Phase Relationships and Phase Formation in the System BaF2-BaO-Y2O3-CuOx-H2O

2001 ◽  
Vol 689 ◽  
Author(s):  
W. Wong-Ng ◽  
L. P. Cook ◽  
J. Suh ◽  
I. Levin ◽  
M. Vaudin ◽  
...  
Keyword(s):  
Reaction Kinetics ◽  
Phase Formation ◽  
Volume Fraction ◽  
Reciprocal System ◽  
Ex Situ ◽  
Coated Conductor ◽  
X Ray Diffraction ◽  
X Ray ◽  
Phase Relationships

ABSTRACTThe interplay of melting equilibria and reaction kinetics is important during formation of the Ba2YCu3O6+x (Y-213) phase from starting materials in the quaternary reciprocal system Ba,Y,Cu//O,F. For experimental investigation of the process we used a combination of differential thermal analysis (DTA) for study of melting equilibria, and in-situ high-temperature x-ray diffraction (HTXRD) for study of the phase formation and reaction kinetics. DTA investigation of compositions spaced along compositional vectors extending from the oxide end to the fluoride end of the reciprocal system have given evidence of low melting liquids (∼600 °C) near the fluorine-rich end. Work is continuing to determine whether similar thermal events observed in the interior of the system also indicate low temperature liquids, and on the extent to which low-melting liquids could be involved in Y-213 phase formation. HTXRD investigations have been initiated on the conversion of 0.3 μm and 1.0 μm thick BaF2-Y-Cu precursor films to Y-213 in the presence of water vapor. Preliminary results indicated that the thickness of film has a strong influence on the texture of the Y-213 film: a 0.3 μm film showed mainly (001) texture, whereas a 1.0 μm film showed a greater volume fraction of (h00) texture. While the HTXRD method cannot directly reveal the presence of liquid, we are working to combine DTA and HTXRD data for a unified picture of Y-213 phase formation during the “BaF2 ex-situ” process for coated-conductor fabrication.

Stress Evolution in Thin Films; Diffusion and Reactions

2007 ◽  
Vol 264 ◽  
pp. 71-78 ◽  
Author(s):  
U. Welzel ◽  
Eric J. Mittemeijer
Keyword(s):  
Phase Formation ◽  
Ex Situ ◽  
Microstructural Development ◽  
Diffusion Annealing ◽  
Stress Evolution ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thin Film Diffusion ◽  
Compressive Residual Stresses

After a brief discussion of possible mechanisms of stress generation in thin film diffusion/reaction couples, two recent experimental examples are reviewed: (i) Thin film diffusion couples (Pd-Cu, individual layer thicknesses: 50nm) prepared by DC-magnetron sputtering on silicon substrates. The microstructural development, phase formation and the stress evolution during diffusion annealing have been investigated employing Auger-electron spectroscopy in combination with sputter depth profiling, transmission electron microscopy, in-situ wafer-curvature measurements and ex-situ and, in particular, in-situ X-ray diffraction measurements. (ii) Tin layers on copper substrates (layer thicknesses of some microns) prepared by electrodeposition. Upon storage at ambient temperatures, Cu diffuses into the Sn layer and forms the intermetallic phase η’- Cu6Sn5. The phase formation is accompanied by a volume expansion and as a consequence, compressive residual stresses can be generated in the Sn layers. These compressive residual stresses may drive the formation of Sn whiskers on the Sn surface. The microstructural development, phase formation and the stress evolution during diffusion annealing have been investigated employing scanning electron and focused ion beam microscopy, metallography and ex-situ and, in particular, in-situ X-ray diffraction measurements.

In Situ X-Ray Diffraction Investigations during Diffusion Anneals of Ni-Cu Thin Film Diffusion Couples

2010 ◽  
Vol 89-91 ◽  
pp. 503-508 ◽  
Author(s):  
J. Sheng ◽  
U. Welzel ◽  
Eric J. Mittemeijer
Keyword(s):  
Thermal Stresses ◽  
Stress Generation ◽  
Ex Situ ◽  
Diffusion Annealing ◽  
X Ray Diffraction ◽  
Individual Layer ◽  
X Ray ◽  
Bilayer System ◽  
Stress Changes

The stress evolution during diffusion annealing of Ni-Cu bilayers (individual layer thicknesses of 50 nm) was investigated employing ex-situ and in-situ X-ray diffraction measurements. Annealing at relatively low homologous temperatures (about 0.3 - 0.4 Tm) for durations up to about 100 hours results in considerable diffusional intermixing, as demonstrated by Auger-electron spectroscopy investigations (in combination with sputter-depth profiling). In addition to thermal stresses due to differences of the coefficients of thermal expansion of layers and substrate, tensile stress con-tributions in the sublayers arise during the diffusion anneals. The obtained stress data have been discussed in terms of possible mechanisms of stress generation. The influence of diffusion on stress development in the sublayers of the diffusion couple during heating and isothermal annealing was investigated by comparing stress changes in the bilayer system with corresponding results obtained under identical conditions for single layers of the components in the bilayer system. The specific residual stresses that emerge due to diffusion between the (sub)layers in the bilayer could thereby be identified.

