Determination of structural constant and size of crystallites in thin magnetic films by ferromagnetic resonance

2021 ◽  
Vol 64 (1) ◽  
pp. 3-9
Author(s):  
B.A. Belyaev ◽  
◽  
N.M. Boev ◽  
A.A. Gorchakovsky ◽  
A.V. Izotov ◽  
...  
Keyword(s):  
Ferromagnetic Resonance ◽  
Magnetic Films ◽  
Magnetic Film ◽  
Magnetic Anisotropy Energy ◽  
Thin Magnetic Films ◽  
Transmission Electron ◽  
Magnetization Axis ◽  
Structural Constant ◽  
Average Size

We demonstrate the possibility of determination of the structural constant S and the average size of crystallites in an anisotropic nanocrystalline magnetic film by the analysis of the shape of the sharp microwave absorption peak observed when the external magnetic field is swept along the hard magnetization axis. In the theory of magnetization ripple, the constant S is linked to the surface density of local magnetic anisotropy energy and S can be used to estimate the quality of nanocrystalline films. The performance of the new method for determination of S was demonstrated on a 300-nm-thick nanocrystalline Co-P film. The absorption spectrum was measured on a local film area of ~ 1 mm2 by the scanning ferromagnetic resonance spectrometer. The calculated from the analysis of the spectrum value for S allowed us to determine an average size of crystallites in the film that agrees well with the transmission electron microscopy results.

Ferromagnetism and Ferromagnetic Resonance in Mn Implanted Si and GaAs

2006 ◽  
Vol 514-516 ◽  
pp. 280-283
Author(s):  
Nikolai A. Sobolev ◽  
Marcio A. Oliveira ◽  
Vitor S. Amaral ◽  
Armando Neves ◽  
M. Celeste Carmo ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Curie Temperature ◽  
Ferromagnetic Resonance ◽  
Magnetic Characteristics ◽  
Magnetic Clusters ◽  
Transmission Electron ◽  
Magnetization Axis ◽  
First Time

Ferromagnetism persisting above 375 K and anisotropic ferromagnetic resonance (FMR) spectra have been detected for the first time in Si co-implanted with Mn and As and annealed under appropriate conditions. For comparison, semi-insulating GaAs samples have been implanted with the same ions and subsequently annealed. They also exhibit ferromagnetism with a Curie temperature well in excess of 375 K. High-resolution transmission electron microscopy (TEM) performed on the samples with the best magnetic characteristics has shown the presence of nanoclusters due to the segregation of the implanted species in both Si and GaAs. The angular dependence of the FMR spectra also reveals the existence of magnetic clusters with the hard magnetization axis aligned along the four equivalent <111> crystal axes. The spectra are very similar in Si and GaAs, indicating that the clusters in both materials probably consist of hexagonal MnAs.

The Effect of Oblique Deposition with Small Incidence on Magnetic Properties of Thin Magnetic Films

2014 ◽  
Vol 215 ◽  
pp. 223-226 ◽  
Author(s):  
Boris A. Belyaev ◽  
Andrey V. Izotov ◽  
Platon N. Solovev
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Ferromagnetic Resonance ◽  
Strong Influence ◽  
Small Deviation ◽  
Magnetic Films ◽  
Magnetic Parameters ◽  
Thin Magnetic Films ◽  
Small Incidence ◽  
Oblique Deposition

Using the scanning spectrometer of ferromagnetic resonance it was found that the small deviation of the incidence atoms from the normal during the deposition had a strong influence on magnetic parameters of thin films.

Thin Magnetic Films with Artificial Texture on Substrate: Microwave Properties

2014 ◽  
Vol 215 ◽  
pp. 233-236 ◽  
Author(s):  
Boris A. Belyaev ◽  
Andrey V. Izotov ◽  
Alexander A. Leksikov ◽  
Alexey M. Serzhantov ◽  
Konstantin V. Lemberg ◽  
...  
Keyword(s):  
External Field ◽  
Line Width ◽  
Ferromagnetic Resonance ◽  
Considerable Increase ◽  
Resonance Field ◽  
Magnetic Films ◽  
Micromagnetic Simulation ◽  
Microwave Properties ◽  
Glass Substrates ◽  
Thin Magnetic Films

Using the scanning spectrometer of ferromagnetic resonance (FMR) the experimental dependences of the resonance field and FMR line width of thin permalloy magnetic films, which were deposited in vacuum on the substrate with an artificial texture, were obtained. The texture was produced by putting parallel grooves using a diamond cutter on glass substrates with period from 5 to 100 μm. It was found that the presence of the texture led to a considerable increase of the resonance field and FMR line width, when the external field was directed orthogonal to the grooves. On the base of a numerical micromagnetic simulation the explanation of the nature of observable in thin magnetic films effects was given.

Investigation of thin magnetic films switching in stroboscopic transmission electron microscope

1969 ◽  
Vol 5 (3) ◽  
pp. 179-180 ◽  
Author(s):  
U. Durasova ◽  
O. Kolotov ◽  
I. Kolotov ◽  
V. Petrov ◽  
G. Spivak ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Magnetic Films ◽  
Thin Magnetic Films ◽  
Transmission Electron
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