Scattering by a Finite Strip Under Complex Beam Incidence --- Asymptotic Evaluation in the Complex Space Domain

PIERS Online ◽  
2007 ◽  
Vol 3 (5) ◽  
pp. 675-679 ◽  
Author(s):  
Maria-Jesus Gonzalez-Morales ◽  
Emilio Gago-Ribas
2018 ◽  
Vol 48 (1) ◽  
pp. 97-112
Author(s):  
Anna Teekell

Kate O'Brien's 1943 The Last of Summer has been read as the novelist's riposte to an insular island that stifled both her publishing (through censorship) and her imagination (through cultural conservatism). Set on the eve of the neutral ‘Emergency’, O'Brien's sixth novel actually depicts Ireland as a complex space of negotiation, simultaneously desirable and condemnable, that challenges, rather than stifles, the individual imagination. The Last of Summer is a love triangle and a battle of wits, pitching a stage actress, the French ingénue Angèle, against an accomplished domestic performer, her potential mother-in-law, Hannah Kernahan. In the end, it is Hannah who wields ‘neutrality’ – both Ireland's in the war and her pretended neutrality in family matters – as a form of coercive power.


Author(s):  
J. Gaudestad ◽  
V. Talanov ◽  
A. Orozco ◽  
M. Marchetti

Abstract In the past couple years, Space Domain Reflectometry (SDR) has become a mainstream method to locate open defects among the major semiconductor manufacturers. SDR injects a radio frequency (RF) signal into the open trace creating a standing wave with a node at the open location. The magnetic field generated by the standing wave is imaged with a SQUID sensor using RF electronics. In this paper, we show that SDR can be used to non-destructively locate high resistance failures in Micro LeadFrame Packages (MLP).


Author(s):  
Mayue Xie ◽  
Zhiguo Qian ◽  
Mario Pacheco ◽  
Zhiyong Wang ◽  
Rajen Dias ◽  
...  

Abstract Recently, a new approach for isolation of open faults in integrated circuits (ICs) was developed. It is based on mapping the radio-frequency (RF) magnetic field produced by the defective part fed with RF probing current, giving the name to Space Domain Reflectometry (SDR). SDR is a non-contact and nondestructive technique to localize open defects in package substrates, interconnections and semiconductor devices. It provides 2D failure isolation capability with defect localization resolution down to 50 microns. It is also capable of scanning long traces in Si. This paper describes the principles of the SDR and its application for the localization of open and high resistance defects. It then discusses some analysis methods for application optimization, and gives examples of test samples as well as case studies from actual failures.


2021 ◽  
Vol 36 ◽  
pp. 101598 ◽  
Author(s):  
Charlotte C. Goldman ◽  
Christopher P. Dall ◽  
Tamir Sholklapper ◽  
Jacob Brems ◽  
Keith Kowalczyk

2021 ◽  
Vol 228 ◽  
pp. 29-41
Author(s):  
Guoqing Wang ◽  
Thibault F. Guiberti ◽  
Xi Xia ◽  
Lei Li ◽  
Xunchen Liu ◽  
...  

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