scholarly journals Structure, dielectric and piezoelectric properties of Pb[(Zr0.45,Ti0.5)(Mn0.5,Sb0.5)0.05]O3 ceramics

2020 ◽  
Vol 14 (1) ◽  
pp. 19-24
Author(s):  
Louanes Hamzioui ◽  
Fares Kahoul ◽  
Ahmed Boutarfaia ◽  
Abderezak Guemache ◽  
Michel Aillerie
Keyword(s):  
Dielectric Constant ◽  
Piezoelectric Properties ◽  
Coupling Factor ◽  
X Ray Diffraction ◽  
X Ray ◽  
Practical Applications ◽  
Average Grain Size ◽  
Dielectric And Piezoelectric Properties ◽  
Scanning Electron ◽  
Piezoelectric Constants

This study describes structure, dielectric and piezoelectric properties of Pb[(Zr0.45,Ti0.5)(Mn0.5,Sb0.5)0.05]O3 (PZT-PMS) ceramics prepared by conventional mixed-oxide route and sintered at up to 1180?C. The prepared ceramics was characterized by X-ray diffraction and scanning electron microscopy. The piezoelectric constants, dielectric constant, Young?s modulus and electromechanical factors were measured in broad temperature range. The results showed that the PZT-PMS ceramics is composed of tetragonal and rhombohedral phases and has the average grain size of about 1 ?m. The Pb[(Zr0.45,Ti0.5)(Mn0.5,Sb0.5)0.05]O3 ceramics has excellent dielectric and piezoelectric properties for wide practical applications. Thus, planar coupling factor of 0.70, poled dielectric constant of 8215, the Curie temperature of 345?C and dielectric loss of 6% were attained in the PZT-PMS ceramics sintered at 1180?C.

Dielectric and Piezoelectric Properties of Gd-modified (1-x) BiFeO3-xPbTiO3 Ceramics with a Morphotropic Phase Boundary

2013 ◽  
Vol 1507 ◽  
Author(s):  
Dalei Wang ◽  
Shundong Bu ◽  
Guoxi Jin ◽  
RuiDai ◽  
Dengren Jin ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Phase Boundary ◽  
Morphotropic Phase Boundary ◽  
Composition Range ◽  
Piezoelectric Properties ◽  
X Ray Diffraction ◽  
Wide Composition Range ◽  
X Ray ◽  
Dielectric Constant And Loss ◽  
Dielectric And Piezoelectric Properties

ABSTRACT(1-x)(Bi0.8Gd0.2)FeO3-xPbTiO3 (BGF-PT) solid solutions ceramics of x=0.55,0.50,0.4975, 0.49 and 0.45 were prepared by the mixed oxide method. Gd3+ of 20 at% was introduced into the Bi3+ site to improve the dielectric and piezoelectric properties of BFPT without causing the significant reduction of Curie temperature (Tc). X-ray diffraction analysis shows a transformation from the tetragonal (T) to rhombohedral (R) phase with the increase of BGF content. The morphotropic phase boundary was determined by measuring the dielectric and piezoelectric properties of BGF-PT within a wide composition range. BGF-PT for x=0.4975 shows the coexistence of T and R phases with the dielectric constant and loss of about 895 and 0.031 respectively at the frequency of 102 Hz.

Effect of La2O3 on the Microstructure and Electrical Properties of 0.82Bi0.5Na0.5TiO3-0.18Bi0.5K0.5TiO3 Ceramics

2011 ◽  
Vol 284-286 ◽  
pp. 1408-1411
Author(s):  
Yan Li ◽  
Yan Jie Zhang ◽  
Rui Qing Chu ◽  
Zhi Jun Xu ◽  
Qian Chen ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Room Temperature ◽  
Piezoelectric Properties ◽  
Coupling Factor ◽  
X Ray Diffraction ◽  
Sem Images ◽  
Pure Perovskite Structure ◽  
X Ray ◽  
Xrd Patterns ◽  
Dielectric And Piezoelectric Properties

