scholarly journals Topological Charge of Soft X-ray Vortex Beam Determined by Inline Holography

2021 ◽  
Author(s):  
Yuta Ishii ◽  
Hironori Nakao ◽  
Masaichiro Mizumaki ◽  
Yusuke Wakabayashi ◽  
Taka-hisa Arima ◽  
...  
Keyword(s):  
Topological Charge ◽  
Closed Loop ◽  
Fresnel Zone ◽  
Topological Defects ◽  
Vortex Beam ◽  
Magnetic Texture ◽  
X Ray ◽  
Pair Annihilation ◽  
Propagation Axis ◽  
Present Technique

Abstract A Laguerre–Gaussian (LG) vortex beam having a spiral wavefront can be characterized by its topological charge (TC). The TC gives the number of times that the beam phase passes through the interval [0, 2π] following a closed loop surrounding the propagation axis. Here, the TC of soft X-ray vortex beams is determined using the in-line holography technique, where interference between vortex waves produced from a fork grating and divergent waves from a Fresnel zone plate is observed as a holographic image. The analyses revealed the phase distributions and the TC for the LG vortex waves, which reflects topological number of the fork gratings, as well as for the Hermite–Gaussian (HG) mode waves generated from the other gratings. We also conducted a simulation of the present technique for pair annihilation of topological defects in a magnetic texture. These results may pave the way for development of probes capable of characterizing the topological numbers of magnetic defects.

scholarly journals Anomalous Bessel vortex beam: modulating orbital angular momentum with propagation

Nanophotonics ◽  
2018 ◽  
Vol 7 (3) ◽  
pp. 677-682 ◽  
Author(s):  
Yuanjie Yang ◽  
Xinlei Zhu ◽  
Jun Zeng ◽  
Xingyuan Lu ◽  
Chengliang Zhao ◽  
...  
Keyword(s):  
Angular Momentum ◽  
Quantum Information ◽  
Orbital Angular Momentum ◽  
Topological Charge ◽  
Propagation Distance ◽  
Zero Order ◽  
Vortex Beam ◽  
Bessel Beams ◽  
Propagation Axis ◽  
Continuous Range

AbstractZero-order and higher-order Bessel beams are well-known nondiffracting beams. Namely, they propagate with invariant profile (intensity) and carry a fixed orbital angular momentum. Here, we propose and experimentally study an anomalous Bessel vortex beam. Unlike the traditional Bessel beams, the anomalous Bessel vortex beam carries decreasing orbital angular momentum along the propagation axis in free space. In other words, the local topological charge is inversely proportional to the propagation distance. Both the intensity and phase patterns of the generated beams are measured experimentally, and the experimental results agree well with the simulations. We demonstrate an easy way to modulate the beam’s topological charge to be an arbitrary value, both integer and fractional, within a continuous range. The simplicity of this geometry encourages its applications in optical trapping and quantum information, and the like.

scholarly journals High-energy x-ray nanotomography introducing an apodization Fresnel zone plate objective lens

2021 ◽  
Vol 92 (2) ◽  
pp. 023701 ◽  
Author(s):  
Akihisa Takeuchi ◽  
Kentaro Uesugi ◽  
Masayuki Uesugi ◽  
Hiroyuki Toda ◽  
Kyosuke Hirayama ◽  
...  
Keyword(s):  
Fresnel Zone ◽  
High Energy ◽  
Zone Plate ◽  
Objective Lens ◽  
Fresnel Zone Plate ◽  
X Ray

Grazing incidence phase Fresnel zone plate for X-ray focusing

1994 ◽  
Vol 109 (3-4) ◽  
pp. 324-327 ◽  
Author(s):  
Yu.A. Basov ◽  
D.V. Roshchupkin ◽  
A.E. Yakshin
Keyword(s):  
Fresnel Zone ◽  
Grazing Incidence ◽  
Zone Plate ◽  
Fresnel Zone Plate ◽  
X Ray

APD-based x-ray imaging telescope using Fresnel zone plates for extremely high spatial resolution

2005 ◽  
Author(s):  
Michael R. Squillante ◽  
Richard A. Myers ◽  
Mitchell Woodring ◽  
James F. Christian ◽  
Frank Robertson ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Fresnel Zone ◽  
Fresnel Zone Plates ◽  
X Ray ◽  
Zone Plates ◽  
X Ray Imaging ◽  
Imaging Telescope

Investigation on the Preparation of High Precision Multilayer X-ray Fresnel Zone Plates Based on Atomic Layer Deposition Technology

