Characterization and Electrical Modeling Including Trapping Effects of AIN/GaN HEMT 4×50μm on Silicon Substrate
2019 ◽
Vol 58
(SC)
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pp. SCCD11
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2011 ◽
Vol 9
(3-4)
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pp. 473-475
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2007 ◽
Vol 54
(3)
◽
pp. 410-417
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