High Critical Current Density in Ultrathin Ybco Films

1989 ◽  
Vol 169 ◽  
Author(s):  
X.X. Xi ◽  
W. Schauer ◽  
V. Windte ◽  
O. Meyer ◽  
G. Linker ◽  
...  
Keyword(s):  
Critical Current Density ◽  
Thick Film ◽  
Critical Current ◽  
Field Dependence ◽  
Current Density ◽  
Weak Field ◽  
Zero Field ◽  
High Critical Current Density ◽  
Ybco Films ◽  
Critical Current Density Jc

AbstractMeasurements of the critical current density Jc for ultrathin YBa2Cu307‐X (YBCO) films are presented.A high Jc value at 77K in zero field of 2xl06A/cm2 was obtained in a 30nm thick film and even a 5nm thick film could carry a supercurrent of 3.5x105 A/cm2 at 4.2K in zero field. A very weak field‐dependence of Jc was observed when the field was in the (a,b) plane showing greatly depressed dissipation.

Evidence for Extensive Grain Boundary Meander and Overgrowth of Substrate Grain Boundaries in High Critical Current Density ex Situ YBa2Cu3O7−x Coated Conductors

2005 ◽  
Vol 20 (8) ◽  
pp. 2012-2020 ◽  
Author(s):  
D.M. Feldmann ◽  
D.C. Larbalestier ◽  
T. Holesinger ◽  
R. Feenstra ◽  
A.A. Gapud ◽  
...  
Keyword(s):  
Grain Boundary ◽  
Critical Current Density ◽  
Film Thickness ◽  
Critical Current ◽  
Current Density ◽  
Thick Films ◽  
Coated Conductors ◽  
Ex Situ ◽  
High Critical Current Density ◽  
Ybco Films

It has been generally accepted that YBa2Cu3O7−x (YBCO) films deposited on deformation textured polycrystalline metal tapes result in YBCO grain boundary (GB) networks that essentially replicate the GBs of the underlying substrate. Here we report that for thicker YBCO films produced by a BaF2 ex situ process, this is not true. Using electron backscatter diffraction combined with ion milling, we have been able to map the evolution of the YBCO grain structure and compare it to the underlying template in several coated conductors. For thin (≤0.5 μm) YBCO films deposited on rolling-assisted biaxially textured substrates (RABiTS), the YBCO GBs nearly directly overlap the substrate GBs. For 0.7–1.4 μm YBCO films, the GBs were found to meander along the substrate GBs and along the sample normal, with displacements several times the film thickness. In very thick films (2.5–2.9 μm), the YBCO grains can completely overgrow substrate grains and GBs, resulting in a substantial disconnection of the YBCO and substrate GB networks. Similar behavior is found for BaF2 ex situ YBCO films on ion-beam-assisted deposition-type templates. The ability of the YBCO to overgrow substrate grains and GBs is believed to be due to liquid-phase mediated laminar grain growth. Although the behavior of the YBCO GB networks changes with YBCO film thickness, the samples maintained high critical current density (Jc) values of >2 MA/cm2 for films up to 1.4 μm thick, and up to0.9 MA/cm2 for 2.5–2.9-μm-thick films.

scholarly journals Critical Current and Pinning Features of a CaKFe4As4 Polycrystalline Sample

Materials ◽  
2021 ◽  
Vol 14 (21) ◽  
pp. 6611
Author(s):  
Armando Galluzzi ◽  
Antonio Leo ◽  
Andrea Masi ◽  
Francesca Varsano ◽  
Angela Nigro ◽  
...  
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Hysteresis Loops ◽  
Magnetic Behavior ◽  
Polycrystalline Sample ◽  
Critical Parameters ◽  
Zero Field ◽  
Critical Current Density Jc ◽  
Field Cooling

