Optical Constants of Vanadium Dioxide Films and Design of a Solar Energy Control Window

ABSTRACTWe determined the optical constants of a vanadium dioxide (VO2) thermochromic film deposited on glass substrate by ellipsometry in wavelength range from 380 nm to 1700 nm. The optical constants were employed to design the optimal stacked thin film structure for smart windows which control the solar radiation and heat transmission from the viewpoint of high luminous transmission.

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Optical Constants of VO2 Thin Film and Solar Energy Control Window

Netsu Bussei ◽

10.2963/jjtp.20.109 ◽

2006 ◽

Vol 20 (3) ◽

pp. 109-114

Author(s):

Masato Tazawa ◽

Hiroshi Kakiuchida ◽

Ping Jin

Keyword(s):

Thin Film ◽

Solar Energy ◽

Optical Constants ◽

Energy Control ◽

Control Window

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Study of the Structure, Electrical Conductivity of Cr-Cu Thin-Film Composition on a Glass Substrate

MRS Advances ◽

10.1557/adv.2019.243 ◽

2019 ◽

Vol 4 (41-42) ◽

pp. 2223-2230

Author(s):

Sergey M. Karabanov

Keyword(s):

Thin Film ◽

Electrical Conductivity ◽

Glass Substrate ◽

Defect Formation ◽

Mechanical Stability ◽

Film Structure ◽

High Electrical Conductivity ◽

Cu Films ◽

High Adhesion ◽

Cu Thin Film

ABSTRACTCu films are widely used in electronics for interconnections. In some applications, reliable thin-film connecting elements having high electrical conductivity, mechanical stability and adhesion to a glass substrate are required. In this case the length of the elements amounts to tens of centimetres. In this paper, Cu was used as the basis for the connecting elements. To ensure high adhesion Cr was used as an underlayer. The paper investigates the structure, electrical conductivity, adhesion, defect formation of Cu, Cu-Cr, Cr-Cu-Cr thin-film conductors. As a result of the performed research, the regularities of changes of the film structure, electrical conductivity, adhesion, defect formation depending on the technological process parameters were established. Physical and technological mechanisms determining the observed patterns are considered. The research results are used in the device production technology.

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Vanadium dioxide thin film with low phase transition temperature deposited on borosilicate glass substrate

Thin Solid Films ◽

10.1016/j.tsf.2011.01.394 ◽

2011 ◽

Vol 519 (13) ◽

pp. 4246-4248 ◽

Cited By ~ 25

Author(s):

Zhangli Huang ◽

Sihai Chen ◽

Boqing Wang ◽

Ying Huang ◽

Nengfu Liu ◽

...

Keyword(s):

Thin Film ◽

Phase Transition ◽

Transition Temperature ◽

Phase Transition Temperature ◽

Borosilicate Glass ◽

Vanadium Dioxide ◽

Glass Substrate

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Thermochromic and opacity behaviors in vanadium dioxide nanofilms: a theoretical study

Materials Research Express ◽

10.1088/2053-1591/ac4733 ◽

2021 ◽

Author(s):

Ikhlas Hameem Shallal ◽

Nidhal Moosa Abdul-Ameer ◽

Shaimaa Qassim Abdul-Hasan ◽

Moafak cadhem Abdulrida

Keyword(s):

Vanadium Dioxide ◽

Optical Constants ◽

Theoretical Study ◽

Visible Region ◽

Infrared Region ◽

Metal Phase ◽

Ultraviolet Region ◽

Smart Windows ◽

Insulating Phase ◽

Three Phases

Abstract Vanadium dioxide nanofilms are one of the most essential materials in electronic applications like smart windows. Therefore, studying and understanding the optical properties of such films is crucial to modifying the parameters that control these properties. To this end, this work focuses on investigating the opacity as a function of the energy directed at the nanofilms with different thicknesses (1 – 100) nm. Effective mediator theories (EMTs), which are considered as the application of Bruggeman's formalism and the Looyenga mixing rule, have been used to estimate the dielectric constant of VO2 nanofilms. The results show different opacity behaviors at different wavelength ranges (ultraviolet, visible, and infrared). The results depict that the highest opacity of the insulating phase is achieved at the ultraviolet region and it reduces for the metal phase. Besides, the results demonstrate that the opacity possesses a redshift during the changes at the three phases. Regarding the infrared region, the lowest opacity value is achieved at the insulator phase and it increases to the highest value at the metal phase. In the visible region, the opacity behavior remains similar in the three phases. It is worth noting that the lowest opacity is found for thinner nanofilm. Since both the refractive index and the extinction index are among the most essential optical constants, hence, both of them were compared with the experiment results, and an excellent agreement is achieved between them.

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The effect of an aluminum heat-sink layer on the laser-induced amorphization of SiOx/TeGeSn/SiOx phase-change recording films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100154846 ◽

1989 ◽

Vol 47 ◽

pp. 574-575

Author(s):

Matthew R. Libera ◽

Martin Chen

Keyword(s):

Thin Film ◽

Phase Change ◽

Heat Sink ◽

Multilayer Film ◽

Glassy Phase ◽

Film Structure ◽

Glass Forming ◽

Active Storage ◽

Dielectric Layers ◽

Amorphous States

Phase-change erasable optical storage is based on the ability to switch a micron-sized region of a thin film between the crystalline and amorphous states using a diffraction-limited laser as a heat source. A bit of information can be represented as an amorphous spot on a crystalline background, and the two states can be optically identified by their different reflectivities. In a typical multilayer thin-film structure the active (storage) layer is sandwiched between one or more dielectric layers. The dielectric layers provide physical containment and act as a heat sink. A viable phase-change medium must be able to quench to the glassy phase after melting, and this requires proper tailoring of the thermal properties of the multilayer film. The present research studies one particular multilayer structure and shows the effect of an additional aluminum layer on the glass-forming ability.

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