scholarly journals Data-Driven Analysis of Neutron Diffraction Line Profiles: Application to Plastically Deformed Ta

Author(s):  
Aaron Tallman ◽  
Reeju Pokharel ◽  
Darshan Bamney ◽  
Douglas Spearot ◽  
Bjorn Clausen ◽  
...  

Abstract Non-destructive evaluation of plastically deformed metals, particularly diffraction line profile analysis (DLPA), is valuable both to estimate dislocation densities and arrangements and to validate microstructure-aware constitutive models. To date, the interpretation of whole line diffraction profiles relies on the use of semi-analytical models such as the extended convolutional multiple whole profile (eCMWP) method. This study introduces and validates two data-driven DLPA models to extract dislocation densities from experimentally gathered whole line diffraction profiles. Using two distinct virtual diffraction models accounting for both strain and instrument induced broadening, a database of virtual diffraction whole line profiles of Ta single crystals is generated using discrete dislocation dynamics. The databases are mined to create Gaussian process regression-based surrogate models, allowing dislocation densities to be extracted from experimental profiles. The method is validated against 11 experimentally gathered whole line diffraction profiles from plastically deformed Ta polycrystals. The newly proposed model predicts dislocation densities consistent with estimates from eCMWP. Advantageously, this data driven LPA model can distinguish broadening originating from the instrument and from the dislocation content even at low dislocation densities. Finally, the data-driven model is used to explore the effect of heterogeneous dislocation densities in microstructures containing grains, which may lead to more accurate data-driven predictions of dislocation density in plastically deformed polycrystals.

2000 ◽  
Vol 33 (4) ◽  
pp. 1122-1127 ◽  
Author(s):  
J.-D. Kamminga ◽  
R. Delhez

A method is presented for the calculation of diffraction line profiles using Monte Carlo simulation. The method is used to calculate diffraction line profiles for specimens with some idealized distributions of dislocations. The results have been compared with analytical expressions available for these special dislocation distributions. This comparison has been used to validate some essential assumptions made in the derivation of the analytical expressions. In general, very good agreement has been found. Thus, the proposed method is shown to be a valuable tool for diffraction line profile analysis.


2000 ◽  
Vol 33 (3) ◽  
pp. 964-974 ◽  
Author(s):  
J. I. Langford ◽  
D. Louër ◽  
P. Scardi

A distribution of crystallite size reduces the width of a powder diffraction line profile, relative to that for a single crystallite, and lengthens its tails. It is shown that estimates of size from the integral breadth or Fourier methods differ from the arithmetic mean of the distribution by an amount which depends on its dispersion. It is also shown that the form of `size' line profiles for a unimodal distribution is generally not Lorentzian. A powder pattern can be simulated for a given distribution of sizes, if it is assumed that on average the crystallites have a regular shape, and this can then be compared with experimental data to give refined parameters defining the distribution. Unlike `traditional' methods of line-profile analysis, this entirely physical approach can be applied to powder patterns with severe overlap of reflections, as is demonstrated by using data for nanocrystalline ceria. The procedure is compared with alternative powder-pattern fitting methods, by using pseudo-Voigt and Pearson VII functions to model individual line profiles, and with transmission electron microscopy (TEM) data.


2012 ◽  
Vol 45 (2) ◽  
pp. 157-165 ◽  
Author(s):  
Lyle E. Levine ◽  
Peter Geantil ◽  
Bennett C. Larson ◽  
Jonathan Z. Tischler ◽  
Michael E. Kassner ◽  
...  

Dislocation structures in deformed metals produce broad asymmetric diffraction line profiles. During analysis, these profiles are generally separated into two nearly symmetric subprofiles corresponding to diffraction by dislocation cell walls and cell interiors. These subprofiles are then interpreted using complex models of dislocation-based line broadening. Until now, it has not been possible to test the many assumptions that are made in such an analysis. Here, depth-resolved microbeam diffraction was used to measure diffraction line profiles from numerous individual dislocation cell walls and cell interiors in a heavily deformed Cu single crystal. Summing these profiles directly constructed the cell-interior and cell-wall subprofiles that have been approximated in the line profile analysis literature for the past 30 years. Direct comparison between the reconstructed subprofiles and the macroscopic asymmetric line profile from the same sample allows the first direct tests of many of the assumptions that have been used for interpreting these X-ray measurements.


Metals ◽  
2019 ◽  
Vol 9 (1) ◽  
pp. 60 ◽  
Author(s):  
Ryan Cottam ◽  
Suresh Palanisamy ◽  
Maxim Avdeev ◽  
Tom Jarvis ◽  
Chad Henry ◽  
...  

Wedge-shaped samples were manufactured by four different Additive Manufacturing (AM) processes, namely selective laser melting (SLM), electron beam melting (EBM), direct metal deposition (DMD), and wire and arc additive manufacturing (WAAM), using Ti-6Al-4V as the feed material. A high-resolution powder diffractometer was used to measure the diffraction patterns of the samples whilst rotated about two axes to collect detected neutrons from all possible lattice planes. The diffraction pattern of a LaB6 standard powder sample was also measured to characterize the instrumental broadening and peak shapes necessary for the Diffraction Line Profile Analysis. The line profile analysis was conducted using the extended Convolution Multiple Whole Profile (eCMWP) procedure. Once analyzed, it was found that there was significant variation in the dislocation densities between the SLMed and the EBMed samples, although having a similar manufacturing technique. While the samples fabricated via WAAM and the DMD processes showed almost similar dislocation densities, they were, however, different in comparison to the other two AM processes, as expected. The hexagonal (HCP) crystal structure of the predominant α-Ti phase allowed a breakdown of the percentage of the Burgers’ vectors possible for this crystal structure. All four techniques exhibited different combinations of the three possible Burgers’ vectors, and these differences were attributed to the variation in the cooling rates experienced by the parts fabricated using these AM processes.


2018 ◽  
Vol 941 ◽  
pp. 2024-2029
Author(s):  
Mutsumi Sano ◽  
Sunao Takahashi ◽  
Atsuo Watanabe ◽  
Ayumi Shiro ◽  
Takahisa Shobu ◽  
...  

Dislocation densities of dispersion-strengthened copper with aluminum oxide, namely GlidCop were evaluated employing the X-ray line profile analysis using the modified Williamson-Hall and modified Warren-Averbach method. X-ray diffraction profiles for GldCop samples with compressive strains applied at ambient temperature were measured with synchrotron radiation. The dislocation densities of GlidCop with compressive strain ranging from 0 – 2.7 % were on the order of 1.5×1014 – 6.6×1014 m-2.


1998 ◽  
Vol 13 (4) ◽  
pp. 210-215 ◽  
Author(s):  
Matteo Leoni ◽  
Paolo Scardi ◽  
J. Ian Langford

Standard Reference Materials (SRMs) for determining instrumental line profiles should not exhibit measurable broadening from structural imperfections, but owing the effects of sample transparency and other geometrical effects, the quality of possible SRMs cannot necessarily be assessed satisfactorily with data from a conventional divergent-beam diffractometer. The problem of transparency can be avoided if parallel beam optics is used, as for instance on a synchrotron radiation powder diffraction station employing Parrish (Soller-type receiving slit assembly) geometry. Data from such a configuration are used to compare three SRMs commonly used in line-profile analysis.


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