La2O3-doped lead-free 0.82Bi0.5Na0.5TiO3-0.18Bi0.5K0.5TiO3(abbreviated to 0.82BNT-0.18BKT) piezoelectric ceramics were synthesized by the conventional mixed-oxide method, and the effect of La2O3addition on the dielectric and piezoelectric properties was investigated. X-ray diffraction (XRD) patterns show that La2O3diffuses into the lattice of the 0.82BNT-0.18BKT ceramics to form a solid solution with a pure perovskite structure. SEM images indicate that the grain size of the 0.82BNT-0.18BKT ceramics increased with the addition of La2O3doping. The electrical properties of 0.82BNT-0.18BKT ceramics have been greatly improved by certain amount of La2O3substitutions. At room temperature, the 0.82BNT-0.18BKT ceramics doped with 0.25 wt. % La2O3exhibited the optimum properties with high piezoelectric constant (d33= 142 pC/N) and high planar coupling factor (kp= 0.23).

MICROSTRUCTURES AND PIEZOELECTRIC PROPERTIES OF KNNLST DOPING BCZT LEAD-FREE CERAMICS

2012 ◽  
Vol 05 (04) ◽  
pp. 1250041 ◽  
Author(s):  
WEI XU ◽  
YANG LI ◽  
JIAN-MIN FENG ◽  
YE-JING DAI
Keyword(s):  
Piezoelectric Properties ◽  
Perovskite Phase ◽  
Lead Free ◽  
X Ray Diffraction ◽  
X Ray ◽  
Practical Applications ◽  
Lead Free Ceramics ◽  
Pure Perovskite Phase ◽  
Average Grain Size ◽  
Piezoelectric Behavior

In this study, lead-free piezoelectric ceramics ( Na0.52K0.44Li0.04 )( Nb0.88Sb0.08Ta0.04 ) O3 -doped 0.52 Ba ( Zr 0.2 Ti 0.8) O 3-0.48( Ba 0.7 Ca 0.3) TiO 3( BCZT -x KNNLST ) are investigated. The effects of the KNNLST addition on the microstructures and the electrical properties of the ceramics sintered at the temperature as low as 1350°C are studied. The X-ray diffraction data show that the addition of KNNLST could diffuse into BCZT lattice and a pure perovskite phase is formed. With the increase of KNNLST addition, the average grain size is first increased and afterwards decreased. The ceramics with x = 0.005 exhibit a good piezoelectric behavior of d 33 ~ 464 pC/N and k p ~ 0.44 after three month's aging, which indicates the BCZT -x KNNLST ceramics could be promising for lead-free practical applications.

Phase Development and Dielectric Properties of 0.98BaTiO3-0.02Ba (Mg1/3Nb2/3) O3 Ceramic

2011 ◽  
Vol 700 ◽  
pp. 58-62
Author(s):  
Rachanusorn Roongtao ◽  
Supagorn Rugmai ◽  
Wanwilai C. Vittayakorn
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Dielectric Constant ◽  
Dielectric Properties ◽  
Loss Factor ◽  
X Ray Diffraction ◽  
Phase Purity ◽  
X Ray ◽  
Phase Development ◽  
Scanning Electron

The 0.98BaTiO3-0.02Ba (Mg1/3Nb2/3) O3ceramics has been synthesized through a conventional mixed-oxide by using BT nanopowder and BMN micropowder. The phase purity of the powders and the ceramics was examined using X-ray diffraction (XRD). The 0.98BT-0.02BMN powders were sintered to 92% of the theoretical density at a temperature of 1300 °C for 2 h. The microstructure of the sintered surface was investigated using scanning electron microscopy (SEM). The dielectric constant (εr) and loss factor (tanδ) of the sintered pellets at Curie temperture were 3000 and 0.015, respectively.

scholarly journals Hydrothermal synthesis and characteristics of lanthanumdoped pb(Zr₀.₆₅Ti ₀.₃₅)O₃ ceramics

2021 ◽  
Vol 8 (3) ◽  
pp. 14-19
Author(s):  
Thuy Nguyen Thanh ◽  
Tung Nguyen Van ◽  
Hung Nguyen Trong ◽  
Minh Cao Duy
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Dielectric Constant ◽  
Reaction Temperature ◽  
Lead Zirconate Titanate ◽  
Lead Zirconate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Influence Of Ph ◽  
Scanning Electron

