High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme
2010 ◽
Vol E93-D
(1)
◽
pp. 2-9
2010 ◽
Vol E93-A
(12)
◽
pp. 2472-2480
◽
2011 ◽
Vol E94-D
(4)
◽
pp. 833-840
2005 ◽
Vol 152
(5)
◽
pp. 609
◽
Keyword(s):
Keyword(s):