Characterization of standard reference materials for obtaining instrumental line profiles

1998 ◽  
Vol 13 (4) ◽  
pp. 210-215 ◽  
Author(s):  
Matteo Leoni ◽  
Paolo Scardi ◽  
J. Ian Langford
Keyword(s):  
Reference Materials ◽  
Profile Analysis ◽  
Standard Reference Materials ◽  
Line Profile Analysis ◽  
Line Profiles ◽  
Instrumental Line ◽  
Geometrical Effects ◽  
Structural Imperfections

Standard Reference Materials (SRMs) for determining instrumental line profiles should not exhibit measurable broadening from structural imperfections, but owing the effects of sample transparency and other geometrical effects, the quality of possible SRMs cannot necessarily be assessed satisfactorily with data from a conventional divergent-beam diffractometer. The problem of transparency can be avoided if parallel beam optics is used, as for instance on a synchrotron radiation powder diffraction station employing Parrish (Soller-type receiving slit assembly) geometry. Data from such a configuration are used to compare three SRMs commonly used in line-profile analysis.

Line Profile Analysis (LPA) Methods: Systematic Ranking of the Quality of their Basic Assumptions

2004 ◽  
Vol 443-444 ◽  
pp. 127-130
Author(s):  
Arnold C. Vermeulen ◽  
Rob Delhez
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
Line Profiles ◽  
Qualitative Comparison ◽  
New Developments ◽  
X Ray ◽  
Basic Assumptions ◽  
Wide Range

All methods of analyzing the broadening of XRD line profiles have to take into account two basic effects: broadening by the instrument - including the X-ray spectrum - and the characteristics of broadening by size effects and by lattice defects - including their interaction. These effects are handled in practice by a wide range of auxiliary assumptions. In this paper these assumptions and their quality with respect to "appropriateness of purpose" are listed and compared. By systematic ranking of these assumptions in accordance with their quality, a 2-dimensional map can be constructed that visualizes the differences in the quality of the assumptions. This 2-dimensional map brings a new viewpoint to the various methods for line profile analysis, because it enables a qualitative comparison of the assumptions of existing methods and new developments.

Microstructural parameters and layer disorder accompanying dehydration transformation in Na-montmorillonite

2000 ◽  
Vol 215 (4) ◽  
Author(s):  
S.K. Srivastava ◽  
P. Bala ◽  
B.K. Samantaray ◽  
Hartmut Haeuseler
Keyword(s):  
Crystallite Size ◽  
Structural Changes ◽  
Profile Analysis ◽  
Thermal Transformation ◽  
Initial Slope ◽  
Line Profile Analysis ◽  
Line Profiles ◽  
X Ray ◽  
Microstructural Parameters ◽  
Layer Disorder

Structural changes accompanying thermal transformation in Na-montmorillonite samples up to a temperature of 500°C have been investigated by X-ray line profile analysis. The method of Fourier initial slope and variance analysis of X-ray line profiles have been used to calculate the different microstructural parameters like crystallite size, r.m.s. strain (<e

X-Ray Powder Diffraction For Studying the Mineralogy of fly ash

1987 ◽  
Vol 113 ◽  
Author(s):  
Gregory I. McCarthy
Keyword(s):  
Fly Ash ◽  
Powder Diffraction ◽  
Reference Materials ◽  
Standard Reference Materials ◽  
National Bureau ◽  
Fly Ashes ◽  
X Ray ◽  
High Calcium

ABSTRACTA brief summary of the use of x-ray powder diffraction for studying the mineralogy of fly ash is presented. Mineralogies of low-, intermediate- and high-calcium fly ashes are discussed and illustrated by results from XRD characterization of U.S. National Bureau of Standards fly ash Standard Reference Materials.

Calculation of diffraction line profiles from specimens with dislocations. A comparison of analytical models with computer simulations

2000 ◽  
Vol 33 (4) ◽  
pp. 1122-1127 ◽  
Author(s):  
J.-D. Kamminga ◽  
R. Delhez
Keyword(s):  
Monte Carlo Simulation ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Analytical Models ◽  
Line Profile Analysis ◽  
Line Profiles ◽  
Diffraction Line Profile ◽  
Analytical Expressions ◽  
Good Agreement ◽  
Made In

A method is presented for the calculation of diffraction line profiles using Monte Carlo simulation. The method is used to calculate diffraction line profiles for specimens with some idealized distributions of dislocations. The results have been compared with analytical expressions available for these special dislocation distributions. This comparison has been used to validate some essential assumptions made in the derivation of the analytical expressions. In general, very good agreement has been found. Thus, the proposed method is shown to be a valuable tool for diffraction line profile analysis.

Practical Applications of X-Ray Line Profile Analysis

2017 ◽  
pp. 1094-1132
Author(s):  
Jenő Gubicza
Keyword(s):  
Crystallite Size ◽  
Twin Boundary ◽  
Line Profile ◽  
Profile Analysis ◽  
Vacancy Concentration ◽  
Direct Method ◽  
Line Profile Analysis ◽  
Line Profiles ◽  
X Ray ◽  
Practical Applications

In the previous chapters, the theory and the main methods of diffraction peak profile analysis were presented. Additionally, the specialties in the measurement and the evaluation of line profiles in the cases of thin films and single crystals were discussed. In this chapter, some practical considerations are given in order to facilitate the evaluation of peak profiles and the interpretation of the results obtained by this method. For instance, the procedures for instrumental correction are overviewed. Additionally, how the prevailing dislocation slip systems and twin boundary types in hexagonal polycrystals can be determined from line profiles is shown. Besides the dislocation density, the vacancy concentration can also be obtained by the combination of electrical resistivity, calorimetric, and line profile measurements. The crystallite size and the twin boundary frequency determined by X-ray peak profile analysis are compared with the values obtained by the direct method of transmission electron microscopy. Furthermore, the limits of line profile analysis in the determination of crystallite size and defect densities are given. Finally, short overviews on the results obtained by peak profile analysis for metals, ceramics, and polymers are presented.

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