2021 ◽  
Vol 50 (1) ◽  
pp. 156-164
Author(s):  
吴鹿杰 Lujie WU ◽  
文庆涛 Qingtao WEN ◽  
高雅增 Yazeng GAO ◽  
卢维尔 Weier LU ◽  
夏洋 Yang XIA ◽  
...  
Keyword(s):  
Atomic Layer Deposition ◽  
High Precision ◽  
Fresnel Zone ◽  
Atomic Layer ◽  
Fresnel Zone Plates ◽  
X Ray ◽  
Zone Plates ◽  
Layer Deposition ◽  
Deposition Technology

scholarly journals X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge

2012 ◽  
Vol 3 ◽  
pp. 345-350 ◽  
Author(s):  
Carla Bittencourt ◽  
Adam P Hitchock ◽  
Xiaoxing Ke ◽  
Gustaaf Van Tendeloo ◽  
Chris P Ewels ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Topological Defects ◽  
Sodium Cholate ◽  
Graphite Flake ◽  
Full Field ◽  
X Ray ◽  
Graphene Layers ◽  
Metal Impurities ◽  
Out Of Plane ◽  
X Ray Absorption

We demonstrate that near-edge X-ray-absorption fine-structure spectra combined with full-field transmission X-ray microscopy can be used to study the electronic structure of graphite flakes consisting of a few graphene layers. The flake was produced by exfoliation using sodium cholate and then isolated by means of density-gradient ultracentrifugation. An image sequence around the carbon K-edge, analyzed by using reference spectra for the in-plane and out-of-plane regions of the sample, is used to map and spectrally characterize the flat and folded regions of the flake. Additional spectral features in both π and σ regions are observed, which may be related to the presence of topological defects. Doping by metal impurities that were present in the original exfoliated graphite is indicated by the presence of a pre-edge signal at 284.2 eV.

Generation and characterization of a perfect vortex beam with a large topological charge through a digital micromirror device

2015 ◽  
Vol 54 (27) ◽  
pp. 8030 ◽  
Author(s):  
Yue Chen ◽  
Zhao-Xiang Fang ◽  
Yu-Xuan Ren ◽  
Lei Gong ◽  
Rong-De Lu
Keyword(s):  
Topological Charge ◽  
Vortex Beam ◽  
Digital Micromirror Device

Flow Characteristics of Closed Loop High PRF E-Beam or X-ray-Assisted Discharge Exciplex Laser

1984 ◽  
pp. 375-382
Author(s):  
S. M. Fournier ◽  
M. L. Sentis ◽  
B. M. Forestier ◽  
B. L. Fontaine
Keyword(s):  
Closed Loop ◽  
Flow Characteristics ◽  
X Ray

scholarly journals Soft X-ray nanospectroscopy for quantification of X-ray linear dichroism on powders

2021 ◽  
Vol 28 (4) ◽  
Author(s):  
Selwin Hageraats ◽  
Mathieu Thoury ◽  
Stefan Stanescu ◽  
Katrien Keune
Keyword(s):  
Fresnel Zone ◽  
Dipole Moments ◽  
Fundamental Property ◽  
Linear Dichroism ◽  
Model Parameters ◽  
Transition Dipole ◽  
X Ray ◽  
Zno Powders ◽  
The Individual ◽  
Absorption Features

X-ray linear dichroism (XLD) is a fundamental property of many ordered materials that can for instance provide information on the origin of magnetic properties and the existence of differently ordered domains. Conventionally, measurements of XLD are performed on single crystals, crystalline thin films, or highly ordered nanostructure arrays. Here, it is demonstrated how quantitative measurements of XLD can be performed on powders, relying on the random orientation of many particles instead of the controlled orientation of a single ordered structure. The technique is based on a scanning X-ray transmission microscope operated in the soft X-ray regime. The use of a Fresnel zone plate allows X-ray absorption features to be probed at ∼40 nm lateral resolution – a scale small enough to probe the individual crystallites in most powders. Quantitative XLD parameters were then retrieved by determining the intensity distributions of certain diagnostic dichroic absorption features, estimating the angle between their transition dipole moments, and fitting the distributions with four-parameter dichroic models. Analysis of several differently produced ZnO powders shows that the experimentally obtained distributions indeed follow the theoretical model for XLD. Making use of Monte Carlo simulations to estimate uncertainties in the calculated dichroic model parameters, it was established that longer X-ray exposure times lead to a decrease in the amplitude of the XLD effect of ZnO.

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