scholarly journals Structure Characteristics of ISD Coated Conductors

2001 ◽  
Vol 689 ◽  
Author(s):  
Y. L. Tang ◽  
D. J. Miller ◽  
B. Ma ◽  
R. E. Koritala ◽  
U. Balachandran
Keyword(s):  
High Temperature Superconductor ◽  
High Resolution Electron Microscopy ◽  
Coated Conductors ◽  
Buffer Layers ◽  
Interface Area ◽  
Epitaxial Relationship ◽  
Resolution Electron ◽  
Deposition Direction ◽  
Ybco Coated Conductors ◽  
Mgo Layers

ABSTRACTThe inclined-substrate deposition (ISD) method for growth of biaxially textured MgO is of interest due to its applications in coated conductors based on high-temperature superconductor (HTS). The ISD method is especially attractive since it offers the potential to produce a high–quality biaxially textured layer in a simple and efficient process. In this work, Yba2Cu3O7-x (YBCO) coated conductors based on two-step deposited MgO buffer layers (ISD and homoepitaxial) on Hastelloy tapes were examined by high-resolution electron microscopy (HREM) to study both the structure of individual layers and, especially, the interfaces between them. Special attention was paid to the MgO buffer layer because of its importance to biaxial YBCO formation. TEM investigation shows the MgO [111] direction is not parallel to the substrate normal but tilted slightly toward the deposition direction. The second layer of MgO has a good epitaxial relationship with the first layer, while dislocations were found near the interface area of the MgO layers. Twin boundaries, which are in the (111) plane, were found between the ISD MgO columns. The multi-buffer layers gave better growth of epitaxial YBCO.

Engineered oxide thin films as 100% lattice match buffer layers for YBCO coated conductors

2003 ◽  
Vol 47 (12) ◽  
pp. 2171-2175 ◽  
Author(s):  
Y. Akin ◽  
Z.K. Heiba ◽  
W. Sigmund ◽  
Y.S. Hascicek
Keyword(s):  
Thin Films ◽  
Coated Conductors ◽  
Buffer Layers ◽  
Oxide Thin Films ◽  
Lattice Match ◽  
Ybco Coated Conductors

Deposition of rare earth tantalate buffers on textured Ni-W substrates for YBCO coated conductor using chemical solution deposition approach

2006 ◽  
Vol 21 (3) ◽  
pp. 767-773 ◽  
Author(s):  
M.S. Bhuiyan ◽  
M. Paranthaman ◽  
A. Goyal ◽  
L. Heatherly ◽  
D.B. Beach
Keyword(s):  
Rare Earth ◽  
Chemical Solution Deposition ◽  
Precursor Solution ◽  
Coated Conductors ◽  
Buffer Layers ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Force Microscopy ◽  
Atomic Force ◽  
Ybco Coated Conductors

Epitaxial films of rare-earth (RE = La, Ce, Eu, and Gd) tantalates, RE3TaO7 with pyrochlore structures were grown on biaxially textured nickel-3 at.% tungsten (Ni-W) substrates using chemical solution deposition (CSD) process. Precursor solution of 0.3∼0.4 M concentration of total cations were spin coated on to short samples of Ni-W substrates and the films were crystallized at 1050∼1100 °C in a gas mixture of Ar- 4% H2 for 15 to 60 min. X-ray studies show that the films of pyrochlore RE tantalate films are highly textured with cube-on-cube epitaxy. Improved texture was observed in case of lanthanum tantalate (La3TaO7) film grown on Ni-W substrates. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) investigations of RE3TaO7 films reveal a fairly dense and smooth microstructure without cracks and porosity. The rare-earth tantalate layers may be potentially used as buffer layers for YBa2Cu3O7-δ (YBCO) coated conductors.

Inclined Substrate Deposition by Evaporation of Magnesium Oxide for Coated Conductors

1999 ◽  
Vol 585 ◽  
Author(s):  
Markus Bauer ◽  
Ralf Metzger ◽  
Robert Semerad ◽  
Paul Berberich ◽  
Helmut Kinder
Keyword(s):  
Electron Microscopy ◽  
Coated Conductors ◽  
The Other ◽  
Buffer Layers ◽  
Columnar Growth ◽  
Initial Momentum ◽  
3D Monte Carlo ◽  
Deposition Direction ◽  
Angle Deposition ◽  
Scanning Electron

AbstractBiaxially textured MgO buffer layers were deposited on metal substrates using “inclined substrate deposition” (ISD). The influence of the substrate inclination angle, deposition rate, and film thickness on the texture is shown. Scanning electron microscopy reveals columnar growth. We developed a growth model to explain the texturing. To test this model we have carried out 3D Monte-Carlo simulations. We find that the preferred orientation arises from mutual shadowing of the columns and directional surface diffusion due to their initial momentum.YBa2Cu3O7 (YBCO) films deposited on the ISD buffer layers are highly textured. The ab-planes of the YBCO are tilted with respect to the surface by typically 25° towards the direction of MgO vapor incidence. Therefore, the critical current density jc is anisotropic with up to 8 × 105 MA/cm2 in one direction and 4 × 105 MA/cm2 in the other. For tape coating the MgO deposition direction can be chosen so that the high jc is along the tape.

