Laser-rf double-resonance study of SiO+
Keyword(s):
We used the laser-rf double resonance method to measure 15 fine structure intervals for rotational quantum numbers ranging from N = 5 to 79 of the ν = 0 level of the X2Σ+ state of SiO+. We present a molecular model, including perturbations from the A2Π state, which explains the observed strong variation of fine structure as a function of rotational quantum number. These data yield greatly improved predictions of the microwave spectrum of the ground state of SiO+. In particular we predicted the ground state rotational transition (N = 2, J = 5/2) → (N = 1, J = 3/2) to be 86 063(1) MHz, confirming that this transition is not the source of the radio line known as U86.2 at 86 243.45(40) MHz.
Keyword(s):
1990 ◽
Vol 123
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pp. 251-251
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2019 ◽
Vol 21
(7)
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pp. 3440-3445
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1965 ◽
Vol 23
◽
pp. 299-302
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1995 ◽
Vol 240
(1-3)
◽
pp. 79-83
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2019 ◽
Keyword(s):
1998 ◽
Vol 293
(4)
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pp. L83-L87
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Keyword(s):
1996 ◽
Vol 257
(1-2)
◽
pp. 105-110
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