Annealing characteristics of Al-doped hydrogenated microcrystalline cubic silicon carbide films
Keyword(s):
Hot Wire
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AbstractAluminum-doped hydrogenated microcrystalline cubic silicon carbide (μc-3C-SiC:H) films deposited by the hot wire chemical vapor deposition technique at a low substrate temperature of about 300 °C were annealed at various temperatures in vacuum atmosphere. The increase in conductivity was observed on annealing the films over 400°C. The onset of hydrogen desorption occurred in the undoped films at about 650°C, while the onset was shifted towards lower temperatures in the case of Al-doped films. These results indicate that hydrogen plays an important role on the conductivity of the Al-doped μc-3C-SiC:H films.
2015 ◽
Vol 26
(5)
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pp. 2844-2850
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2013 ◽
Vol 231
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pp. 394-398
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2007 ◽
Vol 46
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pp. 1-6
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2012 ◽
2000 ◽
Vol 62
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pp. 193-199
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