Lanthanum-doped lead zirconate titanate (PLZT) powders were synthesized using thehydrothermal method. The influence of pH, reaction temperature and time, lanthanum concentration on the formation and characteristics of PLZT were investigated. Obtained powders were investigated using X-ray diffraction analysis (XRD), scanning electron microscopy (SEM) techniques and a dielectric analyzer. The results showed that           Pb1-xLax(Zr0.65Ti0.35)O3 with x= 0.0 – 0.1 were well formed under conditions: pH≥13, reaction time of 12hrs, reaction temperature of 180oC. Dielectric constant of PLZT is higher than PZT. The grain size of the PLZT is found to be 1–3.5 µm.

Preparation and Properties of CCTO-BCTO Ceramics with Ultrahigh Dielectric Constant

2013 ◽  
Vol 760-762 ◽  
pp. 705-708
Author(s):  
La Chen ◽  
Wei Li ◽  
Zhao Xian Xiong ◽  
Chun Xiao Song ◽  
Hong Qiu
Keyword(s):  
Electron Microscopy ◽  
Dielectric Constant ◽  
Dielectric Properties ◽  
X Ray Diffraction ◽  
Optimum Amount ◽  
Conventional Solid State Reaction ◽  
X Ray ◽  
Impedance Characteristics ◽  
Lcr Meter ◽  
Scanning Electron

Ceramics of (1-x)CaCu3Ti4O12-xBi2/3Cu3Ti4O12, i.e., CCTO-BCTO, with x=0, 0.01, 0.1 and 0.25, respectively, were prepared via the conventional solid-state reaction. The phase structure of the ceramics was identified by X-ray diffraction. The microstructure of the sample was observed with scanning electron microscopy. Dielectric properties and impedance spectroscopy were measured using a LCR Meter, in which 0.9CCTO-0.1BCTO displayed highest dielectric constant (584108) and lowest dielectric loss (0.42) at 1kHz among the four kinds of specimens. Based on series of experimental results, an optimum amount of x was able to improve the dielectric properties of CCTO-BCTO, through adjusting the impedance characteristics of the grain and grain boundary.

Microstructure and Electrical Properties of Lead-Free (Na0.5K0.5)NbO3 - Bi0.5(Na0.97K0.03)0.5TiO3 Ceramics

2013 ◽  
Vol 368-370 ◽  
pp. 760-763
Author(s):  
Chun Huy Wang ◽  
Ming Qiu Wei
Keyword(s):  
Electrical Properties ◽  
Coupling Coefficient ◽  
Electromechanical Coupling ◽  
Piezoelectric Properties ◽  
Coupling Coefficients ◽  
X Ray Diffraction ◽  
X Ray ◽  
Dense Microstructure ◽  
Dielectric And Piezoelectric Properties ◽  
Thickness Mode

(Na0.5K0.5)NbO3 with Bi0.5(Na0.97K0.03)0.5TiO3 with x≤0.05 has been prepared by the conventional mixed oxide process. X-ray diffraction analysis revealed that, during sintering, all the Bi(Na0.97K0.03)TiO3 diffuses into the lattice of (Na0.5K0.5)NbO3 to form a solid solution with a perovskite structure. A morphotropic phase boundary (MPB) between orthorhombic (O) and rhombohedral (R) was found at the composition 0.98(Na0.5K0.5)NbO3-0.02Bi0.5(Na0.97K0.03)0.5TiO3 [abbreviated as 0.98NKN-0.02BNKT] with correspondingly enhanced dielectric and piezoelectric properties. For 0.98NKN-0.02BNKT ceramics, the electromechanical coupling coefficients of the planar mode kp and the thickness mode kt reach 0.33 and 0.49, respectively, after sintering at 1100 oC for 3 h. The ratio of the thickness coupling coefficient to the planar coupling coefficient is 1.48. With suitable Bi0.5(Na0.97K0.03)0.5TiO3 concentration, a dense microstructure and good electrical properties are obtained.

