Temperature dependence of the radiation damage microstructure in V-4Cr-4Ti neutron irradiated to low dose

1998 ◽  
Author(s):  
P M Rice ◽  
S J Zinkle
Keyword(s):  
Temperature Dependence ◽  
Radiation Damage ◽  
Low Dose

scholarly journals Temperature dependence of the radiation damage microstructure in V–4Cr–4Ti neutron irradiated to low dose

1998 ◽  
Vol 258-263 ◽  
pp. 1414-1419 ◽  
Author(s):  
P.M. Rice ◽  
S.J. Zinkle
Keyword(s):  
Temperature Dependence ◽  
Radiation Damage ◽  
Low Dose

Factors in Photographic Emulsions for Low Dose Electron Crystallography

1980 ◽  
Vol 38 ◽  
pp. 230-231
Author(s):  
T.W. Jeng ◽  
W. Chiu
Keyword(s):  
Radiation Damage ◽  
Low Dose ◽  
Damage Effect ◽  
Photographic Emulsion ◽  
Electron Crystallography ◽  
Electron Microscopic ◽  
X Ray ◽  
Signal Contrast ◽  
Diffraction Patterns ◽  
Photographic Emulsions

With the advances in preparing biological materials in a thin and highly ordered form, and in maintaining them hydrated under vacuum, electron crystallography has become an important tool for biological structure investigation at high resolution (1,2). However, the electron radiation damage would limit the capability of recording reflections with low intensities in an electron diffraction pattern. It has been demonstrated that the use of a low temperature stage can reduce the radiation damage effect and that one can expose the specimen with a higher dose in order to increase the signal contrast (3). A further improvement can be made by selecting a proper photographic emulsion. The primary factors in evaluating the suitability of photographic emulsion for recording low dose diffraction patterns are speed, fog level, electron response at low electron exposure, linearity, and usable range of exposure. We have compared these factors with three photographic emulsions including Kodak electron microscopic plate (EMP), Industrex AA x-ray film (AA x-ray) and Kodak nuclear track film (NTB3).

Low dose radiation damage effects in silicon strip detectors

2016 ◽  
Vol 11 (11) ◽  
pp. C11015-C11015
Author(s):  
P. Wiącek ◽  
W. Dąbrowski
Keyword(s):  
Radiation Damage ◽  
Low Dose ◽  
Low Dose Radiation ◽  
Strip Detectors ◽  
Silicon Strip Detectors ◽  
Dose Radiation

Low‐dose implantation of Sb in Si1−xGexepitaxial layers: Correlation between electrical properties and radiation damage

1994 ◽  
Vol 75 (1) ◽  
pp. 377-381 ◽  
Author(s):  
Z. Atzmon ◽  
M. Eizenberg ◽  
Y. Shacham‐Diamand ◽  
J. W. Mayer ◽  
F. Schäffler
Keyword(s):  
Electrical Properties ◽  
Radiation Damage ◽  
Low Dose

Temperature dependence of radiation damage in silicon

1966 ◽  
Vol 20 (4) ◽  
pp. 344-346 ◽  
Author(s):  
P.H. Fang ◽  
Y.M. Liu
Keyword(s):  
Temperature Dependence ◽  
Radiation Damage

scholarly journals Differential Scanning Calorimetry of Metamict Pu-Substituted Zirconolite

1982 ◽  
Vol 15 ◽  
Author(s):  
Dean E. Peterson ◽  
Frank W. Clinard
Keyword(s):  
Activation Energy ◽  
Differential Scanning Calorimetry ◽  
Ambient Temperature ◽  
Total Energy ◽  
Temperature Dependence ◽  
Radiation Damage ◽  
Rate Constant ◽  
Stored Energy ◽  
Scanning Calorimetry ◽  
No Release

ABSTRACTSamples of CaPuTi2O7 were prepared by cold pressing and sintering. Plutonium was substituted for zirconium in order to characterize radiation damage effects. The energy stored in a sample which had reached saturation in swelling after storage at ambient temperature was measured with a differential scanning calorimeter. The total energy of 6.6±0.1 cal/g is released over the range 485–715° C. The activation energy of annealing of the damage is 1.22±0.05 eV. The temperature dependence of the rate constant is described by kT= 5.96E4 exp(−1.22/kBT) s−1 where kB and T are the Boltzmann's constant and temperature(K) respectively. A sample stored at 600°C was similarly evaluated and showed no release of stored energy to the precision of the apparatus (±0.1 cal/g). These results are applied to analysis of waste incorporation in Synroc and are correlated with analogous parameters for other materials.

The Genetic Basis of Cellular Recovery from Radiation Damage: Response of the Radiosensitive irs Lines to Low-Dose-Rate Irradiation

1995 ◽  
Vol 144 (3) ◽  
pp. 294 ◽  
Author(s):  
John Thacker ◽  
R. E. Wilkinson
Keyword(s):  
Dose Rate ◽  
Radiation Damage ◽  
Genetic Basis ◽  
Low Dose ◽  
Low Dose Rate ◽  
Damage Response

scholarly journals Low-dose X-ray structure analysis of cytochrome c oxidase utilizing high-energy X-rays

2019 ◽  
Vol 26 (4) ◽  
pp. 912-921 ◽  
Author(s):  
Go Ueno ◽  
Atsuhiro Shimada ◽  
Eiki Yamashita ◽  
Kazuya Hasegawa ◽  
Takashi Kumasaka ◽  
...  
Keyword(s):  
Radiation Damage ◽  
Low Dose ◽  
High Energy ◽  
Array Detector ◽  
X Rays ◽  
Data Set ◽  
X Ray ◽  
Ligand Structure ◽  
Biology I ◽  
On Line

To investigate the effect of high-energy X-rays on site-specific radiation-damage, low-dose diffraction data were collected from radiation-sensitive crystals of the metal enzyme cytochrome c oxidase. Data were collected at the Structural Biology I beamline (BL41XU) at SPring-8, using 30 keV X-rays and a highly sensitive pixel array detector equipped with a cadmium telluride sensor. The experimental setup of continuous sample translation using multiple crystals allowed the average diffraction weighted dose per data set to be reduced to 58 kGy, and the resulting data revealed a ligand structure featuring an identical bond length to that in the damage-free structure determined using an X-ray free-electron laser. However, precise analysis of the residual density around the ligand structure refined with the synchrotron data showed the possibility of a small level of specific damage, which might have resulted from the accumulated dose of 58 kGy per data set. Further investigation of the photon-energy dependence of specific damage, as assessed by variations in UV-vis absorption spectra, was conducted using an on-line spectrometer at various energies ranging from 10 to 30 keV. No evidence was found for specific radiation damage being energy dependent.

scholarly journals Micronucleus-Centromere Assay to Measure Ionizing Radiation Damage of Low Dose Occupational Exposure

OBM Genetics ◽  
2018 ◽  
Vol 2 (4) ◽  
pp. 1-1
Author(s):  
Albena Staynova ◽  
◽  
Ljubomira Hadjiiska ◽  
Valeria Hadjidekova ◽  
Rositsa Hristova ◽  
...  
Keyword(s):  
Occupational Exposure ◽  
Ionizing Radiation ◽  
Radiation Damage ◽  
Low Dose
Sign in / Sign up

Export Citation Format

Share Document