Normal Patch Retinex robust algorithm for white balancing in digital microscopy

2020 ◽  
Vol 29 (1) ◽  
pp. 79-95
Author(s):  
Izabella Antoniuk ◽  
Artur Krupa ◽  
Radosław Roszczyk
Keyword(s):  
Immunohistochemical Staining ◽  
Digital Photography ◽  
Optical Microscope ◽  
Digital Microscopy ◽  
White Balance ◽  
Robust Algorithm ◽  
Microscopic Images ◽  
Colour Photography ◽  
Automatic Mechanism ◽  
White Balancing

The acquisition of accurately coloured, balanced images in an optical microscope can be a challenge even for experienced microscope operators. This article presents an entirely automatic mechanism for balancing the white level that allows the correction of the microscopic colour images adequately. The results of the algorithm have been confirmed experimentally on a set of two hundred microscopic images. The images contained scans of three microscopic specimens commonly used in pathomorphology. Also, the results achieved were compared with other commonly used white balance algorithms in digital photography. The algorithm applied in this work is more effective than the classical algorithms used in colour photography for microscopic images stained with hematoxylin-phloxine-saffron and for immunohistochemical staining images.

scholarly journals Microscope observation of cracks of clay

2019 ◽  
Vol 92 ◽  
pp. 03007
Author(s):  
Chen Liang ◽  
Yilin Gui ◽  
Cees van der Land
Keyword(s):  
Moisture Content ◽  
Drying Shrinkage ◽  
Optical Microscope ◽  
Microscope Observation ◽  
Microscopic Images ◽  
Engineered Barriers

Clay has wide application in engineered barriers. However, it is prone to crack if moisture content decreases at most circumstances. This research aimed to microscopically study drying shrinkage and associated cracking of two different clays: kaolin and sodium-based bentonite, using optical microscope-Leica DM2700 M, under controlled condition. The samples used were cylindrical with 20mm in diameter and 1mm in depth. During the observation, microscopic images were captured and saved. These images were used to analyse the cracking behaviour due to drying. The testing results showed that cracks initially occur in the middle of the sample and then propagate to the sample boundary. The length and width of the crack was increased as moisture decreased.

Montages Link Microscopic to Macroscopic Information in Concrete Analys

1998 ◽  
Vol 4 (S2) ◽  
pp. 266-267
Author(s):  
A. Doerr ◽  
S. Badger ◽  
P. Brown ◽  
S. Sahu
Keyword(s):  
Electron Microscope ◽  
Small Area ◽  
Scale Effects ◽  
Optical Microscope ◽  
Small Scale ◽  
Digital Microscopy ◽  
High Magnification ◽  
Microscopic Features ◽  
The Relationship ◽  
Scanning Electron

One of the limitations of microscopy is that only a relatively small area is viewed and that both microscopic and macroscopic information is needed to better understand a process or relationship. Microscopic structures that can only be seen at high magnification may appear insignificant at magnifications required to see macroscopic structures. Montages from the scanning electron microscope (SEM) and optical microscope allow large areas to be displayed at relatively high magnifications revealing both macroscopic and microscopic features.The use of automated digital microscopy and image software have reduced the barriers for creation of montages and provided new display modes, thereby stimulating their use as an enhanced data acquisition, review, and interpretation technique.The ability to create digital montages is a valuable tool in the analysis of cement and concrete. It has been used to evaluate the relationship between small scale deleterious phases and their larger scale effects.

Some early history of replica techniques for electron microscopy

1992 ◽  
Vol 50 (2) ◽  
pp. 1076-1077
Author(s):  
Robert M. Fisher
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Optical Microscope ◽  
Early History ◽  
Bulk Materials ◽  
Thin Sections ◽  
Transmission Electron ◽  
Reflected Light ◽  
History Of ◽  
Electron Microscopes

By 1940, a half dozen or so commercial or home-built transmission electron microscopes were in use for studies of the ultrastructure of matter. These operated at 30-60 kV and most pioneering microscopists were preoccupied with their search for electron transparent substrates to support dispersions of particulates or bacteria for TEM examination and did not contemplate studies of bulk materials. Metallurgist H. Mahl and other physical scientists, accustomed to examining etched, deformed or machined specimens by reflected light in the optical microscope, were also highly motivated to capitalize on the superior resolution of the electron microscope. Mahl originated several methods of preparing thin oxide or lacquer impressions of surfaces that were transparent in his 50 kV TEM. The utility of replication was recognized immediately and many variations on the theme, including two-step negative-positive replicas, soon appeared. Intense development of replica techniques slowed after 1955 but important advances still occur. The availability of 100 kV instruments, advent of thin film methods for metals and ceramics and microtoming of thin sections for biological specimens largely eliminated any need to resort to replicas.

Near-field scanning optical microscopy

1986 ◽  
Vol 44 ◽  
pp. 642-643
Author(s):  
E. Betzig ◽  
A. Harootunian ◽  
M. Isaacson ◽  
A. Lewis
Keyword(s):  
Near Field ◽  
Optical Microscope ◽  
Visible Radiation ◽  
Field Methods ◽  
Optical Elements ◽  
Optical Region ◽  
Order Of Magnitude ◽  
Nondestructive Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.

Creating a standard method of controlling digital microscopes: the microscope access protocol (map)

1995 ◽  
Vol 53 ◽  
pp. 16-17
Author(s):  
T. A. Dodson ◽  
E. Völkl ◽  
L. F. Allard ◽  
T. A. Nolan
Keyword(s):  
Data Storage ◽  
Storage Systems ◽  
Digital Systems ◽  
Data Networks ◽  
Digital Microscopy ◽  
Command Language ◽  
Access Protocol ◽  
Analog To Digital ◽  
Basic Physics ◽  
Scanning Electron

The process of moving to a fully digital microscopy laboratory requires changes in instrumentation, computing hardware, computing software, data storage systems, and data networks, as well as in the operating procedures of each facility. Moving from analog to digital systems in the microscopy laboratory is similar to the instrumentation projects being undertaken in many scientific labs. A central problem of any of these projects is to create the best combination of hardware and software to effectively control the parameters of data collection and then to actually acquire data from the instrument. This problem is particularly acute for the microscopist who wishes to "digitize" the operation of a transmission or scanning electron microscope. Although the basic physics of each type of instrument and the type of data (images & spectra) generated by each are very similar, each manufacturer approaches automation differently. The communications interfaces vary as well as the command language used to control the instrument.

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