Size dependent behavior of Fe3O4crystals during electrochemical (de)lithiation: an in situ X-ray diffraction, ex situ X-ray absorption spectroscopy, transmission electron microscopy and theoretical investigation

2017 ◽  
Vol 19 (31) ◽  
pp. 20867-20880 ◽  
Author(s):  
David C. Bock ◽  
Christopher J. Pelliccione ◽  
Wei Zhang ◽  
Janis Timoshenko ◽  
K. W. Knehr ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Structural Changes ◽  
Ex Situ ◽  
X Ray Diffraction ◽  
X Ray ◽  
Size Dependent ◽  
Transmission Electron ◽  
Dependent Behavior ◽  
X Ray Absorption

Crystal and atomic structural changes of Fe3O4upon electrochemical (de)lithiation were determined.

scholarly journals A study on preparation and characterization of carbon doped TiO2 nanotubes

2014 ◽  
Vol 6 (1) ◽  
Author(s):  
Srimala Sreekantan ◽  
Roshasnorlyza Hazan ◽  
Zainovia Lockman ◽  
Ishak Mat
Keyword(s):  
Methyl Orange ◽  
Tio2 Nanotubes ◽  
Pure Tio2 ◽  
Ex Situ ◽  
X Ray Diffraction ◽  
Methyl Orange Degradation ◽  
Doped Tio2 ◽  
X Ray ◽  
Carbon Doped

The present study is directed to clarify the influence of carbon doping on the degradation of methyl orange. TiO2 nanotubes were prepared by anodizing titanium foils in a two electrode configuration bath with titanium foil as the anode and platinum as the counter electrode. The electrochemical bathconsists of 1 M Na2SO4 with 0.7 g ammonium fluoride, NH4F. The nanotubes obtained were further doped with carbon via in-situ and ex-situ method. Incorporation of carbon on TiO2 via in-situ method is accomplished during the anodization process by introducing oxalic acid into electrolyte while theex-situ doping involves carbon incorporation into pre-fabricated TiO2 nanotube via flame annealing using carbon blackN330. Characterization such as Scanning Electron Microscope (SEM), Energy Dispersive X-ray Analysis (EDX), and X-Ray Diffraction (XRD) are used to determine the surfacemorphology, composition of dopants, and phases exists. Well ordered nanotube with good adherence and smooth surface was obtained for both methods. When the oxide was annealed, X-ray diffraction analysis revealed the presence of anatase and rutile phase. The photocatalytic properties of thepure TiO2 and carbon doped TiO2 were tested for methyl orange degradation and the result indicated that the in-situ doped TiO2 has much better degradation than the ex-situ and pure TiO2. The percentage of methyl orange degradation for in-situ was 20% and 41% higher than ex-situ doped TiO2 and pure TiO2, respectively.

Microstructure and Mechanical Properties of In Situ TiB2/6061 Composites

2012 ◽  
Vol 535-537 ◽  
pp. 14-17
Author(s):  
Long Hua Zhong ◽  
Yu Tao Zhao ◽  
Song Li Zhang ◽  
Rong Wen
Keyword(s):  
Master Alloy ◽  
Volume Fraction ◽  
X Ray Diffraction ◽  
Melt Mixing ◽  
X Ray ◽  
Mixing Method ◽  
Particulate Volume Fraction ◽  
Ti Powder ◽  
Particulate Volume

In situ TiB2/6061 composites have been successfully synthesized through chemical reaction between 6061 master alloy, Al-3B master alloy and Ti powder. The composites fabricated by direct melt mixing method was investigated by Scanning Electron Microscope (SEM), Energy Dispersive x-ray Spectroscopy (EDS) and X-Ray Diffraction (XRD), The results shown the existence of TiB2particles. The size of most TiB2particles were just in micron level, and even reached to sub-micron level. The increase in microhardness and tensile strength for the as-prepared composites with 5% particulate volume fraction (PVF) are up to 26.8% and 51.2% respectively.

scholarly journals The Viscosity and Atomic Structure of Volatile-Bearing Melilititic Melts at High Pressure and Temperature and the Transport of Deep Carbon

