the presence of the morphotropic phase boundary (MPB) in the system of 0.5PZN-0.5PZT, and this result was further confirmed by transmission electron microscopy (TEM) micrographs. At MPB composition, the excellent piezoelectric properties, such as kp (0.66) and d33 (425pC/N), were obtained due to the more possible polarization directions of domains and high dc resistivity of 6.5 × 1010 Ω·cm. Meanwhile, the dielectric studies revealed that the indicator of the degree of diffuseness γ value is 1.73, implying that the relaxor nature of the 0.5PZN-0.5PZT is ceramic. The activation energy related to the dc conductivity was estimated from a linear fitting of the Arrhenius law. The value of 0.09 and 1.04 eV for low and high temperature range corresponds well to the activation energies of migration and first ionization of the oxygen vacancies.

Preparation and Characterization of Ce-Doped Ba0.2Sr0.8TiO3 Ferroelectric Ceramics

2010 ◽  
Vol 97-101 ◽  
pp. 1091-1096
Author(s):  
Dong Fang Han ◽  
Qun Tang ◽  
Qing Meng Zhang ◽  
Lei Wang ◽  
Ju Du
Keyword(s):  
Dielectric Constant ◽  
Xrd Analysis ◽  
Ferroelectric Ceramics ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structure And Property ◽  
Dielectric Constant And Loss ◽  
Ce Content ◽  
Doping Ratio

The structure and property of Ce-doped Ba0.2Sr0.8TiO3 (BST) were investigated as a function of Ce content. The density experiment results confirmed that increasing the Ce doping ratio caused the decrease in shrinkage factor of BST in the sintering procedure. Additionally, both Scanning Electron Microscope (SEM) and X-ray diffraction (XRD) analysis showed that the grain size of Ce-doped BST was dependent on the Ce content. Further more, the dielectric constant and dielectric loss had a curve relationship with increasing Ce content. The improvement of the electrical properties of Ce doping BST may be related to the decrease in the concentration of oxygen vacancies. According to the research, the diameter of grain, the dielectric constant and loss factor of the 1mol% Ce-doped Ba0.2Sr0.8TiO3 were 500nm, 365.8 and 0.0063, respectively.

Microstructure and Electrical Properties of Lead-Free (Na0.5K0.5)NbO3 - Bi0.5(Na0.97K0.03)0.5TiO3 Ceramics

2013 ◽  
Vol 368-370 ◽  
pp. 760-763
Author(s):  
Chun Huy Wang ◽  
Ming Qiu Wei
Keyword(s):  
Electrical Properties ◽  
Coupling Coefficient ◽  
Electromechanical Coupling ◽  
Piezoelectric Properties ◽  
Coupling Coefficients ◽  
X Ray Diffraction ◽  
X Ray ◽  
Dense Microstructure ◽  
Dielectric And Piezoelectric Properties ◽  
Thickness Mode

(Na0.5K0.5)NbO3 with Bi0.5(Na0.97K0.03)0.5TiO3 with x≤0.05 has been prepared by the conventional mixed oxide process. X-ray diffraction analysis revealed that, during sintering, all the Bi(Na0.97K0.03)TiO3 diffuses into the lattice of (Na0.5K0.5)NbO3 to form a solid solution with a perovskite structure. A morphotropic phase boundary (MPB) between orthorhombic (O) and rhombohedral (R) was found at the composition 0.98(Na0.5K0.5)NbO3-0.02Bi0.5(Na0.97K0.03)0.5TiO3 [abbreviated as 0.98NKN-0.02BNKT] with correspondingly enhanced dielectric and piezoelectric properties. For 0.98NKN-0.02BNKT ceramics, the electromechanical coupling coefficients of the planar mode kp and the thickness mode kt reach 0.33 and 0.49, respectively, after sintering at 1100 oC for 3 h. The ratio of the thickness coupling coefficient to the planar coupling coefficient is 1.48. With suitable Bi0.5(Na0.97K0.03)0.5TiO3 concentration, a dense microstructure and good electrical properties are obtained.

Microstructure and Characteristics of PbTiO3-PbZrO3-Pb(Mg1/3Nb2/3)O3- Pb(Zn1/3Nb2/3)O3 Ceramics

2007 ◽  
Vol 280-283 ◽  
pp. 175-180
Author(s):  
Chun Huy Wang
Keyword(s):  
Dielectric Constant ◽  
Piezoelectric Ceramic ◽  
Composition Range ◽  
Piezoelectric Properties ◽  
Coupling Factor ◽  
Mechanical Quality Factor ◽  
Optimal Choice ◽  
Mechanical Quality ◽  
Piezoelectric Measurement ◽  
Dielectric And Piezoelectric Properties

The new piezoelectric ceramic of PbTiO3-PbZrO3-Pb(Mg1/3Nb2/3)O3 -Pb(Zn1/3Nb2/3)O3 with composition close to the morphotropic phase boundary was studied. The dielectric and piezoelectric properties of Pb0.96Sr0.04[(Zr1-yTiy)0.74(Mg1/3Nb2/3)0.20(Zn1/3Nb2/3)0.06]O3 were investigated, the composition range examined are 0.47 £ y £ 0.57. From the results of XRD and piezoelectric measurement, it is supposed that the composition with y = 0.51 corresponds to M.P.B. between tetragonal and pseudocubic perovskite. Some developed phenomena or models are introduced and take it to interpret well. After optimal choice of these conditions, the planar coupling factor close to 0.65, mechanical quality factor Qm close to 75, the longitude wave velocity close to 4100 m/s and the poled dielectric constant close to 2600 can be approached in this study.

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