Modified Lanthanum Zirconium Oxide buffer layers for low-cost, high performance YBCO coated conductors

2010 ◽  
Vol 470 (5-6) ◽  
pp. 352-356 ◽  
Author(s):  
M. Parans Paranthaman ◽  
S. Sathyamurthy ◽  
Xiaoping Li ◽  
E.D. Specht ◽  
S.H. Wee ◽  
...  
Keyword(s):  
Zirconium Oxide ◽  
High Performance ◽  
Low Cost ◽  
Coated Conductors ◽  
Buffer Layers ◽  
Lanthanum Zirconium Oxide ◽  
Ybco Coated Conductors

Fast Growth Processes of Buffer Layers for YBCO Coated Conductors on Biaxially-Textured Ni Tapes

2009 ◽  
Vol 19 (3) ◽  
pp. 3295-3298 ◽  
Author(s):  
Yijie Li ◽  
Zuncheng Zhao ◽  
Linfei Liu ◽  
Qinghao Ye ◽  
Hang Zheng
Keyword(s):  
Fast Growth ◽  
Coated Conductors ◽  
Buffer Layers ◽  
Growth Processes ◽  
Ybco Coated Conductors

Sol–gel deposition of high-performance Re0.2Ce0.8O2/La2Zr2O7 composite buffer layers on Ni–W tapes for YBCO coated conductors

2015 ◽  
Vol 77 (1) ◽  
pp. 94-99 ◽  
Author(s):  
Weibai Bian ◽  
Yuanqing Chen ◽  
Xinni Tang ◽  
Weihua Zhang ◽  
Gaoyang Zhao ◽  
...  
Keyword(s):  
High Performance ◽  
Sol Gel ◽  
Coated Conductors ◽  
Buffer Layers ◽  
Ybco Coated Conductors

In Situ EBSD Study of Stable Cube Texture in an Advanced Composite Substrate Used in YBCO-Coated Conductors

2020 ◽  
Vol 26 (3) ◽  
pp. 365-372
Author(s):  
Yaotang Ji ◽  
Hongli Suo ◽  
ZiLi Zhang ◽  
Lin Ma ◽  
Jiazhi Li ◽  
...  
Keyword(s):  
Yield Strength ◽  
Cube Texture ◽  
Strain Curve ◽  
Coated Conductors ◽  
Buffer Layers ◽  
High Yield ◽  
Alloy Composite ◽  
Composite Substrates ◽  
Ybco Coated Conductors

AbstractAdvanced Ni8W/Ni12W/Ni8W alloy composite substrates used in YBCO-coated conductors with a strong cube texture and high yield strength have been fabricated, and a CeO2 buffer layer film was successfully deposited on the composite substrates. Through in situ tensile testing coupled with electron backscattered diffraction (EBSD) analysis, the stability of the cube texture of Ni8W/Ni12W/Ni8W alloy composite substrates has been investigated. The stress–strain curve shows that the yield strength (at 0.2% strain) of the composite substrates exceeds 250 Mpa. The orientation of grains and boundaries on the surface of the substrates was almost unchanged, while the strain exceeds 0.2%, which indicated that the composite substrates are adequate for depositing buffer layers and YBCO layers by the reel-to-reel process.

High-resolution electron microscopy of epitaxial YBCO/Y2O3/YSZ on Si(001)

1993 ◽  
Vol 8 (9) ◽  
pp. 2112-2127 ◽  
Author(s):  
A. Bardal ◽  
O. Eibl ◽  
Th. Matthée ◽  
G. Friedl ◽  
J. Wecker
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Thick Layer ◽  
Atomic Layer ◽  
High Resolution Electron Microscopy ◽  
Stacking Fault ◽  
Buffer Layers ◽  
Misfit Dislocations ◽  
Resolution Electron ◽  
Unit Cells

The microstructures of YBa2Cu3O7−δ (YBCO) thin films grown on Si with Y-stabilized ZrO2 (YSZ) and Y2O3 buffer layers were characterized by means of high-resolution electron microscopy. At the Si–YSZ interface, a 2.5 nm thick layer of regrown amorphous SiOx is present. The layer is interrupted by crystalline regions, typically 5 to 10 nm wide and 10 to 50 nm apart. Close to the crystalline regions, {111} defects are present in the Si substrate. The typical defect observed is an extrinsic stacking fault plus a perfect dislocation close to the stacking fault which terminates extra {111} planes in the upper part of the Si. These defects are probably formed by condensation of Si self-interstitials created during oxide regrowth. Precipitates are present in the Si close to the Si–YSZ interface and indicate that in-diffusion of Zr has occurred. The YSZ–Y2O3 interface is atomically sharp and essentially planar and contains no second phases. Perfect misfit dislocations with Burgers vector 1/2〈110〉 are present at this interface along with unrelaxed elastic misfit stresses. The Y2O3–YBCO interface is atomically sharp and planar, but contains steps. (001) stacking faults are present in the YBCO above these steps; the faults are, however, healed a few unit cells away from the interface. By HREM analysis of ultrathin specimen areas, the atomic layer of the YBCO closest to the Y2O3 was found to be a barium-oxygen layer.

scholarly journals Microstructure of High Temperature Superconductors of the Perovskite Type

1987 ◽  
Vol 40 (4) ◽  
pp. 547 ◽  
Author(s):  
AF Moodie ◽  
HJ Whitfield
Keyword(s):  
Electron Microscopy ◽  
High Temperature ◽  
High Temperature Superconductor ◽  
High Temperature Superconductors ◽  
High Resolution Electron Microscopy ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Resolution Electron ◽  
Convergent Beam ◽  
Perovskite Type

Combined high resolution electron microscopy and convergent beam electron diffraction (CBED) of the same areas of crystals of Ba3La3Cu6014 reveals defects of various types including ordinary dislocations and polytypic intergrowths. This latter type is considered to be intimately associated with the performance of this material as a high temperature superconductor ..

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