Minerals ◽  
2020 ◽  
Vol 10 (3) ◽  
pp. 267 ◽  
Author(s):  
Vincenzo Stagno ◽  
Veronica Stopponi ◽  
Yoshio Kono ◽  
Annalisa D’Arco ◽  
Stefano Lupi ◽  
...  
Keyword(s):  
Experimental Data ◽  
High Pressure ◽  
Atomic Structure ◽  
Ex Situ ◽  
X Ray Diffraction ◽  
High Pressure And Temperature ◽  
X Ray ◽  
Falling Sphere ◽  
Basaltic Melts

Understanding the viscosity of mantle-derived magmas is needed to model their migration mechanisms and ascent rate from the source rock to the surface. High pressure–temperature experimental data are now available on the viscosity of synthetic melts, pure carbonatitic to carbonate–silicate compositions, anhydrous basalts, dacites and rhyolites. However, the viscosity of volatile-bearing melilititic melts, among the most plausible carriers of deep carbon, has not been investigated. In this study, we experimentally determined the viscosity of synthetic liquids with ~31 and ~39 wt% SiO2, 1.60 and 1.42 wt% CO2 and 5.7 and 1 wt% H2O, respectively, at pressures from 1 to 4.7 GPa and temperatures between 1265 and 1755 °C, using the falling-sphere technique combined with in situ X-ray radiography. Our results show viscosities between 0.1044 and 2.1221 Pa·s, with a clear dependence on temperature and SiO2 content. The atomic structure of both melt compositions was also determined at high pressure and temperature, using in situ multi-angle energy-dispersive X-ray diffraction supported by ex situ microFTIR and microRaman spectroscopic measurements. Our results yield evidence that the T–T and T–O (T = Si,Al) interatomic distances of ultrabasic melts are higher than those for basaltic melts known from similar recent studies. Based on our experimental data, melilititic melts are expected to migrate at a rate ~from 2 to 57 km·yr−1 in the present-day or the Archaean mantle, respectively.

PHASE FORMATION AND TEXTURE DEVELOPMENT IN AG-SHEATHED Bi, Pb(2223) TAPES STUDIED BY DIFFERENT IN-SITU AND EX-SITU DIFFRACTION TECHNIQUES

2000 ◽  
Vol 14 (25n27) ◽  
pp. 2688-2693 ◽  
Author(s):  
E. GIANNINI ◽  
E. BELLINGERI ◽  
F. MARTI ◽  
M. DHALLÉ ◽  
V. HONKIMÄKI ◽  
...  
Keyword(s):  
High Energy ◽  
Texture Development ◽  
Ex Situ ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scattering Geometry ◽  
Reflection Geometry ◽  
Comparison Of The Results ◽  
In Situ Neutron Diffraction

In-situ and ex-situ high energy (80÷88 keV) X-Ray diffraction from a synchrotron radiation source were performed on multifilamentary Bi, Pb(2223)/Ag tapes using a transmission scattering geometry. Several thermo-mechanical procedures were compared, focusing mainly on the texture development of both Bi, Pb(2212) and Bi, Pb(2223) phases. The effect of the periodic pressing on the texture and on the critical current is elucidated. The texture development of the Bi, Pb(2212) phase prior to its transformation into Bi, Pb(2223) was directly observed in-situ at high temperature by using a dedicated high-energy X-ray compatible furnace and a high resolution Image Plate detector. A sharp increase of the Bi, Pb(2212) grain orientation along the [00l] direction was found to occur only above 750°C. Normal state transport measurements are in full agreement with the formation mechanism and with the texture development observed. A comparison of the results with the ones provided by in-situ neutron diffraction and standard low-energy XRD in a reflection geometry is presented.

A Combined Experimental and Theoretical Study of Lithiation Mechanism in ZnFe2O4 Anode Materials

MRS Advances ◽  
2018 ◽  
Vol 3 (14) ◽  
pp. 773-778 ◽  
Author(s):  
Lei Wang ◽  
Alison McCarthy ◽  
Kenneth J. Takeuchi ◽  
Esther S. Takeuchi ◽  
Amy C. Marschilok
Keyword(s):  
Early Stage ◽  
Deep Understanding ◽  
Lithium Ion ◽  
Oxidation Products ◽  
Ex Situ ◽  
Theoretical Modelling ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Absorption

ABSTRACTZnFe2O4 (ZFO) represents a promising anode material for lithium ion batteries, but there is still a lack of deep understanding of the fundamental reduction mechanism associated with this material. In this paper, the complete visualization of reduction/oxidation products irrespective of their crystallinity was achieved experimentally through a compilation of in situ X-ray diffraction, synchrotron based powder diffraction, and ex-situ X-ray absorption fine structure data. Complementary theoretical modelling study further shed light upon the fundamental understanding of the lithiation mechanism, especially at the early stage from ZnFe2O4 up to LixZnFe2O4 (x = 2).

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