Nb-doped TiO2 films for transparent conductive electrodes with low resistivity deposited by dc magnetron sputtering using a TiO2-x–Nb2O5-x target

2008 ◽  
Vol 1109 ◽  
Author(s):  
Yasushi Sato ◽  
Yuta Sanno ◽  
Nobuto Oka ◽  
Toshihisa Kamiyama ◽  
Yuzo Shigesato

AbstractNb-doped anatase TiO2 films were deposited on unheated glass by dc magnetron sputtering using a slightly reduced TiO2-x–Nb2O5-x target with oxygen flow ratios [O2/(Ar+O2)] in the range from 0.00 to 0.20%. After post-annealing in a vacuum (6 × 10−4 Pa) at 500 and 600 °C for 1 h, the films were crystallized into the polycrystalline anatase TiO2 structure. The resistivity of the both films decreased to 6.3-6.8 × 10−4 Ω·cm with increasing [O2/(Ar+O2)] to 0.10%, where the carrier density and Hall mobility were 1.9-2.0 × 1021 cm−3 and 4.9-5.0 cm2·V−1·s−1, respectively. The films exhibited high transparency of over 60-70% in the visible region of light.

2005 ◽  
Vol 475-479 ◽  
pp. 1223-1226 ◽  
Author(s):  
Ming Zhao ◽  
Da Ming Zhuang ◽  
Gong Zhang ◽  
Ling Fang ◽  
Min Sheng Wu

The nitrogen-doped TiO2 thin films were prepared by mid-frequency alternative reactive magnetron sputtering technique. The N concentration of the nitrogen-doped TiO2 thin films was analyzed by XPS. And the absorption spectra of the films in ultraviolet and visible region were also investigated. The results show that the mid-frequency alternative reactive magnetron sputtering technique is a convenient method for growing TiO2-xNx. Annealing the nitrogen-doped TiO2 thin film in nitrogen atmosphere under 380°C is helpful for increase the concentration of nitrogen in the film, but the ratio of N2 in reactive gas is mainly influence the concentration of nitrogen in the Ti-N bond in the TiO2 film. The increase of the thickness of nitrogen-doped TiO2 films will enhance the absorbability of the film in the ultraviolet and visible region. The wavelength of the absorption edge of TiO2-xNx film with 1.5% nitrogen shift to 441nm from 387nm, which is the absorption edge for undoped TiO2 films.


2018 ◽  
Vol 455 ◽  
pp. 267-275 ◽  
Author(s):  
Davide Casotti ◽  
Valentina Orsini ◽  
Alessandro di Bona ◽  
Sandra Gardonio ◽  
Mattia Fanetti ◽  
...  

1990 ◽  
Vol 04 (13) ◽  
pp. 847-853
Author(s):  
Y.H. WANG ◽  
Y.Z. ZHANG ◽  
Y.Y. ZHAO ◽  
X.G. QIU ◽  
P. XU ◽  
...  

Superconducting Bi–Pb–Sr–Ca–Cu–O thin films of zero resistivity temperature 108 K and critical current density of 1000 A/cm2 (at 77 K) were deposited on MgO(100) single-crystal substrates by DC magnetron sputtering. After depositing at 350–400°C and post annealing at 837.5°C for 1–5 hours in air, with different cooling rate we got highly c-axis oriented thin films which show zero resistivity at 103 K, 108 K. The results we got show an interesting phenomenon: the mixture of high and low Tc phase exhibit a low onset, sharp transition and high current density.


Vacuum ◽  
2007 ◽  
Vol 82 (3) ◽  
pp. 328-335 ◽  
Author(s):  
Wenjie Zhang ◽  
Shenglong Zhu ◽  
Ying Li ◽  
Fuhui Wang

2016 ◽  
Vol 852 ◽  
pp. 1066-1069 ◽  
Author(s):  
Hong Tao Zhao ◽  
Yi Qiao Shi ◽  
Min Tian

The Ga doped ZnO film (GZO) was fabricated via magnetron sputtering on the substrate of silica glass. The effect of substrate temperature on the photoelectric properties of GZO film, such as morphology, grain size, crystal structure and transparency was studied. The results showed us that the crystallinity of GZO film was improved by increasing the substrate temperature . The GZO film exhibited high transmittance (above 80% in the visible region) at the substrate temperature higher than 200°C. The lowest resistivity of 4.45×10-4Ω·cm and highest hall mobility of 11.7 cm2 v-1s-1 were obtained when the substrate temperature was 300°C.


Vacuum ◽  
2002 ◽  
Vol 68 (1) ◽  
pp. 31-38 ◽  
Author(s):  
Henryk Tomaszewski ◽  
Hilde Poelman ◽  
Diederik Depla ◽  
Dirk Poelman ◽  
Roger De Gryse ◽  
...  

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