The pitting susceptibility of passive films formed on X70, X80, and X100 pipeline steels was investigated by means of electrochemical noise (EN) and Mott-Schottky measurements. The EN results were analyzed according to the shot-noise theory and stochastic theory. Pit initiation process was analyzed quantitatively using the Weibull distribution function. Pit growth process was simulated by Gumbel distribution function. The experimental results of Mott-Schottky plots showed that the passive films formed on the three pipeline steels displayed an n-type semiconductor character, and the passive film for X100 pipeline steel has the lowest donor density (ND) among the three passive films. The EN results demonstrated that X100 pipeline steel had the lowest pit initiation rate and pit growth probability, which implied that the X100 pipeline steel had the lowest pitting susceptibility.
High-Temperature Ductile Damage Behavior and Modeling of X100 Pipeline Steel
