Application of photoelectron spectroscopy methods for investigation of subsurface layers of amorphous chalcogenide materials

2015 ◽  
Vol 38 (0) ◽  
pp. 8-17
Author(s):  
Наталія Іванівна Попович
Keyword(s):  
Photoelectron Spectroscopy ◽  
Amorphous Chalcogenide ◽  
Subsurface Layers ◽  
Chalcogenide Materials

scholarly journals Electrical Discharge Machining of Oxide Nanocomposite: Nanomodification of Surface and Subsurface Layers

2020 ◽  
Vol 4 (3) ◽  
pp. 96
Author(s):  
Sergey N. Grigoriev ◽  
Marina A. Volosova ◽  
Anna A. Okunkova ◽  
Sergey V. Fedorov ◽  
Khaled Hamdy ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Electrical Discharge ◽  
Electrical Discharge Machining ◽  
Subsurface Layer ◽  
Processes And Reactions ◽  
X Ray ◽  
Subsurface Layers ◽  
Scanning Electron ◽  
Hydrocarbon Oil

The work is devoted to the research of the changes that occur in the subsurface layer of the workpiece during electrical discharge machining of conductive nanocomposite based on alumina with the use of a brass tool. The nanocomposite of Al2O3 + 30% of TiC was electroerosively machined in a water and hydrocarbon oil. The process of electrical discharge machining is accompanied by oscillations that were registered by diagnostic means. The obtained surface of the samples was researched by the means of scanning electron microscopy and X-ray photoelectron spectroscopy. The observed surface and subsurface changes provide grounding for the conclusions on the nature of processes and reactions that occur between two electrodes and nanomodification of the obtained surfaces that can be an advantage for a series of applications.

Homochirality as the Signature of Extra-Terrestrial Life

1997 ◽  
Vol 161 ◽  
pp. 505-510
Author(s):  
Alexandra J. MacDermott ◽  
Laurence D. Barron ◽  
Andrè Brack ◽  
Thomas Buhse ◽  
John R. Cronin ◽  
...  
Keyword(s):  
Amino Acids ◽  
Protein Synthesis ◽  
Optical Rotation ◽  
Physical Origin ◽  
Natural Choice ◽  
Rosetta Mission ◽  
Terrestrial Life ◽  
Subsurface Layers ◽  
Solar System Bodies ◽  
Origin Of Homochirality

AbstractThe most characteristic hallmark of life is its homochirality: all biomolecules are usually of one hand, e.g. on Earth life uses only L-amino acids for protein synthesis and not their D mirror images. We therefore suggest that a search for extra-terrestrial life can be approached as a Search for Extra- Terrestrial Homochirality (SETH). The natural choice for a SETH instrument is optical rotation, and we describe a novel miniaturized space polarimeter, called the SETH Cigar, which could be used to detect optical rotation as the homochiral signature of life on other planets. Moving parts are avoided by replacing the normal rotating polarizer by multiple fixed polarizers at different angles as in the eye of the bee. We believe that homochirality may be found in the subsurface layers on Mars as a relic of extinct life, and on other solar system bodies as a sign of advanced pre-biotic chemistry. We discuss the chiral GC-MS planned for the Roland lander of the Rosetta mission to a comet and conclude with theories of the physical origin of homochirality.

Preferential Sputtering of Ni3Al Single Crystals Studied Using Atom-Probe Field-Ion Microscopy and XPS

1981 ◽  
Vol 39 ◽  
pp. 16-17
Author(s):  
M.P. Thomas ◽  
A.R. Waugh ◽  
M.J. Southon ◽  
Brian Ralph
Keyword(s):  
Single Crystals ◽  
Photoelectron Spectroscopy ◽  
Surface Composition ◽  
Depth Profiling ◽  
Analytical Techniques ◽  
Atom Probe ◽  
Probe Field ◽  
Preferential Sputtering ◽  
Argon Ion Bombardment ◽  
Argon Ion

It is well known that ion-induced sputtering from numerous multicomponent targets results in marked changes in surface composition (1). Preferential removal of one component results in surface enrichment in the less easily removed species. In this investigation, a time-of-flight atom-probe field-ion microscope A.P. together with X-ray photoelectron spectroscopy XPS have been used to monitor alterations in surface composition of Ni3Al single crystals under argon ion bombardment. The A.P. has been chosen for this investigation because of its ability using field evaporation to depth profile through a sputtered surface without the need for further ion sputtering. Incident ion energy and ion dose have been selected to reflect conditions widely used in surface analytical techniques for cleaning and depth-profiling of samples, typically 3keV and 1018 - 1020 ion m-2.

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