High Performance and Optimum Design of Structures and Materials IV

2020 ◽  
Keyword(s):  
Optimum Design ◽  
High Performance

An Optimization Approach for 25um Pitch Microbolometers

2012 ◽  
Vol 602-604 ◽  
pp. 2259-2262
Author(s):  
Hong Xi Zhou ◽  
Chao Chen ◽  
Tao Wang
Keyword(s):  
Optimum Design ◽  
Time Constant ◽  
High Performance ◽  
Low Noise ◽  
Thermal Time ◽  
Design Parameters ◽  
Physical Parameters ◽  
Optimization Approach ◽  
Thermal Time Constant ◽  
Trade Offs

In this paper a high-performance single level uncooled microbolometer detectors with a unit cell size of 25um×25um is introduced. An efficient detectors requires low Noise Equivalent Temperature Difference(NETD) (<80mK,f/1,60Hz)and low thermal time constant (<8.3ms). The trade-offs between physical parameters are studied to attain the optimum design parameters including the thermal conductance, the thermal time constant and the active area, consequently, optimum design parameters such as the width and the length of the support arms, which can satisfy the demand of an efficient detectors is achieved.

scholarly journals High Performance Computing for Optimum Design of Multi-body Systems

1999 ◽  
pp. 1199-1202
Author(s):  
José M. Jiménez ◽  
Nassouh A. Chehayeb ◽  
Javier G. Izaguirre ◽  
Beidi Hamma ◽  
Yan Thiaudière
Keyword(s):  
High Performance Computing ◽  
Optimum Design ◽  
High Performance ◽  
Multi Body ◽  
Performance Computing

A High Performance Energy Analyzer for Use in Electron Scanning Microscopy

1969 ◽  
Vol 27 ◽  
pp. 14-15
Author(s):  
A. V. Crewe ◽  
M. Isaacson ◽  
D. Johnson
Keyword(s):  
High Performance ◽  
Vertical Plane ◽  
Median Plane ◽  
Electron Gun ◽  
Uniform Field ◽  
Loss Mechanism ◽  
Electron Scanning Microscopy ◽  
Sector Type ◽  
Double Focusing ◽  
Electron Energy Loss

A double focusing magnetic spectrometer has been constructed for use with a field emission electron gun scanning microscope in order to study the electron energy loss mechanism in thin specimens. It is of the uniform field sector type with curved pole pieces. The shape of the pole pieces is determined by requiring that all particles be focused to a point at the image slit (point 1). The resultant shape gives perfect focusing in the median plane (Fig. 1) and first order focusing in the vertical plane (Fig. 2).

Vacuum System to Minimize the Specimen Contamination of High-Performance EM

1977 ◽  
Vol 35 ◽  
pp. 68-69
Author(s):  
N. Yoshimura ◽  
K. Shirota ◽  
T. Etoh
Keyword(s):  
Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
High Vacuum ◽  
Vacuum System ◽  
Pump System ◽  
Pumping System ◽  
Diffusion Pump ◽  
Almost All ◽  
Cascade Type

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.

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