Assessing Ohmic Contacts
Keyword(s):
ABSTRACTThis paper reviews specific contact resistivity pc values obtained theoretically and experimently for a range of semiconducting materials. Techniques of obtaining pc values in terms of measurement, accuracy and reproducibility are then considered and matched to the semiconducting materials previously covered.
2014 ◽
Vol 17
(4)
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pp. 394-397
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1997 ◽
Vol 12
(9)
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pp. 2249-2254
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2019 ◽
Vol 58
(SH)
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pp. SHHD01
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2020 ◽
Vol 67
(4)
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pp. 1726-1729
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