Nikolay Nikolaevich Sergeev, Doctor of Technical Sciences, Professor of Tula State Lev Tolstoy Pedagogical University - bright representative of the scientific school of physical fundamental and applied materials science M. A. Krishtal

In the year of the 160th birth anniversary of Academician N. S. Kurnakov (1860–1941), outstanding graduate of the St. Petersburg Mining Institute (now University), it becomes clear that the issues concerning his activities as a metallurgist, materials scientist and researcher which opened the road through his students (P. P. Weimarn and others) to new technologies, including nanotechnology, are not studied enough. We do not know much about the Kurnakov–Schroeder–Weimarn relations and about their scientific communications with other physicochemists and metallurgists, who later became leaders of scientific schools and successors of the traditions of Kurnakov’s scientific school in the field of physical and chemical analysis. The purpose of this article is to analyze specific examples of the application of physicochemical analysis for development of metal alloys and materials, as well as to clarify the historical gaps in understanding the scientific relation of N. S. Kurnakov, I. F. Schroeder, P. P. Weimarn and other researchers who have made a significant contribution to the deve lopment of modern materials science and metallurgy. It is shown that P. P. Weimarn, being a student of Kurnakov and Schroeder, developed their scientific directions. However, he was not only a supporter, but also a critic of Kurnakov’s ideas, while becoming the founder of the science of nanotechnology. The results of the research summarize facts, including previously unknown ones, which demonstrate the outstanding role of N. S. Kurnakov and his achievements not only as a physicochemist, but also as a metallurgist-preceptor, one of the founders of Russian school of metallurgists and materials scientists, including the school of metallurgists of the Mining Institute, which gave momentum to number of breakthrough technologies of the 21st century.

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Trends in Electron Energy Loss Spectroscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100078675 ◽

1977 ◽

Vol 35 ◽

pp. 228-229

Author(s):

C. Colliex ◽

P. Trebbia

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Materials Science ◽

Analytical Technique ◽

Recent Developments ◽

Quantitative Results ◽

Electron Microscopes ◽

Electron Energy Loss ◽

Primary Electrons

The physical foundations for the use of electron energy loss spectroscopy towards analytical purposes, seem now rather well established and have been extensively discussed through recent publications. In this brief review we intend only to mention most recent developments in this field, which became available to our knowledge. We derive also some lines of discussion to define more clearly the limits of this analytical technique in materials science problems.The spectral information carried in both low ( 0<ΔE<100eV ) and high ( >100eV ) energy regions of the loss spectrum, is capable to provide quantitative results. Spectrometers have therefore been designed to work with all kinds of electron microscopes and to cover large energy ranges for the detection of inelastically scattered electrons (for instance the L-edge of molybdenum at 2500eV has been measured by van Zuylen with primary electrons of 80 kV). It is rather easy to fix a post-specimen magnetic optics on a STEM, but Crewe has recently underlined that great care should be devoted to optimize the collecting power and the energy resolution of the whole system.

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Electron holography in materials science

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100087665 ◽

1991 ◽

Vol 49 ◽

pp. 670-671

Author(s):

Hannes Lichte ◽

Edgar Voelkl

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Materials Science ◽

Fourier Spectrum ◽

Object Wave ◽

Electron Holography ◽

Reconstruction Procedure ◽

Numerical Reconstruction ◽

Transmission Electron ◽

Unique Interpretation

The object wave o(x,y) = a(x,y)exp(iφ(x,y)) at the exit face of the specimen is described by two real functions, i.e. amplitude a(x,y) and phase φ(x,y). In stead of o(x,y), however, in conventional transmission electron microscopy one records only the real intensity I(x,y) of the image wave b(x,y) loosing the image phase. In addition, referred to the object wave, b(x,y) is heavily distorted by the aberrations of the microscope giving rise to loss of resolution. Dealing with strong objects, a unique interpretation of the micrograph in terms of amplitude and phase of the object is not possible. According to Gabor, holography helps in that it records the image wave completely by both amplitude and phase. Subsequently, by means of a numerical reconstruction procedure, b(x,y) is deconvoluted from aberrations to retrieve o(x,y). Likewise, the Fourier spectrum of the object wave is at hand. Without the restrictions sketched above, the investigation of the object can be performed by different reconstruction procedures on one hologram. The holograms were taken by means of a Philips EM420-FEG with an electron biprism at 100 kV.