We analyze the magnetic behavior of a CaKFe4As4 polycrystalline sample fabricated by a mechanochemically assisted synthesis route. By means of DC magnetization (M) measurements as a function of the temperature (T) and DC magnetic field (H) we study its critical parameters and pinning features. The critical temperature Tc has been evaluated by M(T) curves performed in Zero Field Cooling-Field Cooling conditions. These curves show the presence of a little magnetic background for temperatures above Tc, as also confirmed by the hysteresis loops M(H). Starting from the M(H) curves, the critical current density Jc of the sample has been calculated as a function of the field at different temperatures in the framework of the Bean critical state model. The Jc(H) values are in line with the ones reported in the literature for this typology of samples. By analyzing the temperature dependence of the critical current density Jc(T) at different magnetic fields, it has been found that the sample is characterized by a strong type pinning regime. This sample peculiarity can open perspectives for future improvement in the fabrication of this material.

scholarly journals О возможности изготовления мостиков YBCO с совершенной поверхностью, критической температурой более 88 K и плотностью критического тока до 5·10-=SUP=-6-=/SUP=- A/cm-=SUP=-2-=/SUP=-

2020 ◽  
Vol 62 (9) ◽  
pp. 1398
Author(s):  
Д.В. Мастеров ◽  
С.А. Павлов ◽  
А.Е. Парафин ◽  
Е.В. Скороходов
Keyword(s):  
Critical Temperature ◽  
Surface Morphology ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Growth Process ◽  
Ybco Films ◽  
Basic Parameters ◽  
Critical Current Density Jc ◽  
Electrophysical Parameters

In the fabrication of YBCO structures by traditional methods, as a rule, some compromise is reached, namely, films with acceptable morphology are used, but with reduced electrophysical parameters. In this paper, it is shown that YBCO bridges up to 4 microns wide with perfect surface morphology, i.e. free from defects, with a critical current density Jc ≥ 3106 A/cm2 at a temperature T = 77 K and a critical temperature Tс ≥ 88 K. can be obtained using the preliminary topology mask method. Moreover, the perfect morphology of the bridge surface, the values of the critical current density and the critical temperature are preserved even after repeated (additional) deposition of the YBCO layer on the structure with the preliminary topology mask. Based on the results obtained in a series of fifteen samples, it is concluded that, in contrast to the electrophysical characteristics, it is not enough to fix the standard (basic) parameters of the growth process for the stable implementation of the perfect surface morphology of YBCO films.

High critical current density YBCO films and fabrication of dc-SQUIDs

2002 ◽  
Vol 15 (12) ◽  
pp. 1693-1697 ◽  
Author(s):  
Shinya Kuriki ◽  
Ken-ichi Takahashi ◽  
Yohei Kawaguchi ◽  
Mizushi Matsuda ◽  
Toshiya Otowa
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
High Critical Current Density ◽  
Ybco Films

Characterization of Epitaxial Superconducting YBacuO Thin Films with Three Different Orientations

1989 ◽  
Vol 169 ◽  
Author(s):  
X.K. Wang ◽  
D.X. Li ◽  
S.N. Song ◽  
J.Q. Zheng ◽  
R.P.H. Chang ◽  
...  
Keyword(s):  
Thin Films ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Orientation Dependence ◽  
Zero Field ◽  
Epitaxial Thin Films ◽  
Oriented Film ◽  
Zero Resistance ◽  
Xrd Patterns

AbstractEpitaxial thin films of YBaCuO were prepared by multilayer deposition from Y, Cu, and BaF2 sources with: (1) the a‐axis perpendicular to (100)SrTiO3; (2) the c‐axis perpendicular to (100)SrTiO3; and (3) the [110] axis perpendicular to (110)SrTiO3. XRD patterns as well as SEM and HREM images confirm that the films are highly oriented, essentially epitaxial. Both the a‐axis oriented and the c‐axis oriented films exhibit zero resistance at 91K. The [110] oriented film shows the sharpest transiton with a transition width of IK and zero resistance at 85K. The zero field critical current density, Jc, determined magnetically, is in excess of 107A/cm2 at 4.4K and 1.04 x 106A/cm2 at 77K for the c‐axis oriented film; for the a‐axis oriented film we obtained 6.7 x 106A/cm2 at 4.4K and 1.2 x 105A/cm2 at 77K. The orientation dependence of the critical current density in the basal plane of the a‐axis oriented film was studied. The largest Jc's occur along the in‐plane <100> axes of the substrate.

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