Microstructure and Characteristics of PbTiO3-PbZrO3-Pb(Mg1/3Nb2/3)O3- Pb(Zn1/3Nb2/3)O3 Ceramics

2007 ◽  
Vol 280-283 ◽  
pp. 175-180
Author(s):  
Chun Huy Wang
Keyword(s):  
Dielectric Constant ◽  
Piezoelectric Ceramic ◽  
Composition Range ◽  
Piezoelectric Properties ◽  
Coupling Factor ◽  
Mechanical Quality Factor ◽  
Optimal Choice ◽  
Mechanical Quality ◽  
Piezoelectric Measurement ◽  
Dielectric And Piezoelectric Properties

The new piezoelectric ceramic of PbTiO3-PbZrO3-Pb(Mg1/3Nb2/3)O3 -Pb(Zn1/3Nb2/3)O3 with composition close to the morphotropic phase boundary was studied. The dielectric and piezoelectric properties of Pb0.96Sr0.04[(Zr1-yTiy)0.74(Mg1/3Nb2/3)0.20(Zn1/3Nb2/3)0.06]O3 were investigated, the composition range examined are 0.47 £ y £ 0.57. From the results of XRD and piezoelectric measurement, it is supposed that the composition with y = 0.51 corresponds to M.P.B. between tetragonal and pseudocubic perovskite. Some developed phenomena or models are introduced and take it to interpret well. After optimal choice of these conditions, the planar coupling factor close to 0.65, mechanical quality factor Qm close to 75, the longitude wave velocity close to 4100 m/s and the poled dielectric constant close to 2600 can be approached in this study.

Influence of Annealing Time on Microstructure of Ni-W Alloys

2013 ◽  
Vol 747-748 ◽  
pp. 613-618
Author(s):  
Qiao Zhang ◽  
Shu Hua Liang ◽  
Chen Zhang ◽  
Jun Tao Zou
Keyword(s):  
Electron Microscopy ◽  
Solid Solution ◽  
Grain Size ◽  
Grain Boundaries ◽  
Annealing Time ◽  
Single Phase ◽  
X Ray Diffraction ◽  
X Ray ◽  
Average Grain Size ◽  
Scanning Electron

The as-cast Ni-W alloys with 15wt%W, 25wt%W and 30wt%W were annealed in hydrogen at 1100. The effect of the annealing time on the microstructure of Ni-W alloys was studied, and the phase constituents and microstructure of annealed Ni-W alloys were characterized by the X-ray diffraction (XRD) and scanning electron microscopy (SEM). The results showed that no any phase changed for Ni-15%W, Ni-25%W and Ni-30%W alloys annealed for 60 min, 90 min and 150 min, which were still consisted of single-phase Ni (W) solid solution. However, microstructure had a significant change after annealing. With increase of annealing time, the microstructure of Ni-15%W alloy became more uniform after annealing for 90 min, and the average grain size was 95μm, whereas the grain size of Ni-15%W alloy increased significantly after annealing for 150 min. For Ni-25%W and Ni-30%W, there was no obvious change on the grain size with increase of annealing time, and the amount of oxides at grain boundaries gradually reduced. After annealing for 150 min, the impurities at grain boundaries almost disappeared. Subsequently, the annealing at 1100 for 150 min was beneficial for the desired microstructure of Ni-25%W and Ni-30%W alloys.

scholarly journals Domain and lattice contributions to dielectric and piezoelectric properties of Pb(Zrx, Ti1−x)O3 thin films as a function of composition

1999 ◽  
Vol 14 (11) ◽  
pp. 4307-4318 ◽  
Author(s):  
S. Hiboux ◽  
P. Muralt ◽  
T. Maeder
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Domain Wall ◽  
Diffraction Analysis ◽  
Piezoelectric Properties ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputter Deposited ◽  
Dielectric And Piezoelectric Properties

In situ reactively sputter deposited, 300-nm-thick Pb(Zrx, Ti1−x)O3 thin films were investigated as a function of composition, texture, and different electrodes (Pt,RuO2).X-ray diffraction analysis, ferroelectric, dielectric, and piezoelectric measurements were carried out. While for dielectric properties bulklike contributions from lattice as well as from domains are observed, domain wall contributions to piezoelectric properties are very much reduced in the morphotropic phase boundary (MPB) region. Permittivity and d33 do not peak at the same composition; the MPB region is broadened up and generally shifted to the tetragonal side.

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