scholarly journals Anomalous Electron Transport in Hall Thrusters: Electric Field Fluctuation Measurement

Author(s):  
Naoya KUWABARA ◽  
Masatoshi CHONO ◽  
Taichi MORITA ◽  
Naoji YAMAMOTO
Small ◽  
2021 ◽  
pp. 2102517
Author(s):  
Jacqueline M. Hicks ◽  
Yun‐Chiao Yao ◽  
Sydney Barber ◽  
Nigel Neate ◽  
Julie A. Watts ◽  
...  

1989 ◽  
Vol 32 (12) ◽  
pp. 1077-1081
Author(s):  
W. Cai ◽  
P. Hu ◽  
T.F. Zheng ◽  
B. Yudanin ◽  
M. Lax

2014 ◽  
Vol 92 (7/8) ◽  
pp. 629-633 ◽  
Author(s):  
Derek Mortensen ◽  
George Belev ◽  
Kirill (Cyril) Koughia ◽  
Robert E. Johanson ◽  
S.O. Kasap

Electron transport in vacuum-deposited a-Se films with thicknesses varying from 13 to 501 μm has been investigated by conventional time-of-flight (TOF) and interrupted field TOF experiments. To separate the influences of electric field and the thickness, all TOF experiments were performed at a constant electric field. It has been found that the electron mobility is relatively constant in thick films (L > 50 μm) and increases in thinner films (L < 50 μm) with decreasing thickness. On the other hand, the electron lifetime is relatively thickness independent in films with thickness L > 50 μm, but drops sharply in thin films when L < 50 μm. These observations can be explained based on the density of states model that includes three types of traps forming Gaussian-like distributions within the mobility gap as reported in Koughia et al. (J. Appl. Phys. 97, 033706 (2005)).


2006 ◽  
Vol 48 (4) ◽  
pp. S31-S39 ◽  
Author(s):  
A Fujisawa ◽  
K Itoh ◽  
A Shimizu ◽  
H Nakano ◽  
S Ohsima ◽  
...  

2001 ◽  
Vol 35 (2) ◽  
pp. 207-212
Author(s):  
Liu Yan-Hong ◽  
Liu Zu-Li ◽  
Yao Kai-Lun ◽  
Wei He-Lin ◽  
Liu Hong-Xiang

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