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Zero-loss omega-filtered REM and RHEED on the new Zeiss 912

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100087392 ◽

1991 ◽

Vol 49 ◽

pp. 616-617

Author(s):

J.C.H. Spence ◽

J. Mayer

Keyword(s):

Electron Microscopy ◽

Materials Science ◽

Surface States ◽

Ccd Camera ◽

Dark Field ◽

Ion Pump ◽

Magnetic Imaging ◽

Reflection Electron Microscopy ◽

Diffraction Patterns ◽

Large Background

The Zeiss 912 is a new fully digital, side-entry, 120 Kv TEM/STEM instrument for materials science, fitted with an omega magnetic imaging energy filter. Pumping is by turbopump and ion pump. The magnetic imaging filter allows energy-filtered images or diffraction patterns to be recorded without scanning using efficient parallel (area) detection. The energy loss intensity distribution may also be displayed on the screen, and recorded by scanning it over the PMT supplied. If a CCD camera is fitted and suitable new software developed, “parallel ELS” recording results. For large fields of view, filtered images can be recorded much more efficiently than by Scanning Reflection Electron Microscopy, and the large background of inelastic scattering removed. We have therefore evaluated the 912 for REM and RHEED applications. Causes of streaking and resonance in RHEED patterns are being studied, and a more quantitative analysis of CBRED patterns may be possible. Dark field band-gap REM imaging of surface states may also be possible.

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Dynamical Scattering in Crystalline Biological Specimens. I. Criteria of Validity for Scattering Approximations

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010011458x ◽

1975 ◽

Vol 33 ◽

pp. 192-193

Author(s):

Robert M. Glaeser ◽

Bing K. Jap

Keyword(s):

Biological Sciences ◽

Electron Microscopy ◽

Electron Microscope ◽

Electron Diffraction ◽

Born Approximation ◽

Materials Science ◽

Image Data ◽

Dynamical Effect ◽

Crystallographic Structure ◽

Electron Microscope Image

The dynamical scattering effect, which can be described as the failure of the first Born approximation, is perhaps the most important factor that has prevented the widespread use of electron diffraction intensities for crystallographic structure determination. It would seem to be quite certain that dynamical effects will also interfere with structure analysis based upon electron microscope image data, whenever the dynamical effect seriously perturbs the diffracted wave. While it is normally taken for granted that the dynamical effect must be taken into consideration in materials science applications of electron microscopy, very little attention has been given to this problem in the biological sciences.

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Electron spectroscopic imaging and diffraction

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100087847 ◽

1991 ◽

Vol 49 ◽

pp. 706-707

Author(s):

M. Rühle ◽

J. Mayer ◽

J.C.H. Spence ◽

J. Bihr ◽

W. Probst ◽

...

Keyword(s):

Materials Science ◽

Electron Spectroscopic Imaging ◽

Magnetic Filter ◽

Magnetic Imaging ◽

Illumination System ◽

Probe Size ◽

Diffraction Patterns ◽

Fritz Haber ◽

Koehler Illumination ◽

First Time

A new Zeiss TEM with an imaging Omega filter is a fully digitized, side-entry, 120 kV TEM/STEM instrument for materials science. The machine possesses an Omega magnetic imaging energy filter (see Fig. 1) placed between the third and fourth projector lens. Lanio designed the filter and a prototype was built at the Fritz-Haber-Institut in Berlin, Germany. The imaging magnetic filter allows energy-filtered images or diffraction patterns to be recorded without scanning using efficient area detection. The energy dispersion at the exit slit (Fig. 1) results in ∼ 1.5 μm/eV which allows imaging with energy windows of ≤ 10 eV. The smallest probe size of the microscope is 1.6 nm and the Koehler illumination system is used for the first time in a TEM. Serial recording of EELS spectra with a resolution < 1 eV is possible. The digital control allows X,Y,Z coordinates and tilt settings to be stored and later recalled.

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Determination of interface width using EELS fine structure changes

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100087963 ◽

1991 ◽

Vol 49 ◽

pp. 730-731

Author(s):

Vinayak P. Dravid ◽

M.R. Notis ◽

C.E. Lyman

Keyword(s):

Fine Structure ◽

Materials Science ◽

Input Parameter ◽

Core Loss ◽

Directionally Solidified ◽

Interface Width ◽

Structure Changes ◽

Important Input ◽

Directionally Solidified Eutectics

The concept of interfacial width is often invoked in many materials science phenomena which relate to the structure and properties of internal interfaces. The numerical value of interface width is an important input parameter in diffusion equations, sintering theories as well as in many electronic devices/processes. Most often, however, this value is guessed rather than determined or even estimated. In this paper we present a method of determining the effective structural and electronic- structural width of interphase interfaces using low- and core loss fine structure effects in EELS spectra.The specimens used in the study were directionally solidified eutectics (DSEs) in the system; NiO-ZrO2(CaO), NiO-Y2O3 and MnO-ZrO2(ss). EELS experiments were carried out using a VG HB-501 FE STEM and a Hitachi HF-2000 FE TEM.

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