One-Dimensional Ordering of Self-assembled Ge Dots on Photolithographically Patterned Structures on Si (001)

2002 ◽  
Vol 715 ◽  
Author(s):  
B. Yang ◽  
A.R. Woll ◽  
P. Rugheimer ◽  
M.G. Lagally

AbstractWe report spatial arrangement of self-assembled Ge quantum dots on patterned structures on Si (001) without using complicated lithography. Starting from stripes and mesas fabricated by conventional lithography and plasma etching, we prepare sinusoidal Si stripes with narrow ridges and mesas with humped edges via high-temperature annealing. Deposited Ge self-assembles into coherent nanocrystals that align along the narrow ridges of the stripes and the sloped mesa edges. Enhanced strain relief at the ridges due to elastic relaxation and the high step densities on the shallow slopes at the edges are likely causes of nanocrystal alignment.

Author(s):  
N.N. Gerasimenko ◽  
N.S. Balakleyskiy ◽  
A.D. Volokhovskiy ◽  
D.I. Smirnov ◽  
O.A. Zaporozhan

AbstractWe present a method of Si–Ge QDs formation by ion beam implantation (IBI) technique and high temperature annealing for self-organization. Implantation doses varied from 10^14 to 10^17 cm^–2, ion energies ranged from 50 to 150 keV, annealing proceeded at temperature of 950 to 1050°C in argon environment. Formed QDs show strong infrared (IR) photoluminescence (PL) in the temperature region 15–250 K.


2012 ◽  
Vol 571 ◽  
pp. 269-272
Author(s):  
Peng Tian ◽  
Chong Qing Huang ◽  
Wen Hua Luo ◽  
Jing Liu

Self-assembled InAs/GaAs quantum dots structures with low temperature and high temperature cap layers are grown by meta-organic chemical vapor deposition. The effects of Indium composition of high temperature InGaAs cap layer on the structural and optical properties of quantum dots are investigated by the atomic force microscopy and photoluminescence. Emission peak wavelengths shift from 1218 nm to 1321 nm when the Indium composition of high temperature InGaAs cap layer increase form 0 to 0.17.


RSC Advances ◽  
2016 ◽  
Vol 6 (100) ◽  
pp. 97853-97860 ◽  
Author(s):  
Zibo Li ◽  
Zhengshun Li ◽  
Yutong Wu ◽  
Jingjie Nan ◽  
Haiyu Wang ◽  
...  

GQDs were fabricated by O2 plasma treatment with self-assembled gold nanoparticle monolayers as etching masks and investigated through TA spectroscopy.


2000 ◽  
Author(s):  
Jacques Lefebvre ◽  
Philip J. Poole ◽  
John P. McCaffrey ◽  
Boris Lamontagne ◽  
Geof C. Aers ◽  
...  

2008 ◽  
Vol 103 (12) ◽  
pp. 123522 ◽  
Author(s):  
Q. Wang ◽  
T. Wang ◽  
J. Bai ◽  
A. G. Cullis ◽  
P. J. Parbrook ◽  
...  

1996 ◽  
Vol 69 (20) ◽  
pp. 3072-3074 ◽  
Author(s):  
A. O. Kosogov ◽  
P. Werner ◽  
U. Gösele ◽  
N. N. Ledentsov ◽  
D. Bimberg ◽  
...  

2015 ◽  
Vol 44 (5) ◽  
pp. 1338-1343 ◽  
Author(s):  
William A. O’Brien ◽  
Meng Qi ◽  
Lifan Yan ◽  
Chad A. Stephenson ◽  
Vladimir Protasenko ◽  
...  

Author(s):  
P. Roitman ◽  
B. Cordts ◽  
S. Visitserngtrakul ◽  
S.J. Krause

Synthesis of a thin, buried dielectric layer to form a silicon-on-insulator (SOI) material by high dose oxygen implantation (SIMOX – Separation by IMplanted Oxygen) is becoming an important technology due to the advent of high current (200 mA) oxygen implanters. Recently, reductions in defect densities from 109 cm−2 down to 107 cm−2 or less have been reported. They were achieved with a final high temperature annealing step (1300°C – 1400°C) in conjunction with: a) high temperature implantation or; b) channeling implantation or; c) multiple cycle implantation. However, the processes and conditions for reduction and elimination of precipitates and defects during high temperature annealing are not well understood. In this work we have studied the effect of annealing temperature on defect and precipitate reduction for SIMOX samples which were processed first with high temperature, high current implantation followed by high temperature annealing.


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