Proton and Deuteron Double Resonance Studies of Structural Differences Between Amorphous Si and Ge Films
Keyword(s):
Proton and deuteron double resonance methods have been used to study the structure of high quality plasma-deposited a-Si:H,D and a-Ge:H,D films. The micro-structure of the a-Si is dominated by nanovoids with dimension <3 Å while the a-Ge shows many larger microvoids. We have observed new proton HD multiple echoes in the films by using a three pulse sequence double resonance method. The new echoes imply that HD molecules in a-Ge principally are located in large microvoids, which is not the case in high quality a-Si.
Keyword(s):
1973 ◽
Vol 22
(5)
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pp. 1100-1102
Keyword(s):
Keyword(s):
2012 ◽
Vol 51
(51)
◽
pp. 12888-12891
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1972 ◽
Vol 32
(5)
◽
pp. 1412-1414
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