3D Periodic Arrays of Nanoparticles Inside Mesoporous Silica Films

2001 ◽  
Vol 707 ◽  
Author(s):  
Sophie Besson ◽  
Thierry Gacoin ◽  
Catherine Jacquiod ◽  
Christian Ricolleau ◽  
Jean-Pierre Boilot
Keyword(s):  
Mesoporous Silica ◽  
Porous Structure ◽  
Porous Silica ◽  
Silica Film ◽  
Silica Matrix ◽  
Metal Sulfides ◽  
Cds Nanoparticles ◽  
Silica Films ◽  
Periodic Arrays ◽  
Porous Silica Film

ABSTRACTCdS nanoparticles were grown inside a 3D hexagonal porous silica film. The film pore size and organization allowed the perfect control of particle repartition and size (3.5 nm), leading to a 3D nanocrystal array inside the silica matrix. The method was extended to another silica porous structure with larger pores, which allowed to obtain larger particles (5.8 nm). This process was then successfully generalized to other metal sulfides.

3D Periodic Arrays of Nanoparticles Inside Mesoporous Silica Films

2001 ◽  
Vol 704 ◽  
Author(s):  
Sophie Besson ◽  
Thierry Gacoin ◽  
Catherine Jacquiod ◽  
Christian Ricolleau ◽  
Jean-Pierre Boilot
Keyword(s):  
Mesoporous Silica ◽  
Porous Structure ◽  
Porous Silica ◽  
Silica Film ◽  
Silica Matrix ◽  
Metal Sulfides ◽  
Cds Nanoparticles ◽  
Silica Films ◽  
Periodic Arrays ◽  
Porous Silica Film

AbstractCdS nanoparticles were grown inside a 3D hexagonal porous silica film. The film pore size and organization allowed the perfect control of particle repartition and size (3.5 nm), leading to a 3D nanocrystal array inside the silica matrix. The method was extended to another silica porous structure with larger pores, which allowed to obtain larger particles (5.8 nm). This process was then successfully generalized to other metal sulfides.

Comparative Studies of Ultra Low-κ Porous Silica Films with 2-D Hexagonal and Disordered Pore Structures

2004 ◽  
Vol 812 ◽  
Author(s):  
Nobutoshi Fujii ◽  
Kazuhiro Yamada ◽  
Yoshiaki Oku ◽  
Nobuhiro Hata ◽  
Yutaka Seino ◽  
...  
Keyword(s):  
Pore Structure ◽  
Nonionic Surfactants ◽  
Porous Silica ◽  
Silica Film ◽  
X Ray Diffraction ◽  
Silica Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Porous Silica Film ◽  
Diffraction Peaks

AbstractPeriodic 2-dimensional (2-D) hexagonal and the disordered pore structure silica films have been developed using nonionic surfactants as the templates. The pore structure was controlled by the static electrical interaction between the micelle of the surfactant and the silica oligomer. No X-ray diffraction peaks were observed for the disordered mesoporous silica films, while the pore diameters of 2.0-4.0 nm could be measured by small angle X-ray scattering spectroscopy. By comparing the properties of the 2-D hexagonal and the disordered porous silica films which have the same porosity, it is found that the disordered porous silica film has advantages in terms of the dielectric constant and Young's modulus as well as the hardness. The disordered porous silica film is more suitable for the interlayer dielectrics for ULSI.

Gas-Sensitive Optical Absorption of Ultrafine Silver Particles Dispersed in a Porous Silica Film

1988 ◽  
Vol 27 (Part 2, No. 2) ◽  
pp. L164-L166 ◽  
Author(s):  
Akihisa Yanase ◽  
Hiroshi Komiyama ◽  
Kazunobu Tanaka
Keyword(s):  
Optical Absorption ◽  
Porous Silica ◽  
Silica Film ◽  
Silver Particles ◽  
Porous Silica Film

scholarly journals The roles of hydrophobic group on the surface of ultra low dielectric constant porous silica film during thermal treatment

2007 ◽  
Vol 515 (18) ◽  
pp. 7275-7280 ◽  
Author(s):  
Jen-Tsung Luo ◽  
Wen-Fa Wu ◽  
Hua-Chiang Wen ◽  
Ben-Zu Wan ◽  
Yu-Ming Chang ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Thermal Treatment ◽  
Porous Silica ◽  
Silica Film ◽  
Low Dielectric Constant ◽  
Hydrophobic Group ◽  
Low Dielectric ◽  
Porous Silica Film

A novel fabrication of meso-porous silica film by sol-gol of TEOS

2004 ◽  
Vol 5 (4) ◽  
pp. 422-427 ◽  
Author(s):  
Ming-zhi Yin ◽  
Xi Yao ◽  
Liang-ying Zhang
Keyword(s):  
Porous Silica ◽  
Silica Film ◽  
Porous Silica Film

CdS nanoparticles incorporated onion-like mesoporous silica films: Ageing-induced large stokes shifted intense PL emission

2013 ◽  
Vol 35 (12) ◽  
pp. 2604-2612 ◽  
Author(s):  
Manish Kr Mishra ◽  
Abhijit Mandal ◽  
Jony Saha ◽  
Goutam De
Keyword(s):  
Mesoporous Silica ◽  
Cds Nanoparticles ◽  
Silica Films ◽  
Pl Emission

Structure control of periodic porous silica film for low-k application

2002 ◽  
Author(s):  
Kazuhiro Yamada ◽  
Yoshiaki Oku ◽  
Nobuhiro Hata ◽  
Shozo Takada ◽  
Takamaro Kikkawa
Keyword(s):  
Porous Silica ◽  
Silica Film ◽  
Structure Control ◽  
Porous Silica Film ◽  
Low K

Estimating Density Reduction and Phonon Localization From Optical Thermal Conductivity Measurements of Porous Silica and Aerogel Thin Films

2011 ◽  
Author(s):  
Patrick E. Hopkins ◽  
Bryan J. Kaehr ◽  
Darren Dunphy ◽  
C. Jeffrey Brinker
Keyword(s):  
Thin Films ◽  
Thermal Conductivity ◽  
Mesoporous Silica ◽  
Porous Silica ◽  
Thermal Effusivity ◽  
Solid Matrix ◽  
Silica Films ◽  
Density Reduction ◽  
The Difference ◽  
Phonon Localization

In this work, we measure the thermal conductivity of mesoporous silica and aerogel thin-films using a non-destructive optical technique: time domain thermoreflectance (TDTR). Due to the rough surfaces of the optically transparent silica-based films, we evaporate an Al film on a glass cover slide and fabricate the silica structures directly on the Al film, providing a “probe-through-the-glass” configuration for TDTR measurements. This allows the thermal conductivity of mesoporous silica and aerogel thin films to be measured with traditional TDTR analyses. As the thermoreflectance response is highly dependent on the thermal effusivity of the porous structures, we estimate the density of the films by varying the heat capacity in our analysis. This density determination assumes that the solid matrix in the silica structure has the thermal conductivity as bulk SiO2, which is valid if all the lattice vibrations are localized, consistent with the minimum thermal conductivity concept. We independently determine the density of the porous silica films with nitrogen sorption measurements of thin films using a surface acoustic wave (SAW) technique. The difference between the determined from the SAW technique and that estimated by the TDTR effusivity analysis lends insight into the relative contributions of localized and propagating modes to thermal transport.

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